Abstract: In a device (1), which is preferably a test device (1), there are provided data generating means (5) for generating device identification data (DIDA) significant with regard to the device (1) itself, which device identification data (DIDA) may be fed to an integrated circuit (2) introduced into the device (1), the integrated circuit (2) comprising a memory (12), with a memory area (13) which is provided and designed to store the device identification data (DIDA)

Abstract: A test device (1) for testing a module (2) for a data carrier intended for contactless communication includes a carrier signal generator (14) which is arranged to generate a carrier signal (CS) whereby a test signal (TS) can be generated, a conductive connection being provided between the carrier signal generator (14) and a module (2) to be tested, which connection includes an impedance (31), preferably being a series resistor (31), which is connected directly ahead of a module terminal (5) of the module (2) to be tested, the test device (1) being provided with at least one detection device (34, 35) for determining an analog characteristic value (C, m) of a module (2) to be tested while utilizing the test signal (TS) appearing on an impedance terminal (32) of the impedance (31).