Patents by Inventor Joerg Rychen

Joerg Rychen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package
    Patent number: 8884222
    Abstract: A mount for a scanning probe sensor package (27) comprises a support structure (1, 5) defining a plane within the mount and at least one movable snap joint element (9) designed for interacting with a respective counterpart (43) in a scanning probe sensor package (27). The snap joint element (9) is movable to a first position in which it exerts a force on a mounted scanning probe sensor package (27) so as to force said scanning probe sensor package (27) in a normal direction of said plane towards the support structure (1,5) and to a second position in which it allows a scanning probe sensor package (27) to be mounted to or dismounted from the support structure (1, 5) along normal direction of said plane.
    Type: Grant
    Filed: October 5, 2010
    Date of Patent: November 11, 2014
    Assignee: SPECS Surface Nano Analysis GmbH
    Inventor: Joerg Rychen
  • MOUNT FOR A SCANNING PROBE SENSOR PACKAGE, SCANNING PROBE SENSOR PACKAGE, SCANNING PROBE MICROSCOPE AND METHOD OF MOUNTING OR DISMOUNTING A SCANNING PROBE SENSOR PACKAGE
    Publication number: 20120324608
    Abstract: A mount for a scanning probe sensor package (27) comprises a support structure (1, 5) defining a plane within the mount and at least one movable snap joint element (9) designed for interacting with a respective counterpart (43) in a scanning probe sensor package (27). The snap joint element (9) is movable to a first position in which it exerts a force on a mounted scanning probe sensor package (27) so as to force said scanning probe sensor package (27) in a normal direction of said plane towards the support structure (1,5) and to a second position in which it allows a scanning probe sensor package (27) to be mounted to or dismounted from the support structure (1, 5) along normal direction of said plane.
    Type: Application
    Filed: October 5, 2010
    Publication date: December 20, 2012
    Applicant: SPECS Surface Nano Analysis GmbH
    Inventor: Joerg Rychen