Abstract: Method (18, 19, 20, 21) for the quality control of a component (4, 4a, 4b, 4c, 4d, i, j, k), wherein the component (4, 4a, 4b, 4c, 4d, i, j, k) is heated (19) by an energy source (5, 5c, 5d), the intensity of which is periodically modulated (18) at at least one frequency ?, and wherein the amplitude A and/or the phase ? of a heat wave (81) which is modulated at the same frequency ? and is emitted by the component (4, 4a, 4b, 4c, 4d, i, j, k) is/are recorded (20), wherein the particle sized of the material, from which the component (4, 4a, 4b, 4c, 4d, i, j, k) is constructed, and/or the adhesion properties F of a functional layer (42) applied to the component (4, 4a, 4b, 4c, 4d, i, j, k) are evaluated (21) from the amplitude A and/or from the phase ?. Apparatus (100) for carrying out the method.

Abstract: Method (18, 19, 20, 21) for the quality control of a component (4, 4a, 4b, 4c, 4d, i, j, k), wherein the component (4, 4a, 4b, 4c, 4d, i, j, k) is heated (19) by an energy source (5, 5c, 5d), the intensity of which is periodically modulated (18) at at least one frequency 107 , and wherein the amplitude A and/or the phase ? of a heat wave (81) which is modulated at the same frequency ? and is emitted by the component (4, 4a, 4b, 4c, 4d, i, j, k) is/are recorded (20), wherein the particle sized of the material, from which the component (4, 4a, 4b, 4c, 4d, i, j, k) is constructed, and/or the adhesion properties F of a functional layer (42) applied to the component (4, 4a, 4b, 4c, 4d, i, j, k) are evaluated (21) from the amplitude A and/or from the phase ?. Apparatus (100) for carrying out the method.

Abstract: A method for determining the surface topography of a coated object and for the simultaneous spatially resolved determination of the thickness of the layer on the coated object. It is provided that the surface topography is measured with the aid of white-light interferometry, the thickness of the layer is measured by the principle of reflectometry, and by using, for both measurements, a shared radiation source having an electromagnetic radiation spectrum, which is reflected from the layer surface in a first wavelength range contained in the radiation spectrum and which penetrates into the layer in a second wavelength range contained in the radiation spectrum. Also described is a corresponding optical measuring instrument. The method and the optical measuring instrument make simultaneous highly accurate surface measurement of the surface topography and of the layer thickness of coated objects possible.

Abstract: An interferometric system having an illumination arm, including a light source and an illuminating optical system, for forming an illuminating beam; an object arm, including a reference element for measuring an object having an object surface to be measured, for forming an image-rays path, the object to be measured having an object surface inaccessible to direct illumination; a reference arm including a reference element; a detector arm including a detector; and a beam splitter, the reference element having one or more mirrored zones. Consequently, component parts which have undercut surfaces in the illumination direction can be measured in a single measuring operation.

Abstract: A method for determining the surface topography of a coated object and for the simultaneous spatially resolved determination of the thickness of the layer on the coated object. It is provided that the surface topography is measured with the aid of white-light interferometry, the thickness of the layer is measured by the principle of reflectometry, and by using, for both measurements, a shared radiation source having an electromagnetic radiation spectrum, which is reflected from the layer surface in a first wavelength range contained in the radiation spectrum and which penetrates into the layer in a second wavelength range contained in the radiation spectrum. Also described is a corresponding optical measuring instrument. The method and the optical measuring instrument make simultaneous highly accurate surface measurement of the surface topography and of the layer thickness of coated objects possible.

Abstract: An optical measuring device for measuring a plurality of surfaces of an object to be measured using a system of optical elements. For example, the first surface to be measured can be the inner wall of a narrow guide bore, while the second surface to be measured is formed by a valve-seat section that is conical and positioned at one end of the guide bore. As optical elements of measuring device, at least one beam splitter and one lens system are disposed in such a way that a first portion of the light beams incident on the beam splitter is directed perpendicularly onto the first surface of the object to be measured, and a second portion of the light beams incident on the beam splitter strikes the lens system downstream of the beam splitter and is directed via the lens system perpendicularly onto the second surface.

Abstract: An interferometric system having an illumination arm, including a light source and an illuminating optical system, for forming an illuminating beam; an object arm, including a reference element for measuring an object having an object surface to be measured, for forming an image-rays path, the object to be measured having an object surface inaccessible to direct illumination; a reference arm including a reference element; a detector arm including a detector; and a beam splitter, the reference element having one or more mirrored zones. Consequently, component parts which have undercut surfaces in the illumination direction can be measured in a single measuring operation.

Abstract: A device for coupling beam guides of optical systems for unidirectional or bidirectional transmission of beams via a beam transition between the optical systems is provided, the device having a connecting device and mechanical centering means. The connecting device provides a magnetic coupling for implementing a coupling connection in a coupling area. The centering means are situated opposite one another on the optical systems and coupled in such a way to cause the beam guides to self-center due to the attraction caused by the magnetic forces.

Abstract: An optical measuring device for measuring curved surfaces of a measured object. The curved surface to be measured may at least partially have the internal or external shape of a conical or cylindrical surface or of a saddle surface. The measuring device has a system of optical elements which includes at least one lens system and a first deflection optics. The lens system and the first deflection optics are positioned so that a first part of the light beams incident on the lens system is directed perpendicularly onto the curved surfaces of the measured object via the first deflection optics, while a second part of the light beams incident on the lens system is directed onto a reference object. Simultaneous measurement of locations of the measured object which are difficult to access and a reference object is thus made possible.

