Patents by Inventor Joerg Huebner
Joerg Huebner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11391772Abstract: A signal transmission system with at least one signal encoder, a line, and a control and evaluation unit, wherein the signal encoder has an electronic unit and a power source, wherein the signal encoder feeds an imprinted current in the range between a preset first value and a preset second value into the line, in particular between 4 and 20 mA. The control and evaluation unit has a load and a microprocessor, and captures and evaluates a voltage that decreases via the load or a current that flows through the load. Additional information regarding the status of the components, can thus be captured and forwarded in a simple way, in that the load in the control and evaluation unit is connected in series to at least one electrical component at which a direct current appears when a current flows through the electrical component.Type: GrantFiled: July 31, 2020Date of Patent: July 19, 2022Assignee: GESELLSCHAFT FÜR GERÄTEBAU MBHInventors: Hans-Jörg Hübner, Frank Böttger, Erik Buck
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Publication number: 20210033664Abstract: A signal transmission system with at least one signal encoder, a line, and a control and evaluation unit, wherein the signal encoder has an electronic unit and a power source, wherein the signal encoder feeds an imprinted current in the range between a preset first value and a preset second value into the line, in particular between 4 and 20 mA. The control and evaluation unit has a load and a microprocessor, and captures and evaluates a voltage that decreases via the load or a current that flows through the load. Additional information regarding the status of the components, can thus be captured and forwarded in a simple way, in that the load in the control and evaluation unit is connected in series to at least one electrical component at which a direct current appears when a current flows through the electrical component.Type: ApplicationFiled: July 31, 2020Publication date: February 4, 2021Applicant: Gesellschaft für Gerätebau mbHInventors: Hans-Jörg HÜBNER, Frank BÖTTGER, Erik BUCK
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Patent number: 8767202Abstract: A substrate primarily for SERS determination, the substrate has a number of elongate elements with a density of at least 1×108 elongate elements per cm2 and having metal coated tips. When the elements may be made to lean toward each other, such as by providing a drop of a liquid thereon and allowing the liquid to dry, groups of tips of elongate elements are formed and the Raman enhancement is extremely high.Type: GrantFiled: October 25, 2010Date of Patent: July 1, 2014Assignee: Danmarks Tekniske UniversitetInventors: Michael Stenbaek Schmidt, Anja Boisen, Jörg Hübner
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Publication number: 20110116089Abstract: A substrate primarily for SERS determination, the substrate has a number of elongate elements with a density of at least 1×108 elongate elements per cm2 and having metal coated tips. When the elements may be made to lean toward each other, such as by providing a drop of a liquid thereon and allowing the liquid to dry, groups of tips of elongate elements are formed and the Raman enhancement is extremely high.Type: ApplicationFiled: October 25, 2010Publication date: May 19, 2011Inventors: Michael Stenbaek Schmidt, Anja Boisen, Jörg Hübner
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Patent number: 7851762Abstract: An optical analysis device that operates according to the principle of radiation absorption, has a housing (2) with at least one radiation-permeable housing element (3), at least one radiation source (4) having a reflector (5) associated with it, at least a first detector (6) and a second detector (7) as well as an external reflector (8) located outside the housing (2), wherein an absorption space is formed by the external reflector (8) and the radiation-permeable housing element (3), and a measuring beam (10) emitted by the radiation source (4) and the reflector (5) returns to the housing (2) again after being reflected by the external reflector (8), and wherein the external reflector (8) has at least one recess (12) that does not reflect the measuring beam and behind which a third detector is arranged for receiving the measuring beam.Type: GrantFiled: February 13, 2009Date of Patent: December 14, 2010Assignee: GfG Gesellschaft fuer Geraetebau mbHInventors: Joerg Huebner, Rainer Krage
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Patent number: 7764374Abstract: The present invention relates to a micro total analysis system comprising a spectroscope and a method of manufacturing such a system comprising a spectroscope in a one step process. More over the invention relates to a method of analyzing a sample in the system. The micro total analysis system comprising a spectroscope provided on a substrate and for measuring electromagnetic radiation and at least one microfluidic channel. The spectroscope comprises: a slab waveguide for guiding electromagnetic waves towards a diffraction grating dispersing the electromagnetic waves into their component wavelengths, and output means for receiving the deflected electromagnetic waves. At least a part of the microfluidic channel, the slab waveguide and the grating comprises the same main material, such as a polymer material.Type: GrantFiled: July 14, 2005Date of Patent: July 27, 2010Assignee: Serstech ABInventors: Jörg Hübner, Anders Michael Jørgensen, Thomas Aarøe Anhøj, Dan Anker Zauner
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Publication number: 20090236524Abstract: An optical analysis device that operates according to the principle of radiation absorption, has a housing (2) with at least one radiation-permeable housing element (3), at least one radiation source (4) having a reflector (5) associated with it, at least a first detector (6) and a second detector (7) as well as an external reflector (8) located outside the housing (2), wherein an absorption space is formed by the external reflector (8) and the radiation-permeable housing element (3), and a measuring beam (10) emitted by the radiation source (4) and the reflector (5) returns to the housing (2) again after being reflected by the external reflector (8), and wherein the external reflector (8) has at least one recess (12) that does not reflect the measuring beam and behind which a third detector is arranged for receiving the measuring beam.Type: ApplicationFiled: February 13, 2009Publication date: September 24, 2009Applicant: GFG GESELLSCHAFT FUER GERAETEBAU MBHInventors: Joerg HUEBNER, Rainer KRAGE
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Patent number: 7498575Abstract: An optical analysis device having a gastight housing, a radiation-permeable housing element, at least a first radiation source and associated first reflector and a second radiation source and associated second reflector, at least first and second detectors, and an external reflector. The radiation sources and the detectors are located within the housing, an absorption space being formed between the external reflector and the radiation-permeable housing element. A measurement beam emitted by the first radiation source and the first reflector, after reflection on the external reflector, re-enters the housing. A reference beam is emitted by the second radiation source and the second reflector. The measurement beam, after crossing the absorption space, is guided from the measurement beam reflector directly onto the first detector and the second detector and the reference beam from the second radiation source is directly incident on the first detector and the second detector.Type: GrantFiled: June 23, 2006Date of Patent: March 3, 2009Assignee: GFG Gesellschaft für Gerätebau mbHInventors: Joerg Huebner, Rainer Krage
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Patent number: 6747798Abstract: A system and method are provided for writing refractive index structures, such as gratings, in an optical waveguide. There is no requirement for structures having interferometric stability of the control elements. The method includes providing first and second light beams, the first beam having a first polarization state and a first wavevector, the second beam having a second polarization state different from the first polarization state, and a second wavevector different from the first wavevector. The method also includes illuminating a diffractive optical element by at least a part of the first beam and a part of the second beam so as to diffract parts of the first and second beams, and positioning the medium in relation to the diffractive element so as to illuminate the first part of the medium by the diffracted parts of the first and second beams.Type: GrantFiled: May 21, 2001Date of Patent: June 8, 2004Assignee: ADC Telecommunications, Inc.Inventors: Martin Kristensen, Jörg Hübner