Abstract: A method for cloud-based, control-plane-event monitoring includes receiving control-plane events from a cloud-based element associated with a first and a second cloud environment. The received control-plane events are ingested from the cloud-based elements associated with the first and second cloud environments to generate a multiple-source data set from the control-plane events from the cloud-based elements associated with the first and second cloud environments. The multiple-source data set is then evaluated based on attributes of the first and second cloud environments in order to generate a common event data set. The common event data set is then processed using a rule set to generate an outcome.

Abstract: A method for cloud-based, control-plane-event monitoring includes receiving control-plane events from a cloud-based element associated with a first and a second cloud environment. The received control-plane events are ingested from the cloud-based elements associated with the first and second cloud environments to generate a multiple-source data set from the control-plane events from the cloud-based elements associated with the first and second cloud environments. The multiple-source data set is then evaluated based on attributes of the first and second cloud environments in order to generate a common event data set. The common event data set is then processed using a rule set to generate an outcome.

Abstract: A method for cloud-based, control-plane-event monitoring includes receiving control-plane events from a cloud-based element associated with a first and a second cloud environment. The received control-plane events are ingested from the cloud-based elements associated with the first and second cloud environments to generate a multiple-source data set from the control-plane events from the cloud-based elements associated with the first and second cloud environments. The multiple-source data set is then evaluated based on attributes of the first and second cloud environments in order to generate a common event data set. The common event data set is then processed using a rule set to generate an outcome.

Abstract: A method for cloud-based, control-plane-event monitoring includes receiving control-plane events from a cloud-based element associated with a first and a second cloud environment. The received control-plane events are ingested from the cloud-based elements associated with the first and second cloud environments to generate a multiple-source data set from the control-plane events from the cloud-based elements associated with the first and second cloud environments. The multiple-source data set is then evaluated based on attributes of the first and second cloud environments in order to generate a common event data set. The common event data set is then processed using a rule set to generate an outcome.

Abstract: The present invention relates to fluidic systems for controlling one or more fluids and/or one or more reagents. These systems can be used in combination with one or more devices for assaying, processing, and/or storing samples. In particular, the systems and related methods can allow for dispensing fluid in a controlled manner and/or introducing pause(s) when implementing assays or processes.

Abstract: The present invention relates to fluidic systems for controlling one or more fluids and/or one or more reagents. These systems can be used in combination with one or more devices for assaying, processing, and/or storing samples. In particular, the systems and related methods can allow for dispensing fluid in a controlled manner and/or introducing pause(s) when implementing assays or processes.

Abstract: The present invention is directed to the production of high quality semi-conductor devices created at speeds and in sizes that far exceed current x-ray lithography capabilities.

Abstract: The present invention is directed to the production of high quality semi-conductor devices created at speeds and in sizes that far exceed current x-ray lithography capabilities.

Abstract: The present invention is directed to the production of high quality semi-conductor devices created at speeds and in sizes that far exceed current x-ray lithography capabilities.