Abstract: An interferometric measuring device for three-dimensional measurement of shapes on an object to be measured having: a beam splitter receiving via an input light path, and splitting into measuring and reference light paths, light from a light source; an image pick-up, to which light reflected from the object and from a reference and brought into interference can be supplied via an output light path for conversion into electrical signals; an evaluation unit for determining the surface shape from the signals; and an adaptation device adapting the light intensity or interfering light signals. For increased measuring precision, the measuring device is configured to measure planar regions of the surface which extend over at least the measuring device's lateral resolution and the adaptation device is configured for adjusting the intensity of the light and/or the signals by locally varying reflective properties of the surface with respect to the measuring optics.

Abstract: A device for coupling beam guides of optical systems for unidirectional or bidirectional transmission of beams via a beam transition between the optical systems is provided, the device having a connecting device and mechanical centering means. The connecting device provides a magnetic coupling for implementing a coupling connection in a coupling area. The centering means are situated opposite one another on the optical systems and coupled in such a way to cause the beam guides to self-center due to the attraction caused by the magnetic forces.

Abstract: A fuel supply system, having a housing, in which a pistonlike element is disposed longitudinally displaceably in a bore and is guided sealingly in the bore by a guide portion. On one end, the guide portion adjoins a first fuel-filled chamber, and on its other end it adjoins a second fuel-filled chamber. At least one recess extending at least approximately in the circumferential direction is embodied in the guide portion of the pistonlike element and extends over at least part of the circumference of the pistonlike element and, viewed in the longitudinal direction of the pistonlike element, has an asymmetrical cross section.

Abstract: An interferometric measuring device for measuring the surface of an object by depth scanning, having a short-coherent light source, the emitted light of which is guided to a beam splitter for producing an object beam which is directed via an object beam path to the object and a reference beam which is directed via a reference beam path to a reference surface, having an image recorder for recording the light reflected by the object surface and by the reference surface and combined for interference, and having an evaluation device for determining the surface shape. A white light interferometer without mechanical actuating mechanisms for depth scanning is obtained by placing at least one active optical element that may be influenced by an electrical and/or magnetic field in the object beam path and/or the reference beam path, it being possible to use it to change the optical length of the object light path in relation to the optical length of the reference light path for the depth scanning.

Abstract: An interferometric measuring device includes a reference arm having a reference surface and a measuring arm having lighting optics for deflecting measuring light onto a measuring surface of an object to be measured, and having an image recorder connected to an analyzing device. A rapid, simple measurement with a rugged design of the measuring device may be achieved by configuring the lighting optics as a light guide body insertable into a cavity in the object to be measured, having a peripheral, radially symmetrical effective reflex surface directed radially or obliquely outward, and also including at least one deflector surface deflecting the measuring light onto same.

Abstract: An interferometric measuring device for measuring the surface of an object by depth scanning, having a short-coherent light source, the emitted light of which is guided to a beam splitter for producing an object beam which is directed via an object beam path to the object and a reference beam which is directed via a reference beam path to a reference surface, having an image recorder for recording the light reflected by the object surface and by the reference surface and combined for interference, and having an evaluation device for determining the surface shape. A white light interferometer without mechanical actuating mechanisms for depth scanning is obtained by placing at least one active optical element that may be influenced by an electrical and/or magnetic field in the object beam path and/or the reference beam path, it being possible to use it to change the optical length of the object light path in relation to the optical length of the reference light path for the depth scanning.

Abstract: A fuel supply system, having a housing (1), in which a pistonlike element (5) is disposed longitudinally displaceably in a bore (3) and is guided sealingly in the bore (3) by a guide portion (105). On one end, the guide portion (105) adjoins a first fuel-filled chamber (19), and on its other end it adjoins a second fuel-filled chamber (15). At least one recess (30) extending at least approximately in the circumferential direction is embodied in the guide portion (105) of the pistonlike element (5) and extends over at least part of the circumference of the pistonlike element (5) and, viewed in the longitudinal direction of the pistonlike element (5), has an asymmetrical cross section (FIG. 1).

Abstract: A method is for three-dimensionally, optically measuring measuring objects by comparison with a reference object, where image data of the measuring object are acquired and compared to image data of the reference object, and the measuring object is directly or indirectly assessed with regard to deviations from the reference object. A quick and, at the same time, reliable assessment of the measuring object is achieved in that the measuring object and/or the reference object or a holographic recording of the measuring object and/or of the reference object are/is rotated relative to one another about at least one axis, the image data of the measuring object being acquired and the comparison being performed in various, relative rotational positions, in that an evaluation regarding a maximum agreement of the measuring object with the reference object is performed in the different comparisons, and in that the deviation is assessed in the rotational position determined by the maximum agreement.

Abstract: An interferometric measuring device includes a reference arm having a reference surface and a measuring arm having lighting optics for deflecting measuring light onto a measuring surface of an object to be measured, and having an image recorder connected to an analyzing device. A rapid, simple measurement with a rugged design of the measuring device may be achieved by configuring the lighting optics as a light guide body insertable into a cavity in the object to be measured, having a peripheral, radially symmetrical effective reflex surface directed radially or obliquely outward, and also including at least one deflector surface deflecting the measuring light onto same.

Abstract: A method is for three-dimensionally, optically measuring measuring objects by comparison with a reference object, where image data of the measuring object are acquired and compared to image data of the reference object, and the measuring object is directly or indirectly assessed with regard to deviations from the reference object. A quick and, at the same time, reliable assessment of the measuring object is achieved in that the measuring object and/or the reference object or a holographic recording of the measuring object and/or of the reference object are/is rotated relative to one another about at least one axis, the image data of the measuring object being acquired and the comparison being performed in various, relative rotational positions, in that an evaluation regarding a maximum agreement of the measuring object with the reference object is performed in the different comparisons, and in that the deviation is assessed in the rotational position determined by the maximum agreement.