Patents by Inventor Joerg-Michael Funk

Joerg-Michael Funk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060011804
    Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of th
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Ralf Engelmann, Joerg-Michael Funk, Joerg Steinert, Bernhard Zimmermann, Stefan Wilhelm, Joerg Engel, Ulrich Meisel
  • Publication number: 20060012874
    Abstract: Raster Scanning Light Microscope with punctiform light source distribution with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Joerg-Michael Funk, Ralf Wolleschensky, Bernhard Zimmermann, Stefan Wilhelm, Ralf Engelmann
  • Publication number: 20060012785
    Abstract: In a confocal laser scanning microscope for Raman spectroscopy with an illuminating configuration (2), which provides an illuminating beam for illuminating a probe region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the probe while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated probe region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the probe f while scanning and that the confocal aperture is designed as a slotted aperture (26) or as a slot-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Joerg-Michael Funk, Ralf Wolleschensky, Joerg Steinert
  • Publication number: 20060011824
    Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Ralf Engelmann, Joerg-Michael Funk, Joerg Steinert, Bernhard Zimmermann, Stefan Wilhelm, Joerg Engel, Ulrich Meisel
  • Publication number: 20060012871
    Abstract: In a confocal laser scanning microscope with an illuminating configuration (2), which provides an illuminating beam for illuminating a probe region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the probe while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated probe region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the probe f while scanning and that the confocal aperture is designed as a slotted aperture (26) or as a slot-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Joerg-Michael Funk, Ralf Wolleschensky, Joerg Steinert
  • Publication number: 20050063051
    Abstract: An arrangement for direct input coupling of a laser, preferably of a short-pulse laser, for nonlinear sample excitation which is located outside of the microscope housing, into the beam path of a laser scanning microscope (LSM), comprising a housing in which is integrated an adjusting laser that can be coupled into the microscope beam path by beam splitters, wherein the housing is advantageously integrated so as to be insertable in the scan module of the LSMA, and a beam splitter for the direct coupling laser has high transmission in the direction of the objective and, further, partial transmission for back-reflections of the adjusting laser coming from the specimen for adjusting the overlapping of the adjusting laser and direct coupling laser.
    Type: Application
    Filed: July 9, 2004
    Publication date: March 24, 2005
    Inventors: Ralph Lange, Stefan Wilhelm, Volker Gerstner, Roland Scheler, Michael Goelles, Joerg-Michael Funk