Abstract: The ophthalmic workstation comprises a table having a top surface, a base unit mounted to the table, a microscope, and a headrest. The base unit includes an X-displacement stage, a Z-displacement stage, and a platform mounted to the X-displacement stage and the Z-displacement stage. The microscope is mounted to the platform. The table comprises an opening in its top surface. An embedded section of the base unit is located, at least in part, in this recess or opening. The headrest is mounted to a headrest section of the base unit, which projects laterally over an edge of the table.

Abstract: The ophthalmologic microscope comprises a first component including a base and a stage, a second component including a pivotal arm and a microscope device, and a third component including a pivotal arm and a light source. The various components are mutually pivotal at a hinge. An electronically controlled brake and a position sensor are incorporated into the hinge. The brake controller of the microscope is adapted to interrupt a manual mutual displacement of the components in response to a signal from the position sensor in order to assist the user in properly aligning the components.

Abstract: An ophthalmologic device includes a microscope, an illumination system, a camera positioned to record an image through the microscope, and a storage device. When examining an eye, the camera is operated to continuously record a series of images. The images are stored in the storage device, each one with attributed imaging parameters describing the recording conditions of the image. When the examiner wants to retrieve images taking under examining conditions similar to the one presently used, the device is able to automatically retrieve the closest matches from the storage device. This allows to record, in the background, a large number of images documenting an eye's history and to retrieve them efficiently.

Abstract: In the device and method, the angle of incidence of slit light onto an eye to be examined is determined from its Purkinje reflection recorded in an image by measuring the offset from the reflection to the apex of the image of the cornea. In another embodiment, Purkinje reflections of light sources arranged around the optical axis of the microscope are correlated with a reference pattern of radial stripes in order to determine the offset between the optical axis and the apex of the eye.

Abstract: In a method for testing a disposable on a medical examination appliance, more particularly on a tonometer, wherein the medical examination appliance comprises a disposable holding apparatus, on which a disposable is held and, in particular, able to be brought into contact with a patient's eye for an applanation tonometry measurement, and which comprises a detection device, by means of which a physical property of the disposable can be measured, a measured value of the physical property of the disposable is ascertained by means of the detection device.

Abstract: In a method for registering measurement points on a body, in particular on an eye, measurement points are registered along a trajectory on a surface of the body, in particular a curved surface of the body, for determining an axial length profile, by way of a measurement beam. Here, a minimum radius of curvature of the trajectory is at least 1/7, preferably at least ?, particularly preferably at least ? of a radius of a circumference of the surface.

Abstract: A device (1) for examining an eye, in particular a slit lamp, comprises an image recording unit (220) with at least one first sensor (241.1) in a first beam path and a second sensor (241.2) in a second beam path, the device also comprising in the first beam path a first objective with a first optical axis, which has a fixed magnification and is arranged as fixed in the first beam path.

Abstract: An adapter (60) for an apparatus (50) for measuring a first property of an eye is attachable to the apparatus (50), wherein, when the adapter (60) is attached to the apparatus (50), a second additional property of the eye is measurable.

Abstract: In a method for registering measurement points on a body, in particular on an eye, measurement points are registered along a trajectory on a surface of the body, in particular a curved surface of the body, for determining an axial length profile, by way of a measurement beam. Here, a minimum radius of curvature of the trajectory is at least 1/7, preferably at least ?, particularly preferably at least ? of a radius of a circumference of the surface.

Abstract: An adapter (60) for an apparatus (50) for measuring a first property of an eye is attachable to the apparatus (50), wherein, when the adapter (60) is attached to the apparatus (50), a second additional property of the eye is measurable,

Abstract: A device for establishing geometric values at least from a first region (MB1) and from a second region (MB3), distanced from the first region (MB1), of a transparent or diffusive object, comprises a coherence tomograph with an object arm, a reference arm, a detector arm, and a light source (ALQ) for emitting light. The device has a first path, formed by the object arm and/or the reference arm, having a first optical path length and a second path having a second optical path length, along which the light emitted by the light source (ALQ) can propagate.

Abstract: A Michelson-interferometer which has two reference arms and a short coherence length is used for the method and apparatus for measurement of geometric values on transparent or diffuse objects (19). The basic optical delay times of the reference arms (11, 12) are chosen in such a manner that they result in an optical delay time difference corresponding to a layer thickness, as a geometric value. The at least two reference arm beams (33a, 35a) are passed to a single rotating path-length variation element (23), with a mutual spatial offset angle (dw). A delay-time change, which is dependent on the rotation angle, of the reference arm beams is produced as a function of a rotation angle caused by rotation, in order to allow a delay-time change caused by the path-length variation element (23) to be applied successively to the basic optical delay times in the reference arms (11, 12).