Abstract: Embodiments of the invention are generally directed to systems, methods, and apparatuses for optimizing the size of memory devices used for error correction code storage. An apparatus (such as a memory module) may include a number of memory devices to store data and a memory device to store error correction (ECC) bits. In some embodiments, the memory devices to store data may have a density of N and the memory device to store ECC bits has a density of ½ N.

Abstract: Embodiments of the invention are generally directed to systems, methods, and apparatuses for optimizing the size of memory devices used for error correction code storage. An apparatus (such as a memory module) may include a number of memory devices to store data and a memory device to store error correction (ECC) bits. In some embodiments, the memory devices to store data may have a density of N and the memory device to store ECC bits has a density of ½ N.

Abstract: Systems, methods, and apparatuses for optimizing the size of memory devices used for error correction code storage. An apparatus (such as a memory module) may include a number of memory devices to store data and a memory device to store error correction (ECC) bits. The memory devices to store data may have a density of N and the memory device to store ECC bits has a density of ½ N.

Abstract: Some embodiments are directed to circuits comprising first and second PLLs. The first PLL generates a first clock signal based on a reference clock signal. The second PLL generates a second clock signal based on the reference clock signal and is synchronized with the first clock signal.

Abstract: Embodiments of the invention are generally directed to systems, methods, and apparatuses for optimizing the size of memory devices used for error correction code storage. An apparatus (such as a memory module) may include a number of memory devices to store data and a memory device to store error correction (ECC) bits. In some embodiments, the memory devices to store data may have a density of N and the memory device to store ECC bits has a density of ½ N.

Abstract: An embodiment may comprise a counter to provide a count value, enable logic coupled with the counter, and circuitry coupled with the enable logic, the circuitry to be powered up or down if the counter value is outside of a resonance bandwidth for the circuitry to be powered up or down. An embodiment may comprise a method of initializing a counter while circuitry is placed in a standby mode, reading the counter, and powering up the circuitry if the counter does not indicate a resonance bandwidth. An embodiment may be a system comprising a device including a power delivery network to deliver power, a link coupled with the device, the link to electrically communicate with the device, and control circuitry coupled with the link, the control circuitry to limit the link from powering up or down at a resonant frequency of the power delivery network.

Abstract: Disclosed herein are methods and circuits to generate a clock signal.

Abstract: A system having several clock domains must have domain clocks properly aligned before powering up from a low-power or power-down mode. The domain clocks can be quickly aligned to enable fast system start-up if the clocks are forced into a rough alignment before a fine alignment process begins. Initially, a phase offset between the domain clocks is determined using a sync pulse, which indicates a location of one of the domain clocks relative to the other domain clock. Next, the domain clocks are forced into a minimum phase offset configuration by phase stalling one of the domain clocks. The phase stalling includes adjusting the pulse width of one of the domain clocks to force the clock into a rough alignment with the other domain clock. Finally, the domain clocks are fine aligned, and the system is placed into a normal power mode.