Patents by Inventor Johannes Agethen

Johannes Agethen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11883328
    Abstract: A surgical system corrects a surgical parameter based on a nomogram specific for a refractive laser surgery system to provide a nomogram-based corrected surgical parameter; stores the surgical parameter and the nomogram-based corrected surgical parameter as data for a patient or for one or both eyes of the patient; and compares the surgical parameter and nomogram-based corrected surgical parameter to generate a graphical representation of the surgical parameter, a target outcome parameter associated with the surgical parameter, or both, and the nomogram-based corrected surgical parameter, to generate a warning based on a comparison of the nomogram-based corrected surgical parameter to the surgical parameter or an absolute value, or both.
    Type: Grant
    Filed: May 30, 2019
    Date of Patent: January 30, 2024
    Assignee: Alcon Inc.
    Inventors: Peter Riedel, Johannes Agethen
  • Publication number: 20230404804
    Abstract: The present disclosure provides a refractive laser surgery system including a processor having access to memory media storing instructions or sets of instructions executable by the processor to identify a surgical parameter; correct the surgical parameter based on a nomogram specific for the refractive laser surgery system to provide a nomogram-based corrected surgical parameter; store the surgical parameter and the nomogram-based corrected surgical parameter in the memory media as data for a patient or for one or both eyes of the patient; and compare the surgical parameter and nomogram-based corrected surgical parameter to generate a graphical representation of the surgical parameter, a target outcome parameter associated with the surgical parameter, or both, and the nomogram-based corrected surgical parameter, to generate a warning based on a comparison of the nomogram-based corrected surgical parameter to the surgical parameter or an absolute value, or both. Methods of using the system are also provided.
    Type: Application
    Filed: September 5, 2023
    Publication date: December 21, 2023
    Inventors: Peter Riedel, Johannes Agethen
  • Publication number: 20190365568
    Abstract: The present disclosure provides a refractive laser surgery system including a processor having access to memory media storing instructions or sets of instructions executable by the processor to identify a surgical parameter; correct the surgical parameter based on a nomogram specific for the refractive laser surgery system to provide a nomogram-based corrected surgical parameter; store the surgical parameter and the nomogram-based corrected surgical parameter in the memory media as data for a patient or for one or both eyes of the patient; and compare the surgical parameter and nomogram-based corrected surgical parameter to generate a graphical representation of the surgical parameter, a target outcome parameter associated with the surgical parameter, or both, and the nomogram-based corrected surgical parameter, to generate a warning based on a comparison of the nomogram-based corrected surgical parameter to the surgical parameter or an absolute value, or both. Methods of using the system are also provided.
    Type: Application
    Filed: May 30, 2019
    Publication date: December 5, 2019
    Inventors: Peter Riedel, Johannes Agethen
  • Patent number: 9173560
    Abstract: Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical sy
    Type: Grant
    Filed: February 15, 2010
    Date of Patent: November 3, 2015
    Assignee: Wavelight GmbH
    Inventors: Mario Abraham, Johannes Agethen, Mario Klafke, Joachim Matschnigg
  • Publication number: 20120307207
    Abstract: Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical sy
    Type: Application
    Filed: February 15, 2010
    Publication date: December 6, 2012
    Inventors: Mario Abraham, Johannes Agethen, Mario Klafke, Joachim Matschnigg