Patents by Inventor Joanna Kiljan

Joanna Kiljan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • APPARATUS FOR TEMPERATURE CONTROLLED ELECTRICAL AND OPTICAL PROBE FAULT CHARACTERIZATION OF INTEGRATED CIRCUITS
    Publication number: 20140361799
    Abstract: An apparatus includes an electrically insulating thermally conductive carrier for supporting a device under test (DUT), one or more thermo-electric devices arranged with the carrier, and one or more conductive vias in the carrier to make electrical connection to the DUT for coupling to an external test apparatus. A method of testing a device under test (DUT) includes supporting the DUT on an electrically insulating thermally conductive carrier, arranging one or more thermo-electric devices coupled to the carrier to control the temperature of the DUT, connecting the DUT electrically to an external test apparatus through one or more conductive vias in the carrier, connecting the one or more thermo-electric devices to the external test apparatus, and characterizing with the external apparatus the DUT on the basis of the temperature of the DUT.
    Type: Application
    Filed: December 27, 2013
    Publication date: December 11, 2014
    Applicant: QUALCOMM Incorporated
    Inventors: Armand Anthony Graupera, Himaja Hardik Bhatt, Joanna Kiljan, Lesly Zaren V. Endrinal, Martin L. Villafana, Ulrike Kindereit