Patents by Inventor Joel MARTIS

Joel MARTIS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Photoabsorption microscopy using electron analysis
    Patent number: 11101102
    Abstract: A method for chemical identification of a sample having nanostructures includes the steps of irradiating the surface at wavelengths for each of a first and a second of the nanostructures that are uniquely absorbed by each of the first nanostructure and the second nanostructure such that each is excited to modulate at a first or a second nanostructure frequency, respectively. The method continues with the steps of irradiating the surface with electron beams incident on each of the first and second nanostructure, wherein at least one of secondary electrons, backscattered electrons and transmitted electrons are modulated at the frequency corresponding to each of the first and second nanostructure frequencies. A chemical map of the sample at an atomic scale is then created. A microscope is provided to carry out the method.
    Type: Grant
    Filed: August 25, 2020
    Date of Patent: August 24, 2021
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Arunava Majumdar, Ze Zhang, Joel Martis
  • PHOTOABSORPTION MICROSCOPY USING ELECTRON ANALYSIS
    Publication number: 20210066030
    Abstract: A method for chemical identification of a sample having nanostructures includes the steps of irradiating the surface at wavelengths for each of a first and a second of the nanostructures that are uniquely absorbed by each of the first nanostructure and the second nanostructure such that each is excited to modulate at a first or a second nanostructure frequency, respectively. The method continues with the steps of irradiating the surface with electron beams incident on each of the first and second nanostructure, wherein at least one of secondary electrons, backscattered electrons and transmitted electrons are modulated at the frequency corresponding to each of the first and second nanostructure frequencies. A chemical map of the sample at an atomic scale is then created. A microscope is provided to carry out the method.
    Type: Application
    Filed: August 25, 2020
    Publication date: March 4, 2021
    Inventors: Arunava MAJUMDAR, Ze ZHANG, Joel MARTIS