Abstract: The invention relates to a test system, comprising: a test instrument, wherein the test instrument comprises an input port configured to acquire a test signal, a display configured to display a graphical representation of the test signal, and an application interface configured to forward the test signal. The test system further comprises a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises a processing unit configured to further process the received test signal, and an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.

Abstract: The present invention relates a method and apparatus for setting a test configuration. A test device for testing a device under test is identified, and the measurement interfaces of the test device are assigned to appropriate measurement points of the device under test. The configuration of the test scenario is established by generating a representation of the test device and the connections between the interface of the test device and the related measurement points.

Abstract: A self-diagnosing measurement system is described. The measurement system includes a first measurement instrument, a device under test, and a diagnosis module. The first measurement instrument is connected with the device under test in a signal transmitting manner. The first measurement instrument includes a testing module. The testing module is configured to automatically conduct a predefined test routine on the device under test. The diagnosis module is configured to automatically conduct a diagnosis routine on the measurement system in order to detect faults in the measurement system. Further, a self-diagnosis method for detecting faults in a measurement system is described.

Abstract: A trigger method for triggering a measurement device on a signal pattern in a signal is provided. The trigger method comprises the steps of receiving the signal pattern, receiving the signal, computing a first cross-correlation of the signal pattern and the signal, and triggering the measuring device, based upon the first cross-correlation.

Abstract: The invention relates to a test system, comprising: a test instrument, wherein the test instrument comprises an input port configured to acquire a test signal, a display configured to display a graphical representation of the test signal, and an application interface configured to forward the test signal. The test system further comprises a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises a processing unit configured to further process the received test signal, and an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.

Abstract: A test system for testing a device under test that includes several communication lanes is described. The test system is a communication lane test system that includes a measurement instrument and a connecting interface for connecting the device under test, wherein the connecting interface is configured to connect at least two of the several communication lanes with the measurement instrument. The measurement instrument includes s a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently. Moreover, a method for testing a device under test that includes s several communication lanes is described.

Abstract: A trigger method for triggering on a signal pattern in a signal is provided. The trigger method comprises the steps of receiving the signal pattern, receiving the signal, and computing a first cross-correlation of the signal pattern and the signal.

Abstract: The present invention relates a method and apparatus for setting a test configuration. A test device for testing a device under test is identified, and the measurement interfaces of the test device are assigned to appropriate measurement points of the device under test. The configuration of the test scenario is established by generating a representation of the test device and the connections between the interface of the test device and the related measurement points.

Abstract: A test system for testing a device under test that comprises several communication lanes is described. The test system is a communication lane test system that comprises a measurement instrument and a connecting interface for connecting the device under test, wherein the connecting interface is configured to connect at least two of the several communication lanes with the measurement instrument. The measurement instrument comprises a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently. Moreover, a method for testing a device under test that comprises several communication lanes is described.