Abstract: The invention relates to image analysis of dark field images obtained at low magnification below 10:1. Image analysis of dark field images obtained at low magnification can be combined with analyzes of images obtained in respect of the same section of a sample and same magnification but with other techniques such as fluorescent microscopy. The system and method can be used e.g. for particle counting, particle size measurement, particle size distribution, morphology measurement, where the particles can be cells and/or cell parts. The invention also relates to a compact dark field light source unit, a system or apparatus including a microscope which by itself is compact and comprises the mentioned dark field light source unit.

Abstract: The invention relates to image analysis of dark field images obtained at low magnification below 10:1. Image analysis of dark field images obtained at low magnification can be combined with analyses of images obtained in respect of the same section of a sample and same magnification but with other techniques such as fluorescent microscopy. The system and method can be used e.g. for particle counting, particle size measurement, particle size distribution, morphology measurement, where the particles can be cells and/or cell parts. The invention also relates to a compact dark field light source unit, a system or apparatus including a microscope which by itself is compact and comprises the mentioned dark field light source unit.

Abstract: A grating has a high diffraction efficiency into the minus first diffracted order in transmission, for both TE and TM polarizations. The incident angle may optionally be chosen so that the minus first diffracted order in reflection would be retroreflected back to the incident beam. The grating may be formed from various materials and/or layers, where the thicknesses of the individual layers may be determined by an optimization or simulation process. In one aspect, the grating may have four or more layers, formed with three or more materials. In another aspect, the grating may have a longitudinal refractive index profile that contains at least two local extrema, such as a maximum and/or minimum. Such a grating may be formed from three or more materials, two materials, or a single material that has a continuously varying refractive index. Any or all of the materials may have a continuously varying refractive index profile, as well.

Abstract: New grating structures include a bonded transmission grating structure. The grating structure is encapsulated by two pieces that are bonded together. In addition, a new method of making grating structures includes forming wells with an aspect ratio (depth:width) of at least 3:1, 7:1 or greater. Such grating structures can be used to form gratings with high diffraction efficiencies for both TE and TM polarizations of light.

Abstract: New grating structures include a bonded transmission grating structure. The grating structure is encapsulated by two pieces that are bonded together. In addition, a new method of making grating structures includes forming wells with an aspect ratio (depth:width) of at least 3:1, 7:1 or greater. Such grating structures can be used to form gratings with high diffraction efficiencies for both TE and TM polarizations of light.