Patents by Inventor Johan de Kleer

Johan de Kleer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200370996
    Abstract: A self-aware machine platform is implemented through analyzing operational data of machining tools to achieve machine tool damage assessment, prediction and planning in manufacturing shop floor. Machining processes are first identified by matching similar processes through an ICP algorithm. Machining processes are further clustered by Hotelling's T-squared statistics. Degradation of the machining tool is detected through a trend of the operational data within a cluster of machining processes by a monotonicity test, and the remaining useful life of the machining tool is predicted through a particle filter by extrapolating the trend under a first-order Markov process. In addition, process anomalies across machines are detected through a combination of outlier detection methods including SOMs, multivariate regression, and robust Mahalanobis distance. Warnings and recommendations are flexibly provided to manufacturing shop floor based on policy choice.
    Type: Application
    Filed: August 7, 2020
    Publication date: November 26, 2020
    Inventors: Linxia Liao, Rajinderjeet Singh Minhas, Arvind Rangarajan, Tolga Kurtoglu, Johan de Kleer
  • Publication number: 20200319628
    Abstract: A systematic approach to constructing process plans for hybrid manufacturing is provided. The process plans include arbitrary combinations of AM and SM processes. Unlike the suboptimal conventional practice, the sequence of AM and SM modalities is not fixed beforehand. Rather, all potentially viable process plans to fabricate a desired target part from arbitrary alternating sequences of pre-defined AM and SM modalities are explored in a systematic fashion. Once the state space of all process plans has been enumerated in terms of a partially ordered set of states, advanced artificial intelligence (AI) planning techniques are utilized to rapidly explore the state space, eliminate invalid process plans, for instance, process plans that make no physical sense, and optimize among the valid process plans using a cost function, for instance, manufacturing time and material or process costs.
    Type: Application
    Filed: June 16, 2020
    Publication date: October 8, 2020
    Inventors: Morad Behandish, Saigopal Nelaturi, Johan de Kleer
  • Patent number: 10739230
    Abstract: A self-aware machine platform is implemented through analyzing operational data of machining tools to achieve machine tool damage assessment, prediction and planning in manufacturing shop floor. Machining processes are first identified by matching similar processes through an ICP algorithm. Machining processes are further clustered by Hotelling's T-squared statistics. Degradation of the machining tool is detected through a trend of the operational data within a cluster of machining processes by a monotonicity test, and the remaining useful life of the machining tool is predicted through a particle filter by extrapolating the trend under a first-order Markov process. In addition, process anomalies across machines are detected through a combination of outlier detection methods including SOMs, multivariate regression, and robust Mahalanobis distance. Warnings and recommendations are flexibly provided to manufacturing shop floor based on policy choice.
    Type: Grant
    Filed: November 26, 2018
    Date of Patent: August 11, 2020
    Assignee: PALO ALTO RESEARCH CENTER INCORPORATED
    Inventors: Linxia Liao, Rajinderjeet Singh Minhas, Arvind Rangarajan, Tolga Kurtoglu, Johan de Kleer
  • Patent number: 10719069
    Abstract: A systematic approach to constructing process plans for hybrid manufacturing is provided. The process plans include arbitrary combinations of AM and SM processes. Unlike the suboptimal conventional practice, the sequence of AM and SM modalities is not fixed beforehand. Rather, all potentially viable process plans to fabricate a desired target part from arbitrary alternating sequences of pre-defined AM and SM modalities are explored in a systematic fashion. Once the state space of all process plans has been enumerated in terms of a partially ordered set of states, advanced artificial intelligence (AI) planning techniques are utilized to rapidly explore the state space, eliminate invalid process plans, for instance, process plans that make no physical sense, and optimize among the valid process plans using a cost function, for instance, manufacturing time and material or process costs.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: July 21, 2020
    Assignee: Palo Alto Research Center Incorporated
    Inventors: Morad Behandish, Saigopal Nelaturi, Johan de Kleer
  • Publication number: 20200210535
    Abstract: One embodiment provides a method and a system for automated design of a computational system. During operation, the system obtains a component library comprising a plurality of computational components, receives design requirements of the computational system, and builds a plurality of universal component cells. A respective universal component cell is configurable, by a selection signal, to behave as one of the plurality of computational components. The system further constructs a candidate computational system using the plurality of universal component cells and encodes the received design requirements and the candidate computational system into a single logic formula. Variables within the single logic formula comprise at least inputs, outputs, and internal variables of the candidate computational system. The system solves the single logic formula to obtain at least one design solution for the computational system.
