Patents by Inventor Johannes Lambertus Van Hees

Johannes Lambertus Van Hees has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for iddq measuring
    Publication number: 20050270054
    Abstract: An IDDQ test is applied to an electronic circuit (16). A power supply unit supplies power supply current to the electronic circuit. The output impedance of the power supply unit is adjusted to a value selected for the electronic circuit, the value having been selected so that a resonance circuit (14) that comprises a connection between the power supply unit and the electronic circuit is substantially critically dampened. The current sense element (18) that is used to measure IDDQ current is coupled between an external power supply and a supply input of the power supply unit, so that the current sense element does not affect the output impedance.
    Type: Application
    Filed: August 6, 2003
    Publication date: December 8, 2005
    Applicant: KONINKLIJKE PHILIPS ELECTRONICES N.V.
    Inventor: Johannes Lambertus Van Hees