Abstract: An alignment device may obtain a set of analog-to-digital converter (ADC) signals provided by an angle sensor operating in a homogeneous test mode. The set of ADC signals may be associated with a rotation of a target magnet relative to the angle sensor. The alignment device may identify a maximum ADC signal value based on the set of ADC signals. The alignment device may selectively position, by the alignment device, at least one of the angle sensor or the target magnet based on the maximum ADC signal value.

Abstract: The present disclosure relates to a design for operating an angle sensor. A first sensor signal is output from a first sensor element on the basis of a magnetic field, which is dependent on an angle of rotation of a measurement object, at the location of the first sensor element. A second sensor signal is output from a second sensor element on the basis of the magnetic field that is dependent on the angle of rotation of the measurement object at the location of the second sensor element. During a calibration mode of the angle sensor, in which a rotation of the measurement object is performed, a first offset value of the first sensor signal, a second offset value of the second sensor signal and an amplitude correction value are determined on the basis of signal amplitudes of the first and second sensor signals. The first and second offset values ascertained during the calibration mode and the amplitude correction value are stored for use in an operating mode of the angle sensor.

Abstract: An alignment device may obtain a set of analog-to-digital converter (ADC) signals provided by an angle sensor operating in a homogeneous test mode. The set of ADC signals may be associated with a rotation of a target magnet relative to the angle sensor. The alignment device may identify a maximum ADC signal value based on the set of ADC signals. The alignment device may selectively position, by the alignment device, at least one of the angle sensor or the target magnet based on the maximum ADC signal value.

Abstract: An alignment device may obtain a set of analog-to-digital converter (ADC) signals provided by an angle sensor operating in a homogeneous test mode. The set of ADC signals may be associated with a rotation of a target magnet relative to the angle sensor. The alignment device may identify a maximum ADC signal value based on the set of ADC signals. The alignment device may selectively position, by the alignment device, at least one of the angle sensor or the target magnet based on the maximum ADC signal value.

Abstract: The present disclosure relates to a design for operating an angle sensor. A first sensor signal is output from a first sensor element on the basis of a magnetic field, which is dependent on an angle of rotation of a measurement object, at the location of the first sensor element. A second sensor signal is output from a second sensor element on the basis of the magnetic field that is dependent on the angle of rotation of the measurement object at the location of the second sensor element. During a calibration mode of the angle sensor, in which a rotation of the measurement object is performed, a first offset value of the first sensor signal, a second offset value of the second sensor signal and an amplitude correction value are determined on the basis of signal amplitudes of the first and second sensor signals. The first and second offset values ascertained during the calibration mode and the amplitude correction value are stored for use in an operating mode of the angle sensor.

Abstract: An alignment device may obtain a set of analog-to-digital converter (ADC) signals provided by an angle sensor operating in a homogeneous test mode. The set of ADC signals may be associated with a rotation of a target magnet relative to the angle sensor. The alignment device may identify a maximum ADC signal value based on the set of ADC signals. The alignment device may selectively position, by the alignment device, at least one of the angle sensor or the target magnet based on the maximum ADC signal value.

Abstract: An electronic switch includes a load path connected in series with the load and a drive terminal for receiving a drive signal. The electronic switch is operable to switch between a first operation state and a second operation state dependent on the drive signal. In a first switching cycle, the electronic switch is switched from the first operation state to the second operation state and a voltage across the load is evaluated during the first switching cycle in order to obtain a measured switching profile. The measured switching profile is compared with a reference profile. A drive profile dependent on the comparison is provided. The drive profile is used to drive the electronic switch in a second switching cycle after the first switching cycle. At least two drive parameters are used at different times in the at least one second switching cycle to drive the electronic switch.

Abstract: An electronic switch includes a load path connected in series with the load and a drive terminal for receiving a drive signal. The electronic switch is operable to switch between a first operation state and a second operation state dependent on the drive signal. In a first switching cycle, the electronic switch is switched from the first operation state to the second operation state and a voltage across the load is evaluated during the first switching cycle in order to obtain a measured switching profile. The measured switching profile is compared with a reference profile. A drive profile dependent on the comparison is provided. The drive profile is used to drive the electronic switch in a second switching cycle after the first switching cycle. At least two drive parameters are used at different times in the at least one second switching cycle to drive the electronic switch.