Patents by Inventor Joe Patterson

Joe Patterson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Non-contact voltage stressing method for thin dielectrics at the wafer level
    Patent number: 6184046
    Abstract: A test apparatus and method that is used for a stress test of a semiconductor device.
    Type: Grant
    Filed: December 9, 1997
    Date of Patent: February 6, 2001
    Assignee: Texas Instruments Incorporated
    Inventor: Joe Patterson
  • Light emission noise detection and characterization
    Patent number: 6051828
    Abstract: An integrated circuit 100 emits light corresponding to a defect in the integrated circuit 100. The light is transformed to electrical signals by a photomultiplier 206. The spectral content of the electrical signals is compared with predetermined or known noise signatures to identify the defects in the integrated circuit 100.
    Type: Grant
    Filed: July 1, 1998
    Date of Patent: April 18, 2000
    Assignee: Texas Instruments Incorporated
    Inventor: Joe Patterson