    Type: Application
    Filed: December 31, 2018
    Publication date: July 2, 2020
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Aleksandar B. Feldman, Johan de Kleer, Ion Matei
  • Publication number: 20200210532
    Abstract: A method and system for automated design of a physical system are provided. During operation, the system obtains a component library comprising a plurality of physical components, receives design requirements of the physical system, and constructs an initial system model based on physical components in the component library and the design requirements. The system topology associated with the initial system model can include a large number of links that are sufficiently coupled to one another, and a respective link comprises one or more physical components. The system further performs an optimization operation comprising a plurality of iterations, with the system topology being updated at each iteration. Updating the system topology includes removing links and components from the system topology. The system then generates a final system model based on an outcome of the optimization operation and outputs a design solution of the physical system according to the final system model.
    Type: Application
    Filed: December 26, 2018
    Publication date: July 2, 2020
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Ion Matei, Maksym I. Zhenirovskyy, Johan de Kleer, Aleksandar B. Feldman
  • Publication number: 20200177186
    Abstract: An analog circuit for solving optimization algorithms comprises three voltage controlled current sources and three capacitors, operatively coupled in parallel to the three voltage controlled current sources, respectively. The circuit further comprises a first inductor, operatively coupled in series between a first pair of the capacitors and the voltage controller current sources and a second pair of the capacitors and the voltage controller current sources. The circuit further comprises a second inductor, operatively coupled in series between the second pair of the capacitors and the voltage controller current sources and a third pair of the capacitors and the voltage controller current sources.
    Type: Application
    Filed: November 30, 2018
    Publication date: June 4, 2020
    Inventors: Ion Matei, Alexander Feldman, Johan de Kleer
  • Publication number: 20200065436
    Abstract: The following relates generally to design and redesign of digital circuits. In one disclosed embodiment, a circuit is annotated by identifying at least one possible error location according to an error library; the at least one possible error location is localized; and the circuit is redesigned based on the localized at least one possible error location.
    Type: Application
    Filed: October 15, 2018
    Publication date: February 27, 2020
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Alexander Feldman, Ion Matei, Johan de Kleer
  • Publication number: 20200050723
    Abstract: The following relates generally to analog circuit re-design. Some embodiments identify a candidate component of the circuit by determining that if the candidate component is adjusted or replaced, the circuit will satisfy a requirement metric. In some implementations, an optimization problem or Bayesian reasoning may be used to change parameters of the candidate component to create a replacement component. In some implementations, a replacement component of a different type than the candidate component may be selected by solving a mixed-integer optimization program or by using a non-linear program with continuous parameters.
    Type: Application
    Filed: August 9, 2018
    Publication date: February 13, 2020
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Ion Matei, Alexander Feldman, Johan de Kleer
  • Publication number: 20190384871
    Abstract: Systems and methods described receive a set of experimental data of connection points of an unknown component of a partially known physical system. The systems and methods set feasibility constraints for an untrained model of the unknown component and simulate the partially known system using the untrained model of the unknown component to generate simulated data at the connection points of the unknown component. Systems and methods then optimize the untrained model based on the feasibility constraints and a comparison of the simulated data and the experimental data to generate a trained model of the unknown component.
