Abstract: The invention relates to a gripper for handling frames (2) that are covered with a film (3) that is intended for the transport of wafers (6). The gripper comprises at least two flat fingers (10) that carry flattened finger tips (8). This construction allows to insert the gripper between two frames (2) that are mounted in a cassette (9) without complication. The fingers (10) support in subsections both the frame (2) and the film (3). The film is attached to the frame due to the suction effect exerted by vacuum openings (5) configured on the frame, thereby fixating the film on the gripper.

Abstract: The orientation of the surface of an object to be examined is changed by adjusting the distance thereof to an optical measuring system in a plane-parallel manner in relation to a focusing plane of the optical measuring system, enabling high speeds of examination to be obtained during examination of the extended surfaces of the object. A distance-measurement system which is mounted in an auxiliary manner with regard to the measuring head enables fluctuations in the topography inside the surface of the object to be compensated in such a way that a currently received point or area can be optically sharpened.

Abstract: A method of embedding at least one flexible conductive track foil in a plastics material, wherein a prefabricated stiffening element is provided, said stiffening element accommodates said at least one flexible conductive track foil and secures it against bending, and said plastics material is injection-molded around said flexible track foil and said stiffening element in an injection-mold.

Abstract: The invention relates to a gripper for handling frames (2) that are covered with a film (3) that is intended for the transport of wafers (6). The gripper comprises at least two flat fingers (10) that carry flattened finger tips (8). This construction allows to insert the gripper between two frames (2) that are mounted in a cassette (9) without complication. The fingers (10) support in subsections both the frame (2) and the film (3).

Abstract: An inspection system optically examines the surfaces of objects to detect surface errors. The system scans image strips and, consequently, a given surface rapidly and with sufficient resolution using a linescan camera and an upstream microscope by aligning the captured lines.

Abstract: The orientation of the surface of an object to be examined is changed by adjusting the distance thereof to an optical measuring system in a plane-parallel manner in relation to a focusing plane of the optical measuring system, enabling high speeds of examination to be obtained during examination of the extended surfaces of the object. A distance-measurement system which is mounted in an auxiliary manner with regard to the measuring head enables fluctuations in the topography inside the surface of the object to be compensated in such a way that a currently received point or area can be optically sharpened.

Abstract: An optical scanning system for a substrate disk has an image recording device and an exposure device. The image recording device scans an object line in an area of recording on the substrate disk. The exposure device comprises a light source and an optical system, whereby the optical system is adapted to direct the light emitted by the light source as a linear exposure area onto the position of the object line and evenly distributed across the entire length of the object line to be recorded.

Abstract: A metrology device is described which is couplable to a load port of a semiconductor product handling and/or processing tool. The tool encloses a mini-environmental atmosphere and has a load port table for supporting devices to be coupled to the load port. The metrology device contains a housing preserving an inner atmosphere, a coupling region for connecting the inner atmosphere to the mini-environmental atmosphere and a measuring device for measuring a property of a semiconductor product. The metrology device further has a support which is movable by a transport device and which is dimensioned such that the metrology device is self-supporting in a position appropriate for coupling the coupling region to the load port. The metrology device is thereby couplable to the load port without being supported by the load port table.

Abstract: The invention relates to an inspection system for optically examining the surfaces of objects to detect surface errors. The system scans image strips and, consequently, a given surface rapidly and with sufficient resolution using a linescan camera and an upstream microscope by aligning the captured lines.

Abstract: A metrology device is described which is couplable to a load port of a semiconductor product handling and/or processing tool. The tool encloses a mini-environmental atmosphere and has a load port table for supporting devices to be coupled to the load port. The metrology device contains a housing preserving an inner atmosphere, a coupling region for connecting the inner atmosphere to the mini-environmental atmosphere and a measuring device for measuring a property of a semiconductor product. The metrology device further has a support which is movable by a transport device and which is dimensioned such that the metrology device is self-supporting in a position appropriate for coupling the coupling region to the load port. The metrology device is thereby couplable to the load port without being supported by the load port table.

Abstract: A method of embedding at least one flexible conductive track foil in a plastics material, wherein a prefabricated stiffening element is provided, said stiffening element accommodates said at least one flexible conductive track foil and secures it against bending, and said plastics material is injection-molded around said flexible track foil and said stiffening element in an injection-mold.