Patents by Inventor Johannes A. H. W. G. Persoon

Johannes A. H. W. G. Persoon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER
    Publication number: 20240112878
    Abstract: A charged particle microscope for imaging a specimen. The charged particle microscope includes a specimen holder movable into an imaging position intersecting an optical axis, a specimen chamber configured to receive the specimen holder in the imaging position, and a sorption pump disposed in the specimen chamber and configured to lower a pressure in the specimen chamber.
    Type: Application
    Filed: September 30, 2022
    Publication date: April 4, 2024
    Inventors: Pleun Dona, Johannes A.H.W.G. Persoon, Hugo Cornelis Van Leeuwen, Peter Tiemeijer
  • Charged particle microscope with a manipulator device, and method of preparing a specimen with said charged particle microscope
    Patent number: 11127560
    Abstract: The invention relates to a charged particle microscope (CPM) that at least includes a sample holder, for holding a sample, and a manipulator device arranged for transferring a lamella created in said sample out of said sample, wherein said manipulator device comprises a first elongated manipulator member with a first outer end, and a second elongated manipulator member with a second outer end. The outer ends are movable for mechanically gripping and releasing said lamella. In embodiments, the elongated manipulator members comprise off-set parts that increase manoeuvrability, accessibility, and monitorability of the manipulator device during use.
    Type: Grant
    Filed: August 15, 2019
    Date of Patent: September 21, 2021
    Assignee: FEI Company
    Inventors: Johannes A. H. W. G. Persoon, Andreas Theodorus Engelen, Ruud Schampers
  • CHARGED PARTICLE MICROSCOPE WITH A MANIPULATOR DEVICE, AND METHOD OF PREPARING A SPECIMEN WITH SAID CHARGED PARTICLE MICROSCOPE
    Publication number: 20200066482
    Abstract: The invention relates to a charged particle microscope (CPM) that at least includes a sample holder, for holding a sample, and a manipulator device arranged for transferring a lamella created in said sample out of said sample, wherein said manipulator device comprises a first elongated manipulator member with a first outer end, and a second elongated manipulator member with a second outer end. The outer ends are movable for mechanically gripping and releasing said lamella. In embodiments, the elongated manipulator members comprise off-set parts that increase manoeuvrability, accessibility, and monitorability of the manipulator device during use.
    Type: Application
    Filed: August 15, 2019
    Publication date: February 27, 2020
    Applicant: FEI Company
    Inventors: Johannes A. H. W. G. Persoon, Andreas Theodorus Engelen, Ruud Schampers
  • Sample preparation stage
    Patent number: 8754384
    Abstract: Described is a system and method for in situ sample preparation and imaging. The system includes a multi-axis stage 100 having a bulk stage 110 and a grid stage 150 with various degrees of freedom to allow for sample preparation. In some embodiments, a focused ion beam system is used to prepare a lamella on the bulk stage 110. The lamella can then be transferred to the grid stage 150 from the bulk stage 110 without needing to move the multi-axis stage 100 from the focused ion beam system.
    Type: Grant
    Filed: January 17, 2014
    Date of Patent: June 17, 2014
    Assignee: FEI Company
    Inventors: Johannes A. H. W. G. Persoon, Andreas Theodorus Engelen, Mathijs Petrus Wilhelmus van den Boogaard, Rudolf Johannes Peter Gerardus Schampers, Michael Frederick Hayles