    Type: Application
    Filed: June 15, 2018
    Publication date: December 19, 2019
    Inventors: Ion Matei, Johan de Kleer, Rajinderjeet S. Minhas, Alexander Feldman
  • Publication number: 20190383700
    Abstract: One embodiment can provide a method and a system for diagnosing faults in a physical system. During operation, the system obtains a time-domain model of the physical system and converts the time-domain model to the frequency domain to obtain a frequency-domain model of the physical system. The time-domain model can include one or more model parameters having known values. The system also obtains time-domain input and output signals and converts the time-domain input and output signals to the frequency domain to obtain frequency-domain input and output signals. The system identifies at least one model parameter having an expected value that is different from a known value of the at least one model parameter based on the frequency-domain model and the frequency-domain input and output signals, and generates a diagnostic output indicating at least one component within the physical system being faulty based on the identified at least one model parameter.
    Type: Application
    Filed: July 9, 2018
    Publication date: December 19, 2019
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Ion Matei, Aleksandar B. Feldman, Johan de Kleer
  • Publication number: 20190377870
    Abstract: The following relates generally to defense mechanisms and security systems. Broadly, systems and methods are disclosed that detect an anomaly in an Embedded Mission Specific Device (EMSD). Disclosed approaches include a meta-material antenna configured to receive a radio frequency signal from the EMSD, and a central reader configured to receive a signal from the meta-material antenna. The central reader may be configured to: build a finite state machine model of the EMSD based on the signal received from the meta-material antenna; and detect if an anomaly exists in the EMSD based on the built finite state machine model.
    Type: Application
    Filed: June 11, 2018
    Publication date: December 12, 2019
    Applicant: Palo Alto Research Center Incorporated
    Inventors: George Daniel, Alexander Feldman, Bhaskar Saha, Anurag Ganguli, Bernard D. Casse, Johan de Kleer, Shantanu Rane, Ion Matei
  • Publication number: 20190347370
    Abstract: The following relates generally to system modeling. Some embodiments described herein learn a representation of the parameter feasibility space that make model parameter tuning easier by constraining the search space, thus enabling physical interpretation of the learned model. They also enable model-based system analytics (controls, diagnosis, prognostics) by providing a system model.
    Type: Application
    Filed: May 9, 2018
    Publication date: November 14, 2019
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Ion Matei, Johan de Kleer
  • Publication number: 20190204813
    Abstract: A systematic approach to constructing process plans for hybrid manufacturing is provided. The process plans include arbitrary combinations of AM and SM processes. Unlike the suboptimal conventional practice, the sequence of AM and SM modalities is not fixed beforehand. Rather, all potentially viable process plans to fabricate a desired target part from arbitrary alternating sequences of pre-defined AM and SM modalities are explored in a systematic fashion. Once the state space of all process plans has been enumerated in terms of a partially ordered set of states, advanced artificial intelligence (AI) planning techniques are utilized to rapidly explore the state space, eliminate invalid process plans, for instance, process plans that make no physical sense, and optimize among the valid process plans using a cost function, for instance, manufacturing time and material or process costs.
    Type: Application
    Filed: December 29, 2017
    Publication date: July 4, 2019
    Inventors: Morad Behandish, Saigopal Nelaturi, Johan de Kleer
  • Publication number: 20190196892
    Abstract: Embodiments described herein provide a system for facilitating a training system for a device. During operation, the system determines a system model for the device that can be based on empirical data of the device. The empirical data is obtained based on experiments performed on the device. The system then generates, from the system model, synthetic data that represents behavior of the device under a failure. The system determines uncertainty associated with the synthetic data and, from the uncertainty, determines a set of prediction parameters using an uncertainty quantification model. The system generates training data from the synthetic data based on the set of prediction parameters and learns a set of learned parameters associated with the device by using a machine-learning-based classifier on the training data.
