Abstract: A dual-port memory includes a plurality of memory cells coupled to a row decoder and column logic. Each memory cell includes two storage nodes, where each storage node is coupled to a bit line via an access transistor. Each memory cell also includes a logic gate for logically combining a word line signal with a column address signal and providing the resulting output signal to the gates of the access transistors. In one embodiment, the logic gate is a NOR logic gate and in another embodiment, the logic gate is a transmission gate. This prevents a potential read disturb problem with unselected memory cells of a row. This also reduces power consumption in the memory.

Abstract: A SRAM (14) includes a SRAM cell (26), the cell (26) includes a first storage node (N1), a second storage node (N2), and a cross coupled latch (40) including a first primary source current path to the first storage node, a first primary sink current path to the first storage node, a second primary source current path to the second storage node, a second primary sink current path to the second storage node, a fifth primary current path to the first storage node, and a sixth primary current path to the second storage node. During standby and/or a read operation of the SRAM cell (26), one of the fifth primary current path and the sixth primary current path is conductive. During a write operation, the fifth primary current path and the sixth primary current path are non-conductive.