Abstract: The present invention relates to a measuring device for determining the thickness of a dielectric layer on a conductive substrate. The device comprises a resonance cavity for electromagnetic fields which has a rotationally symmetrical wall, an end plate and an open end and is adapted to be positioned with the open end on the dielectric layer. The device further comprises an antenna which is adapted to excite an electro-magnetic field in the resonance cavity, a reflection measuring unit for determining at least one property of the electromagnetic field and an evaluation circuit for determining the thickness of the dielectric layer from the at least one property of the electromagnetic field. A diameter of the rotationally symmetrical wall varies in a longitudinal direction of the resonance cavity.

Abstract: The present invention relates to a measuring device for determining the thickness of a dielectric layer on a conductive substrate. The device comprises a resonance cavity for electromagnetic fields which has a rotationally symmetrical wall, an end plate and an open end and is adapted to be positioned with the open end on the dielectric layer. The device further comprises an antenna which is adapted to excite an electro-magnetic field in the resonance cavity, a reflection measuring unit for determining at least one property of the electromagnetic field and an evaluation circuit for determining the thickness of the dielectric layer from the at least one property of the electromagnetic field. A diameter of the rotationally symmetrical wall varies in a longitudinal direction of the resonance cavity.

Abstract: Provided herein is a device for measuring a thickness of a dielectric layer on a base substrate. The device is provided with a cylindrical resonant cavity having a circular cylindrical wall and a plane wall on one end thereof, wherein the opposite end is open to be placed upon the dielectric layer on the substrate to form a wall of the resonant cavity on the opposite end; an antenna located within the resonant cavity and adapted to excite an electromagnetic field in the resonant cavity that is approximately zero in the dielectric layer; a reflection meter connected to the antenna and adapted to measure the resonant frequency of the resonant cavity; and a processor connected to the reflection meter. Also provided herein is a method for measuring a thickness of a dielectric layer on a base substrate having a curved surface.

Abstract: The invention relates to a device for measuring a thickness of a dielectric layer (8) on a base substrate (7), comprising a cylindrical resonant cavity (1) having a circular cylindrical wall (9) and a plane wall (10) on one end thereof, wherein the opposite end (3) is open to be placed upon the dielectric layer (8) on the substrate (7) to form a wall of the resonant cavity (1) on the opposite end (3); an antenna (4) located within said resonant cavity (1) and adapted to excite an electromagnetic field in the resonant cavity (1) that is approximately zero in the dielectric layer (8); a reflection meter (5) connected to said antenna (4) and adapted to measure the resonant frequency of the resonant cavity (1); and a processor (6) connected to said reflection meter (5) and adapted to determine the thickness of the dielectric layer (8) from the resonant frequency of the resonant cavity (1).

Abstract: A device for measurement of a thickness of a coating applied to a substrate includes a transmitter/receiver module configured to transmit and receive microwave radiation; a computing unit; and a probe having a flange and an inner and an outer conductor, wherein the outer conductor coaxially surrounds the inner conductor, and wherein the inner conductor includes at least one thickened section.

Abstract: In order to make it possible to detect a fault location, safely, reliably and with a high response sensitivity, in a braided wire which has a plurality of individual wires, an electric current is passed through the braided wire and the magnetic field which is formed as a result of the braided wire through which current flows is detected by a sensor and is evaluated. A fault location is deduced if the measured magnetic field has an oscillation whose length is a multiple of a lay length of the braided wire, and in particular corresponds to the lay length. The method is also used in particular for non-destructive testing of the quality of a contact connection of a contact element to the braided wire.

Abstract: A probe for a magnetic remanence measurement method, in particular for detecting foreign material deposits and inclusions in hollow spaces, the hollow spaces being formed in a non-ferromagnetic material and the foreign material deposits and inclusions being made of a ferromagnetic material, wherein the probe includes at least one magnetic field sensor, at least one first and one second magnet, the magnets being configured before the at least one magnetic field sensor in a direction of introduction into the hollow space, and being situated relative to one another in such a way that their pole axes run non-parallel to one another.

Abstract: A device for measurement of a thickness of a coating applied to a substrate includes a transmitter/receiver module configured to transmit and receive microwave radiation; a computing unit; and a probe having a flange and an inner and an outer conductor, wherein the outer conductor coaxially surrounds the inner conductor, and wherein the inner conductor includes at least one thickened section.

Abstract: In order to make it possible to detect a fault location, safely, reliably and with a high response sensitivity, in a braided wire which has a plurality of individual wires, an electric current is passed through the braided wire and the magnetic field which is formed as a result of the braided wire through which current flows is detected by a sensor and is evaluated. A fault location is deduced if the measured magnetic field has an oscillation whose length is a multiple of a lay length of the braided wire, and in particular corresponds to the lay length. The method is also used in particular for non-destructive testing of the quality of a contact connection of a contact element to the braided wire.

Abstract: A probe for a magnetic remanence measurement method, in particular for detecting foreign material deposits and inclusions in hollow spaces, the hollow spaces being formed in a non-ferromagnetic material and the foreign material deposits and inclusions being made of a ferromagnetic material, wherein the probe includes at least one magnetic field sensor, at least one first and one second magnet, the magnets being configured before the at least one magnetic field sensor in a direction of introduction into the hollow space, and being situated relative to one another in such a way that their pole axes run non-parallel to one another.