    Type: Application
    Filed: December 27, 2017
    Publication date: June 27, 2019
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Ion Matei, Rajinderjeet S. Minhas, Johan de Kleer, Anurag Ganguli
  • Publication number: 20190146469
    Abstract: Embodiments described herein provide a system for facilitating comprehensive control data for a device. During operation, the system determines one or more properties of the device that can be applied to empirical data of the device. The empirical data can be obtained based on experiments performed on the device. The system applies the one or more properties to the empirical data to obtain derived data and learns an efficient policy for the device based on both empirical and derived data. The efficient policy indicates one or more operations of the device that can reach a target state from an initial state of the device. The system then determines an operation for the device based on the efficient policy.
    Type: Application
    Filed: November 16, 2017
    Publication date: May 16, 2019
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Ion Matei, Rajinderjeet S. Minhas, Johan de Kleer, Anurag Ganguli
  • Publication number: 20190094108
    Abstract: A self-aware machine platform is implemented through analyzing operational data of machining tools to achieve machine tool damage assessment, prediction and planning in manufacturing shop floor. Machining processes are first identified by matching similar processes through an ICP algorithm. Machining processes are further clustered by Hotelling's T-squared statistics. Degradation of the machining tool is detected through a trend of the operational data within a cluster of machining processes by a monotonicity test, and the remaining useful life of the machining tool is predicted through a particle filter by extrapolating the trend under a first-order Markov process. In addition, process anomalies across machines are detected through a combination of outlier detection methods including SOMs, multivariate regression, and robust Mahalanobis distance. Warnings and recommendations are flexibly provided to manufacturing shop floor based on policy choice.
    Type: Application
    Filed: November 26, 2018
    Publication date: March 28, 2019
    Inventors: Linxia Liao, Rajinderjeet Singh Minhas, Arvind Rangarajan, Tolga Kurtoglu, Johan de Kleer
  • Patent number: 10139311
    Abstract: A self-aware machine platform is implemented through analyzing operational data of machining tools to achieve machine tool damage assessment, prediction and planning in manufacturing shop floor. Machining processes are first identified by matching similar processes through an ICP algorithm. Machining processes are further clustered by Hotelling's T-squared statistics. Degradation of the machining tool is detected through a trend of the operational data within a cluster of machining processes by a monotonicity test, and the remaining useful life of the machining tool is predicted through a particle filter by extrapolating the trend under a first-order Markov process. In addition, process anomalies across machines are detected through a combination of outlier detection methods including SOMs, multivariate regression, and robust Mahalanobis distance. Warnings and recommendations are flexibly provided to manufacturing shop floor based on policy choice.
    Type: Grant
    Filed: September 26, 2014
    Date of Patent: November 27, 2018
    Assignee: Palo Alto Research Center Incorporated
    Inventors: Linxia Liao, Rajinderjeet Singh Minhas, Arvind Rangarajan, Tolga Kurtoglu, Johan de Kleer
  • Patent number: 10089140
    Abstract: The following relates generally to computer system efficiency improvements. Broadly, systems and methods are disclosed that improve efficiency in a cluster of nodes by efficient processing of tasks among nodes in the cluster of nodes. Assignment of tasks to compute nodes may be based on learned CPU capabilities and I/O bandwidth capabilities of the compute nodes in the cluster.
    Type: Grant
    Filed: May 2, 2017
    Date of Patent: October 2, 2018
    Assignee: PALO ALTO RESEARCH CENTER INCORPORATED
    Inventors: Shekhar Gupta, Christian Fritz, Johan de Kleer
  • Publication number: 20180276915
    Abstract: A method for determining vehicle component conditions via performance correlation is provided. A list of doors for maintenance on a transport vehicle is maintained. Measurements for one of the doors based on an inspection of that door are maintained. A determination is made as to whether maintenance is required for the door based on the measurements and a maintenance status is assigned to the door. The door measurements are compared to measurements for other doors of the transportation vehicle. Those other doors with measurements similar to the door are identified and the maintenance status of the door is assigned to the other doors identified.
    Type: Application
    Filed: May 28, 2018
    Publication date: September 27, 2018
    Inventors: Anurag Ganguli, Rajinderjeet Singh Minhas, Johan de Kleer