Patents by Inventor Johannes Mulkens
Johannes Mulkens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20080073602Abstract: An immersion lithographic projection apparatus is disclosed in which a liquid removal system surrounds a liquid supply system which provides liquid to a space between a projection system and a substrate. The liquid removal system is moveable relative to the liquid supply system and is controlled to have substantially zero velocity relative to the moving substrate table. The gap between the liquid supply system and the liquid removal system may be covered and the atmosphere between the liquid supply system and the liquid removal system above the substrate table may be maintained such that the vapor pressure of liquid is relatively high.Type: ApplicationFiled: June 22, 2006Publication date: March 27, 2008Applicant: ASML NETHERLANDS B.V.Inventors: Hernes Jacobs, Noud Jan Gilissen, Hans Jansen, Nicolaas Ten Kate, Nicolaas Kemper, Martinus Hendrikus Antonius Leenders, Erik Roelof Loopstra, Johannes Mulkens, Harmen Klaas Van Der Schoot, Marco Koert Stavenga, Bob Streefkerk, Peter-Paul Steijaert, Marcus Vermeulen, Jacco Van Der Hoeven
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Publication number: 20080074630Abstract: In an embodiment, a lithographic projection apparatus has an off-axis image field and a concave refractive lens as the final element of the projection system. The concave lens can be cut-away in parts not used optically to prevent bubbles from being trapped under the lens.Type: ApplicationFiled: November 26, 2007Publication date: March 27, 2008Applicant: ASML NETHERLANDS B.V.Inventors: Johannes Mulkens, Bob Streefkerk
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Publication number: 20080068577Abstract: An immersion lithographic apparatus and method are disclosed in which measures are taken to account for dissolution of resist components, such as photo-acids or photo-acid generators, in immersion liquid. This may involve ensuring that each relevant part of the substrate is covered by liquid the same amount of time and/or by compensating for the differing amounts of time each relevant part of the substrate is covered by liquid by varying exposure intensity or duration based on the amount of time the substrate is covered by liquid.Type: ApplicationFiled: November 13, 2007Publication date: March 20, 2008Applicant: ASML NETHERLANDS B.V.Inventors: Bob Streefkerk, Johannes Mulkens
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Publication number: 20080002162Abstract: A method and apparatus for cleaning the inside of an immersion lithographic apparatus is disclosed. In particular, a liquid supply system of the lithographic apparatus may be used to introduce a cleaning fluid into a space between the projection system and the substrate table of the lithographic apparatus. Additionally or alternatively, a cleaning device may be provided on the substrate table and an ultrasonic emitter may be provided to create an ultrasonic cleaning liquid.Type: ApplicationFiled: January 23, 2007Publication date: January 3, 2008Applicant: ASML NETHERLANDS B.V.Inventors: Hans Jansen, Johannes Baselmans, Sjoerd Donders, Christiaan Hoogendam, Jeroen Mertens, Johannes Mulkens, Marco Stavenga, Bob Streefkerk, Jan Van Der Hoeven, Cedric Grouwstra
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Publication number: 20070268471Abstract: A lithographic projection apparatus is disclosed in which a space between the projection system and the substrate is filled with a liquid. An edge seal member at least partly surrounds the substrate or other object on a substrate table to prevent liquid loss when edge portions of the substrate or other object are, for example, imaged or illuminated.Type: ApplicationFiled: February 26, 2007Publication date: November 22, 2007Applicant: ASML Netherlands B.V.Inventors: Joeri Lof, Hans Butler, Sjoerd Donders, Aleksey Kolesnychenko, Erik Loopstra, Hendricus Meijer, Jeroen Johannes Mertens, Johannes Mulkens, Roelof Ritsema, Frank Schaik, Timotheus Sengers, Klaus Simon, Joannes De Smit, Alexander Straaijer, Helmar Santen
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Publication number: 20070247605Abstract: An optical element for correcting aberrations in an optical apparatus has a casing. The casing is filled with liquid and has a support layer and a cover layer designed to pass light of a predetermined wavelength range. The casing accommodates several actuators. Each actuator has a first end supporting the cover layer and a second end supporting the support layer. Each actuator is able to locally change a local distance between the support layer and the cover layer to correct for local aberrations in a light beam directed to the optical element by providing local phase shifts. The optical element may be used in a lithographic apparatus.Type: ApplicationFiled: April 25, 2006Publication date: October 25, 2007Applicant: ASML Netherlands B.V.Inventors: Erik Loopstra, Paul Graupner, Johannes Mulkens
