Patents by Inventor Johann Horber

Johann Horber has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multiple local probe measuring device and method
    Publication number: 20060255818
    Abstract: The invention provides a local probe measuring device for effecting local measurements referring to a sample, comprising a first local probe for local measurements with respect to a sample or a reference surface, a second local probe for local measurements with respect to the sample or the reference surface, a measurement condition adjustment arrangement adapted to commonly adjust a first measurement condition of the first local probe with respect to the sample or the reference surface and a second measurement condition of the second local probe with respect to the sample or the reference surface, a detection arrangement comprising a first detection arrangement associated with the first local probe adapted to independently detect first measurement data referring to local measurements reflected by said first local probe and a second detection arrangement associated with the second local probe adapted to independently detect second measurement data referring to local measurements effected by said second local p
    Type: Application
    Filed: July 17, 2006
    Publication date: November 16, 2006
    Applicant: Europaisches Laboratorium fur Molekularbiologie (EMBL)
    Inventors: Stephan Altmann, Johann Horber
  • Multiple local probe measuring device and method
    Publication number: 20050040836
    Abstract: The invention provides a local probe measuring device for effecting local measurements referring to a sample, comprising a first local probe for local measurements with respect to a sample or a reference surface, a second local probe for local measurements with respect to the sample or the reference surface, a measurement condition adjustment arrangement adapted to commonly adjust a first measurement condition of the first local probe with respect to the sample or the reference surface and a second measurement condition of the second local probe with respect to the sample or the reference surface, a detection arrangement comprising a first detection arrangement associated with the first local probe adapted to independently detect first measurement data referring to local measurements reflected by said first local probe and a second detection arrangement associated with the second local probe adapted to independently detect second measurement data referring to local measurements effected by said second local p
    Type: Application
    Filed: September 17, 2004
    Publication date: February 24, 2005
    Applicant: Europaisches Laboratorium fur Molekularbiologie (EMBL)
    Inventors: Stephan Altmann, Johann Horber