Patents by Inventor Joel N. Erdman
Joel N. Erdman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20190302145Abstract: Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.Type: ApplicationFiled: March 28, 2019Publication date: October 3, 2019Inventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Patent number: 10247755Abstract: Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.Type: GrantFiled: May 2, 2016Date of Patent: April 2, 2019Assignee: Johnstech International CorporationInventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Publication number: 20160320429Abstract: Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.Type: ApplicationFiled: May 2, 2016Publication date: November 3, 2016Inventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Patent number: 9329204Abstract: Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.Type: GrantFiled: October 12, 2012Date of Patent: May 3, 2016Assignee: Johnstech International CorporationInventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Patent number: 8988090Abstract: Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.Type: GrantFiled: October 19, 2011Date of Patent: March 24, 2015Assignee: Johnstech International CorporationInventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Publication number: 20140103949Abstract: Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.Type: ApplicationFiled: October 15, 2013Publication date: April 17, 2014Inventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Patent number: 8690597Abstract: A floating or compliant plate test socket device and method is disclosed. Three primary components, a fixed frame (20) receives a floating or compliant plate (22), sit together atop a housing (24) which contains contact pins used for the electrical test of the DUT (device under test). In fixed plate (20) are bearings for reducing friction when the floating plate is driven downward by the DUT inserter. Embedded in sidewalls (40) are a plurality of vertical raceways (46) which receive bearings (48). The raceways are borings, which have gap in the boring, in the fixed plate sidewalls (40) with the boring center spaced from the sidewall sufficiently that part of the bore removes part of the sidewall but allows the ball bearings to partially protrude from the gap formed in the incomplete semicircular boarding without the bearings being able to freely escape.Type: GrantFiled: April 26, 2012Date of Patent: April 8, 2014Assignee: Johnstech International CorporationInventor: Joel N. Erdman
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Patent number: 8558554Abstract: Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.Type: GrantFiled: April 21, 2010Date of Patent: October 15, 2013Assignee: Johnstech International CorporationInventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Publication number: 20120282799Abstract: A floating or compliant plate test socket device and method is disclosed. Three primary components, a fixed frame 20 receives a floating or compliant plate 22, sit together atop a housing 24 which contains contact pins used for the electrical test of the DUT (device under test). In fixed plate 20 are bearings for reducing friction when the floating plate is driven downward by the DUT inserter. Embedded in sidewalls 40 are a plurality of vertical raceways 46 which receive bearings 48. The raceways are borings, which have gap in the boring, in the fixed plate sidewalls 40 with the boring center spaced from the sidewall sufficiently that part of the bore removes part of the sidewall but allows the ball bearings to partially protrude from the gap formed in the incomplete semicircular boarding without the bearings being able to freely escape.Type: ApplicationFiled: April 26, 2012Publication date: November 8, 2012Applicant: Johnstech International CorporationInventor: Joel N. Erdman
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Publication number: 20120092034Abstract: Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.Type: ApplicationFiled: October 19, 2011Publication date: April 19, 2012Applicant: Johnstech International CorporationInventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
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Publication number: 20100264935Abstract: Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.Type: ApplicationFiled: April 21, 2010Publication date: October 21, 2010Inventors: Joel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko