Patents by Inventor Joern Kamps

Joern Kamps has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for characterizing a sample with two or more optical traps
    Patent number: 8415613
    Abstract: The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: April 9, 2013
    Assignee: JPK Instruments AG
    Inventors: Sven-Peter Heyn, Jacob Kerssemakers, Detlef Knebel, Helge Eggert, Torsten Jaehnke, Joern Kamps
  • Method and Apparatus for Characterizing a Sample with Two or More Optical Traps
    Publication number: 20100251437
    Abstract: The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
    Type: Application
    Filed: May 30, 2008
    Publication date: September 30, 2010
    Applicant: JPK INSTRUMENTS AG
    Inventors: Sven-Peter Heyn, Jacob Kerssemakers, Detlef Knebel, Helge Eggert, Torsten Jaehnke, Joern Kamps