Patents by Inventor Johannes Henricus Maria Joosten

Johannes Henricus Maria Joosten has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7660381
    Abstract: Scatter compensation is achieved in an X-ray imaging system by providing collimation means in the form of shutters (12) to collimate the primary X-ray beam (1) such that the radiation (8) transmitted through a subject (4) to be imaged is incident substantially centrally on the active part (14) of an image detector (3), so as to define an active border (14b), in respect of which scatter levels can be measured. An electrical signal (104) representative of the scatter level is subtracted from the electrical signal (7) representative of the radiation (8) transmitted through the subject, to obtain a scatter-compensated image signal (106).
    Type: Grant
    Filed: November 17, 2005
    Date of Patent: February 9, 2010
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Johannes Henricus Maria Joosten, Miels Noordhoek, Herman Stegehuis
  • Publication number: 20090147911
    Abstract: Scatter compensation is achieved in an X-ray imaging system by providing collimation means in the form of shutters (12) to collimate the primary X-ray beam (1) such that the radiation (8) transmitted through a subject (4) to be imaged is incident substantially centrally on the active part (14) of an image detector (3), so as to define an active border (14b), in respect of which scatter levels can be measured. An electrical signal (104) representative of the scatter level is subtracted from the electrical signal (7) representative of the radiation (8) transmitted through the subject, to obtain a scatter-compensated image signal (106).
    Type: Application
    Filed: November 17, 2005
    Publication date: June 11, 2009
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Johannes Henricus Maria Joosten, Niels Noordhoek, Herman Stegehuis
  • Patent number: 6594339
    Abstract: An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.
    Type: Grant
    Filed: November 22, 2000
    Date of Patent: July 15, 2003
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Peter Lex Alving, Albert Louw Faber, Johannes Henricus Maria Joosten