Patents by Inventor Joerg Richter

Joerg Richter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8200004
    Abstract: The invention relates to a method for inspecting a surface of a wafer with regions of different detection sensitivity. For this purpose, an image of the selected surface of the wafer is acquired using a detector. At least one region handled with a different detection sensitivity than the rest of the wafer may be defined on the surface of the wafer by means of an input unit. The detection sensitivity set for the regions is a percentage less than the detection sensitivity for the surface of the wafer without the regions with the different detection sensitivity.
    Type: Grant
    Filed: December 9, 2008
    Date of Patent: June 12, 2012
    Assignee: Vistec Semiconductor Systems GmbH
    Inventors: Detlef Michelsson, Joerg Richter
  • Publication number: 20090161942
    Abstract: The invention relates to a method for inspecting a surface of a wafer with regions of different detection sensitivity. For this purpose, an image of the selected surface of the wafer is acquired using a detector. At least one region handled with a different detection sensitivity than the rest of the wafer may be defined on the surface of the wafer by means of an input unit. The detection sensitivity set for the regions is a percentage less than the detection sensitivity for the surface of the wafer without the regions with the different detection sensitivity.
    Type: Application
    Filed: December 9, 2008
    Publication date: June 25, 2009
    Applicant: VISTEC Semiconductor Systems GmbH
    Inventors: Detlef Michelsson, Joerg Richter
  • Publication number: 20060103838
    Abstract: The examination of a wafer (10) has until now been implemented by means of wafer-to-wafer comparison of the entire wafer (10). In order to ensure timely detection of defects, or the development of defects, on a wafer (10) wafer-to-wafer comparison is limited to particular comparison regions (22) selected by the user.
    Type: Application
    Filed: October 19, 2005
    Publication date: May 18, 2006
    Applicant: Leica Microsystems Semiconductor GmbH
    Inventors: Joerg Richter, Detlef Michelsson
  • Patent number: 4293246
    Abstract: A mine roof support structure includes a floor skid, a supporting shield pivotally connected thereto by a pair of rocker arms forming a lemniscate guide, a roof cap pivotally connected at a roof cap joint to the shield, and hydraulic props supporting the roof cap. A hydraulic actuator is pivotally connected at opposite ends to the skid and to one of the arms, and the other of the rocker arms is disposed nearer the coal-face end of the support than the one arm. Such other arm is longitudinally adjustable and is pivotally connected at opposite ends to the skid and to the shield. This other arm is so constructed that its opposite ends may be adjusted relative to one another to enable the cap and the roof cap joint to follow a lemniscate path during settling of the roof and to follow a circular arc during a lowering of the cap toward the skid upon actuation of the hydraulic actuator.
    Type: Grant
    Filed: September 20, 1979
    Date of Patent: October 6, 1981
    Assignee: Klockner-Werke AG
    Inventors: Werner Boer, Hans Lachner, Guenter Maschonat, Joerg Richter, Heinrich Schulte, Hans Warnke
  • Patent number: D615839
    Type: Grant
    Filed: November 18, 2009
    Date of Patent: May 18, 2010
    Assignee: Karl Storz GmbH & Co KG
    Inventors: Joerg Richter, Sascha Berberich, Martin Oberlaender, Rainer Ulmschneider
  • Patent number: D621938
    Type: Grant
    Filed: September 23, 2009
    Date of Patent: August 17, 2010
    Assignee: Karl Storz GmbH & Co. KG
    Inventors: Wolf Petersen, Joerg Richter, Thore Zantop, Michael Sauer
  • Patent number: D622382
    Type: Grant
    Filed: October 5, 2009
    Date of Patent: August 24, 2010
    Assignee: Karl Storz GmbH & Co. KG
    Inventors: Joerg Richter, Sascha Berberich, Rainer Ulmschneider
  • Patent number: D630746
    Type: Grant
    Filed: September 23, 2009
    Date of Patent: January 11, 2011
    Assignee: Karl Storz GmbH & Co. KG
    Inventors: Joerg Richter, Sascha Berberich, Rainer Ulmschneider
  • Patent number: D812751
    Type: Grant
    Filed: August 3, 2016
    Date of Patent: March 13, 2018
    Assignee: KARL STORZ GmbH & Co. KG
    Inventors: Joerg Richter, Sascha Berberich