Patents by Inventor Johannes K. Zettler

Johannes K. Zettler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for determining the layer thickness and the refractive index of a sample
    Patent number: 8233158
    Abstract: The present invention relates to a method and an apparatus for determining the layer thickness and the refractive index of a sample. It is an object of the present invention to provide a method for determining the layer thickness of a sample (layer) having high light scattering characteristics that allows a fast (real-time process) and cost-effective measurement having a high accuracy.
    Type: Grant
    Filed: May 11, 2010
    Date of Patent: July 31, 2012
    Assignee: Laytec Aktiengesellschaft
    Inventors: Joerg-Thomas Zettler, Johannes K. Zettler
  • METHOD AND APPARATUS FOR DETERMINING THE LAYER THICKNESS AND THE REFRACTIVE INDEX OF A SAMPLE
    Publication number: 20100290046
    Abstract: The present invention relates to a method and an apparatus for determining the layer thickness and the refractive index of a sample. It is an object of the present invention to provide a method for determining the layer thickness of a sample (layer) having high light scattering characteristics that allows a fast (real-time process) and cost-effective measurement having a high accuracy.
    Type: Application
    Filed: May 11, 2010
    Publication date: November 18, 2010
    Applicant: LayTec GmbH
    Inventors: Joerg-Thomas ZETTLER, Johannes K. Zettler