Abstract: An electrical device containing pixel circuits, where at least one resistor is present within one pixel circuit to mask systematic luminance variation in organic light emitting diodes. The resistor can be located at one or more locations between electrodes. Each resistor has a defined resistor density, with distinct resistor values among pixel circuits to produce random variations in pixel luminance across a display containing plurality of pixel circuits.

Abstract: An electrical device containing pixel circuits, where at least one resistor is present within one pixel circuit to mask systematic luminance variation in organic light emitting diodes. The resistor can be located at one or more locations between electrodes. Each resistor has a defined resistor density, with distinct resistor values among pixel circuits to produce random variations in pixel luminance across a display containing plurality of pixel circuits.

Abstract: An electronic device can include an organic diode and a shunt that allows a significant current to bypass the organic diode, wherein the shunt is separate from the organic diode. Alternatively, an electronic device can include an organic diode lying along a first conduction path. The electronic device can also include a resistive member lying along a second conduction path that is parallel to the first conduction path. In another aspect, a process of forming an electronic device can include forming a first conductive member, forming a resistive member over the first conductive member, and forming an organic semiconductor layer over the first conductive member. The process can also include forming a second conductive member over the resistive member and the organic semiconductor layer, such that the resistive member and the organic semiconductor layer lie along parallel conduction paths between the first and second conductive members.

Abstract: A process of forming an electronic device is disclosed. An organic device layer is formed. The organic device layer includes a charge-selective material and a radiation sensitizer and has a first electrical conductivity and a first surface energy. First portions of the organic device layer are selectively exposed to radiation. The electrical conductivity and surface energy of the first portions of the organic device layer are modified.

Abstract: An apparatus for pixellated radiation configured to prevent short-circuits from adversely impacting display quality. A current limiting element connects a pixel to a power bus to minimize effects of pixel failures. Failure of a single pixel will have minimum impact on perceived display quality, thus avoiding failure of an entire row or column which would be noticeable to an observer of the display.

Abstract: There is provided an organic light-emitting diode luminaire. The luminaire includes a patterned first electrode, a second electrode, and a light-emitting layer therebetween. The light-emitting layer includes a first plurality of pixels having a first emitted color; and a second plurality of pixels having a second emitted color, the second plurality of pixels being laterally spaced from the first plurality of pixels. In the luminaire the pixels have a pitch no greater than 200 microns. The additive mixing of all the emitted colors results in an overall emission of white light.

Abstract: An electronic device can include an organic diode and a shunt that allows a significant current to bypass the organic diode, wherein the shunt is separate from the organic diode. Alternatively, an electronic device can include an organic diode lying along a first conduction path. The electronic device can also include a resistive member lying along a second conduction path that is parallel to the first conduction path. In another aspect, a process of forming an electronic device can include forming a first conductive member, forming a resistive member over the first conductive member, and forming an organic semiconductor layer over the first conductive member. The process can also include forming a second conductive member over the resistive member and the organic semiconductor layer, such that the resistive member and the organic semiconductor layer lie along parallel conduction paths between the first and second conductive members.

Abstract: In a shaving apparatus (1) with a housing (2) and with a short-hair cutting device (30) projecting out of housing (2) and with a long-hair cutting device (36, 37) projecting out of housing (2), a common carrying device (45) is provided for the cutting devices (30, 36, 37), wherein the carrying device (45) is adjustable for height relative to the housing (2), so that all the cutting devices (30, 36, 37) can be adjusted for height together, and wherein there is a drive connection to a motor (16) of the shaving apparatus (1) in each operating position of the cutting devices (30, 36, 37) and consequently all the cutting devices (30, 36, 37) are drivable in each operating position of the cutting devices (30, 36, 37).

Abstract: Organic electronic devices that include dummy electrodes are described, along with methods for using such devices.

Abstract: A process of forming an electronic device is disclosed. An organic device layer is formed. The organic device layer includes a charge-selective material and a radiation sensitizer and has a first electrical conductivity and a first surface energy. First portions of the organic device layer are selectively exposed to radiation. The electrical conductivity and surface energy of the first portions of the organic device layer are modified.

Abstract: A process of forming an electronic device is disclosed. An organic device layer is formed. The organic device layer includes a charge-selective material and a radiation sensitizer and has a first electrical conductivity. First portions of the organic device layer are selectively exposed to radiation. The electrical conductivity of the first portions of the organic device layer is modified.

Abstract: Defects are detected in organic electronic device displays such as organic light emitting diode (OLED) displays. An infrared camera may be used to screen displays for defects and to identify the locations of the defects. Relative hot or cold areas in a display correspond to defects and can be detected using the infrared camera.

Abstract: A mill train comprising: at least one roll stand for rolling rolling stock; at least one AC motor operatively coupled to the roll stand to drive same; and a controller for controlling the motor, wherein the motor speed is adjustable between a minimum speed (n.sub.min) and a maximum speed (n.sub.max); wherein the ratio of the maximum speed (n.sub.max) to the minimum speed (n.sub.min) lies within the range 2.0 and 8.0; and wherein the motor has a power output between the minimum speed (n.sub.min) and the maximum speed (n.sub.max) that deviates from the continuous output of the motor at the minimum speed.

Abstract: A method and apparatus for operating an electrolysis plant including a plurality of furnaces in which the anode spacing of each furnace is controlled by means of a computer as a function of furnace resistance. A desired furnace resistance is varied as a function of the furnace current yield, the optimum of which is given by a selected number of furnace voltage variations which exceed a specified voltage level, and, in addition, as a function of furnace energy consumption as indicated by the furnace resistance gradient, the rate of change of that gradient, and the difference between the expected furnace metal production with respect to long-term current yield and the measured furnace metal production.

Abstract: A method and apparatus for operating an electrolysis plant including a plurality of furnaces in which the anode spacing of each furnace is controlled by means of a computer as a function of furnace resistance. A desired furnace resistance is varied as a function of the furnace current yield, the optimum of which is given by a selected number of furnace voltage variations which exceed a specified voltage level, and, in addition, as a function of furnace energy consumption as indicated by the furnace resistance gradient, the rate of change of that gradient, and the difference between the expected furnace metal production with respect to long-term current yield and the measured furnace metal production.