Patents by Inventor Jofre PEDREGOSA GUTIERREZ

Jofre PEDREGOSA GUTIERREZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Non-destructive detection method of charged particles without mass limitation
    Patent number: 9989464
    Abstract: A non-destructive method for detecting charged particles, includes measuring a reference value of at least one physical parameter of an ion cloud confined in an ion trap; performing an injection of a sample in the ion cloud confined in the ion trap, the sample crossing the ion cloud and getting out the ion cloud without being trapped inside the ion trap; measuring a first experimental value of the at least one physical parameter of the ion cloud; and comparing the first experimental value with the reference value in order to determine the presence of at least one charged particle in the sample, or the absence of any charged particle in the sample.
    Type: Grant
    Filed: September 25, 2015
    Date of Patent: June 5, 2018
    Assignees: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS), UNIVERSITE D'AIX-MARSEILLE
    Inventors: Caroline Antoinette Madeleine Champenois, Laurent Hilico, Christophe Michel René Jouvet, Jofre Pedregosa Gutierrez, Martina Knoop, Claude Dedonder-Lardeux
  • NON-DESTRUCTIVE DETECTION METHOD OF CHARGED PARTICLES WITHOUT MASS LIMITATION
    Publication number: 20170299514
    Abstract: A non-destructive method for detecting charged particles, includes measuring a reference value of at least one physical parameter of an ion cloud confined in an ion trap; performing an injection of a sample in the ion cloud confined in the ion trap, the sample crossing the ion cloud and getting out the ion cloud without being trapped inside the ion trap; measuring a first experimental value of the at least one physical parameter of the ion cloud; and comparing the first experimental value with the reference value in order to determine the presence of at least one charged particle in the sample, or the absence of any charged particle in the sample.
    Type: Application
    Filed: September 25, 2015
    Publication date: October 19, 2017
    Inventors: Caroline Antoinette Madeleine CHAMPENOIS, Laurent HILICO, Christophe Michel René JOUVET, Jofre PEDREGOSA GUTIERREZ, Martina KNOOP, Claude DEDONDER-LARDEUX