Patents by Inventor Johannes A. Luijendijk

Johannes A. Luijendijk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050265632
    Abstract: The invention relates to a method of and a device for forming an image which is composed of a plurality of sub-areas, a read-out unit being associated with each sub-area and image data of adjoining image areas of neighboring sub-areas being evaluated in order to mitigate differences in amplification, which device includes a detector with a plurality of sensor elements for forming image data, read-out units which are associated with the sub-areas of the image, an analysis unit which is arranged to evaluate image data from adjoining image areas of neighboring sub-areas and to generate correction data, a correction unit which is arranged to correct incorrect image data by means of correction data, thus enabling a regular and accurate recalibration or correction of non-linear amplifier behavior to be performed without necessitating an additional X-ray dose or interventions by the user.
    Type: Application
    Filed: July 12, 2005
    Publication date: December 1, 2005
    Inventors: Kai Eck, Johannes Luijendijk, Norbert Jung
  • Patent number: 6222901
    Abstract: An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examination apparatus also includes a correction unit which is arranged to derive the electronic image signal from the primary image and the dark signal. The electronic image signal represents image information in the X-ray image and has not been disturbed by electric charges which have been read with a delay.
    Type: Grant
    Filed: March 12, 1999
    Date of Patent: April 24, 2001
    Assignee: U.S. Philips Corporation
    Inventors: Hendrik J. Meulenbrugge, Peter L. Alving, Johannes A. Luijendijk, Johannes J. Stouten
  • Patent number: 6028913
    Abstract: An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examination apparatus also includes a correction unit which is arranged to derive the electronic image signal from the primary image and the dark signal. The electronic image signal represents image information in the X-ray image and has not been disturbed by electric charges which have been read with a delay.
    Type: Grant
    Filed: December 10, 1996
    Date of Patent: February 22, 2000
    Assignee: U.S. Philips Corporation
    Inventors: Hendrik J. Meulenbrugge, Peter L. Alving, Johannes A. Luijendijk, Johannes J. Stouten
  • Patent number: 5974113
    Abstract: An image pick-up apparatus (1) for picking up a plurality of sub-images and combining them so as to form a composite image, including a correction unit (5) for correcting brightness values of the composite image. The correction unit (5) includes a selection unit (6) for selecting bright and dark parts from the sub-images. There is also provided an arithmetic unit (10) for deriving a gain correction factor from the bright parts and an offset correction term from the dark parts. The correction unit (5) also includes a multiplier unit (8) and an adder unit (9) for multiplying signal levels of a sub-image signal by the gain correction factor and for adding the offset correction term thereto.
    Type: Grant
    Filed: June 14, 1996
    Date of Patent: October 26, 1999
    Assignee: U.S. Philips Corporation
    Inventors: Antonius J. C. Bruijns, Johannes A. Luijendijk