Patents by Inventor Joerg-Oliver Weidner

Joerg-Oliver Weidner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thickness
    Patent number: 7340360
    Abstract: A method for efficiently and accurately measuring a maximum Vcc calculation or failure rate and lifetime projection for microprocessors and other semiconductor products analytically scales low voltages applied to thinner oxides to thicker oxides. The expanded voltage window that is closer to the use voltage is obtained thereby to provide accurate voltage acceleration factors and max Vce extraction.
    Type: Grant
    Filed: February 8, 2006
    Date of Patent: March 4, 2008
    Assignee: Advanced Micro Devices, Inc.
    Inventors: John Zhang, Kurt Taylor, Eugene Zhao, Amit Marathe, Rolf Geilenkeuser, Joerg-Oliver Weidner