Abstract: The invention relates to a transducer (4) and a method for determining measuring values and for exchanging data between an evaluation device and the transducer (4), which are connected by means of at least two connecting lines (2′, 2; 11, 12). Data which is predetermined by means of the evaluation device is read-out of the data memory and/or rewritten into the same via at least two connecting lines (2, 2′; 11, 12) which have the same electrical potential in the measuring operation. The data memory is embodied as a data memory module (5) and contains a current limitation circuit (2) by which means the system can be switched from the measuring mode to a communication mode for data transfer. The lines (2, 2′; 11, 12) are thus provided for switching into the communication mode and for exchanging data during the measuring operation, and for feeding the transducer (4) and/or for detecting measuring values.

Abstract: In an apparatus for the coating of substrates in a vacuum with rotatable substrate carriers (15,16,20) and with a loading and an unloading station (8 or 9), two vacuum chambers (3,4) are provided with several coating stations (6,7 or 10 to 14), directly next to one another, wherein a rotatable transport arm (15 or 16) is accommodated in each of the two chambers (3, 4), and the transport planes of the two transport arms (15,16) are aligned with one another. In the separation area of the two chambers (3,4), an air lock is provided with a corresponding transfer apparatus (5) with two transport arms (15,16), whose rotary plate (20) is provided with substrate storage unit (21,22) and projects about halfway into one chamber (3) and halfway into the other chamber (4), wherein one chamber (3) has both the loading as well as the unloading station (8 or 9).

Abstract: In the manufacture and processing of monocrystalline material, it is important to be able to detect and measure deviations from the ideal crystal structure. Data are required on the density and average extent of impurity precipitations. The irradiation of discrete crystal areas with wave or particle beams, the determination of the intensity distribution of the beams scattered under Bragg conditions, and the determination of static Debye-Waller factors are to be performed automatically and universally, on different specimen thicknesses, with high resolution and flexibility regarding changes in wavelength. For this purpose, a variation of the angle of incidence of the beams on the diffracting lattice planes is performed, and the reflection factor is measured by means of a photon or particle detector, and the integral reflection factor Rint is determined. Pivoting the specimen around an axis which is perpendicular to the diffracting lattice planes leads to a variation of the specimen thickness.

Abstract: A substrate for a magnetic recording disk employs an annular core of synthetic material having thin metal foils bonded to opposite faces, the metal foils serving to receive a magnetic recording material to form a magnetic recording structure. The inner surfaces of foils which are bonded to the core faces have applied thereto a thin, soft, deformable layer such as copper to prevent irregularities in the core faces from affecting the outer surfaces of the metal foils.

Abstract: Direct method for measuring the magnetostriction constant .lambda..sub.s of soft magnetic and isotropic magnetic materials. A thin film sample is cantilevered and clamped at one edge. Under the influence of a magnetic AC field and the magnetostriction effect of the sample material, the free end of the cantilevered sample is deflected and oscillates with twice the frequency of the AC field. The resonance amplitude a.sub.res is measured by using a laser beam impinging upon the oscillating sample and measuring the reflected beam amplitude by means of a position-sensitive photodiode. The AC output signal of the photodiode is proportional to the sample amplitude. The magnetostriction constant .lambda..sub.s is directly proportional to the resonance amplitude a.sub.res multiplied by a constant factor which depends on known geometry and properties of the sample material.