Abstract: A downhole well system can use a fiber optic cable that can be positioned downhole along a length of a wellbore. The well system may include a top plug, a bottom plug, or both that are used to contain a cement slurry during a cementing operation. The movement of the top plug and bottom plug may cause acoustic noise along the downhole portion of the casing. A reflectometer may detect the acoustic noise from strain in the fiber optic cable and determine a location of the top plug or bottom plug downhole.

Abstract: A downhole well system can use a fiber optic cable that can be positioned downhole along a length of a wellbore. The well system may include a top plug, a bottom plug, or both that are used to contain a cement slurry during a cementing operation. The movement of the top plug and bottom plug may cause acoustic noise along the downhole portion of the casing. A reflectometer may detect the acoustic noise from strain in the fiber optic cable and determine a location of the top plug or bottom plug downhole.

Abstract: A method of processing semiconductor material includes applying an organosulfur solution to a top surface of a semiconductor material, the organosulfur solution having at least one organosulfur compound. The at least one organosulfur compound has at least one sulfur atom double bonded to a carbon atom and a pH of not less than 8. An organosulfur solution may be applied at temperatures above 25° C. to increase sulfur deposition rates and increase sulfur coverage on a surface of a semiconductor material.

Abstract: A method of processing semiconductor material includes applying an organosulfur solution to a top surface of a semiconductor material, the organosulfur solution having at least one organosulfur compound. The at least one organosulfur compound has at least one sulfur atom double bonded to a carbon atom and a pH of not less than 8. An organosulfur solution may be applied at temperatures above 25° C. to increase sulfur deposition rates and increase sulfur coverage on a surface of a semiconductor material.

Abstract: Resistive processing unit including: a plurality of transistors each having a lithium-doped region, wherein the plurality of transistors are arranged in an array to provide resistance; at least one first transmission line electrically connected to a source region of each transistor in at least one column of the array; at least one second transmission line electrically connected to a drain region of each transistor in at least one row of the array; and at least one third transmission line electrically connected to a gate region of the plurality of transistors in at least one row of the array; wherein application of an electrical voltage to the at least one first transmission line, the at least one second transmission line or the at least one third transmission line mobilizes lithium ions in the lithium region, thereby affecting a channel resistance of at least one transistor in the plurality of transistors.

Abstract: The present invention provides a method for forming low-defect density changed-orientation Si by amorphization/templated recrystallization (ATR) processes in which regions of Si having a first crystal orientation are amorphized by ion implantation and then recrystallized into the orientation of a template layer having a different orientation. More generally, the invention relates to the high temperature annealing conditions needed to eliminate the defects remaining in Si-containing single crystal semiconductor materials formed by ion-implant-induced amorphization and templated recrystallization from a layer whose orientation may be the same or different from the amorphous layer's original orientation. The key component of the inventive method is a thermal treatment for minutes to hours in the temperature range 1250-1330° C. to remove the defects remaining after the initial recrystallization anneal.

Abstract: A method of transferring batches of data to a target database includes receiving ordered rows of data and loading the ordered rows into batch tables. Each batch table being either a parent table, a child table or a no dependency table. The parent batch tables and no dependency batch tables are entered into a ready queue and the child batch tables are entered into a into a waiting pool. Any batch table in the ready queue may be transferred to the database using one or more processors. Any child batch table is moved to the ready queue if no corresponding parent table is in the ready queue. A dependency count of a child table is maintained and decremented if a parent table is imported to a database. In one embodiment, the corresponding child table in the waiting pool is transferred to the ready queue if the dependency count is zero.

Abstract: The present invention provides a method for forming low-defect density changed-orientation Si by amorphization/templated recrystallization (ATR) processes in which regions of Si having a first crystal orientation are amorphized by ion implantation and then recrystallized into the orientation of a template layer having a different orientation. More generally, the invention relates to the high temperature annealing conditions needed to eliminate the defects remaining in Si-containing single crystal semiconductor materials formed by ion-implant-induced amorphization and templated recrystallization from a layer whose orientation may be the same or different from the amorphous layer's original orientation. The key component of the inventive method is a thermal treatment for minutes to hours in the the temperature range 1250-1330° C. to remove the defects remaining after the initial recrystallization anneal.

Abstract: An embodiment provides a way to handle default parameters in a method call that are not constant values. During the compiling process of a source code method a compiler generates code before the method body, for every optional parameter. The generated code checks if each optional parameter has a valid value. If a known tag is found then the code generated evaluates the default expression and assign the return value to the corresponding parameter. During the compiling process of a source code method call a compiler, or a semantic analyzer, identifies the defined arguments in the method call. If any arguments are missing, the process uses a known tag for the missing argument. Once all parameter have valid values, passed as arguments or returned from the default expression evaluation, then the original method body is executed.

Abstract: A method of transferring batches of data to a target database includes receiving ordered rows of data and loading the ordered rows into batch tables. Each batch table being either a parent table, a child table or a no dependency table. The parent batch tables and no dependency batch tables are entered into a ready queue and the child batch tables are entered into a into a waiting pool. Any batch table in the ready queue may be transferred to the database using one or more processors. Any child batch table is moved to the ready queue if no corresponding parent table is in the ready queue. A dependency count of a child table is maintained and decremented if a parent table is imported to a database. In one embodiment, the corresponding child table in the waiting pool is transferred to the ready queue if the dependency count is zero.

Abstract: Systems and methods for testing the fault tolerance of a computer application or other software module include persistent storage of inputs and failure groups for the software under test. A test module may systematically fail system calls made by the software module at runtime. The test module may then detect an operational failure in the software module, indicating that a bug exists in the error-handling code of the software module. The test module may restart the software module and continue testing until error conditions are met. In embodiments, a test module may store and look up information about the conditions of the software module at the time the system call was made. This may ensure that the same system call is not failed twice under the same conditions. In other implementations, this information may be organized into groups, such that only one group of conditions needs to be examined in conjunction with a particular operational failure.