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Publication number: 20070201012Abstract: A lithographic projection apparatus is disclosed for use with an immersion liquid positioned between the projection system and a substrate. Several methods and mechanism are disclosed to protect components of the projection system, substrate table and a liquid confinement system. These include providing a protective coating on a final element of the projection system as well as providing one or more sacrificial bodies upstream of the components. A two component final optical element of CaF2 is also disclosed.Type: ApplicationFiled: September 29, 2006Publication date: August 30, 2007Applicant: ASML NETHERLANDS B.V.Inventors: Erik Loopstra, Johannes Mulkens
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Publication number: 20070013886Abstract: An immersion lithographic apparatus is disclosed which includes a liquid supply system having an inlet configured to supply a liquid to a space between a projection system of the lithographic apparatus and a substrate and an outlet configured to remove at least part of the liquid, the liquid supply system configured to rotate the inlet, the outlet, or both, about an axis substantially perpendicular. to an exposure plane of the substrate.Type: ApplicationFiled: September 21, 2006Publication date: January 18, 2007Applicant: ASML NETHERLANDS B.V.Inventors: Johannes Baselmans, Sjoerd Donders, Christiaan Hoogendam, Jeroen Johannes Mertens, Johannes Mulkens, Bob Streefkerk
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Publication number: 20060268250Abstract: A lithographic projection apparatus includes a support structure configured to hold a patterning device, the patterning device configured to pattern a beam of radiation according to a desired pattern; a substrate table configured to hold a substrate; a projection system configured to project the patterned beam onto a target portion of the substrate; a liquid supply system configured to provide liquid to a space between the projection system and the substrate; and a shutter configured to isolate the space from the substrate or a space to be occupied by a substrate.Type: ApplicationFiled: August 7, 2006Publication date: November 30, 2006Applicant: ASML NETHERLANDS B.V.Inventors: Antonius Maria Derksen, Sjoerd Donders, Christiaan Hoogendam, Joeri Lof, Erik Loopstra, Johannes Mulkens, Hans Jansen, Jacobus Johannus Hendricus Verspay, Alexander Straaijer, Bob Streefkerk
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Publication number: 20060176458Abstract: In a lithographic projection apparatus, a liquid supply system provides liquid in a space between the final element of the projection system and the substrate of the lithographic projection apparatus. A shutter member is provided to contain liquid in the liquid supply system during, for example, substrate exchange.Type: ApplicationFiled: March 15, 2006Publication date: August 10, 2006Applicant: ASML Netherlands B.V.Inventors: Antonius Maria Derksen, Sjoerd Donders, Christiaan Hoogendam, Joeri Lof, Erik Loopstra, Jeroen Maria Mertens, Johannes Mulkens, Timotheus Sengers, Alexander Straaijer, Bob Streefkerk
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Publication number: 20060158626Abstract: A method for correcting an exposure parameter of an immersion lithographic apparatus is provided. In the method, an exposure parameter is measured using a measuring beam projected through a liquid between the projection system and a substrate table of the immersion lithographic apparatus and offset is determined based on a change of a physical property impacting a measurement made using the measuring beam to at least partly correct the measured exposure parameter. Also, there is provided an apparatus and method to measure a height of an optical element connected to liquid between the projection system and the substrate table in the immersion lithographic apparatus.Type: ApplicationFiled: December 12, 2005Publication date: July 20, 2006Applicant: ASML NETHERLANDS B.V.Inventors: Johannes Baselmans, Sjoerd Donders, Christiaan Hoogendam, Jeroen Mertens, Johannes Mulkens, Bob Streefkerk
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Publication number: 20060147821Abstract: A method for correcting an exposure parameter of an immersion lithographic apparatus is provided. In the method, an exposure parameter is measured using a measuring beam projected through a liquid between the projection system and a substrate table of the immersion lithographic apparatus and offset is determined based on a change of a physical property impacting a measurement made using the measuring beam to at least partly correct the measured exposure parameter.Type: ApplicationFiled: December 30, 2004Publication date: July 6, 2006Applicant: ASML NETHERLANDS B.V.Inventors: Bob Streefkerk, Johannes Baselmans, Sjoerd Donders, Jeroen Johannes Mertens, Johannes Mulkens, Christiaan Hoogendam
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Publication number: 20060138602Abstract: In immersion lithography, to avoid internal reflections in the final element of the projection system, immersion fluid and topcoat, the thicknesses, dl, dtc and dr, and refractive indices, nl, ntc and nr, of the immersion fluid, topcoat and resist may meet the following criteria: nl?ntc?nr dl>˜5.Type: ApplicationFiled: December 28, 2004Publication date: June 29, 2006Applicant: ASML NETHERLANDS B.V.Inventors: Johannes Mulkens, Marcel Marie Dierichs
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Publication number: 20060132731Abstract: A method and apparatus for cleaning the inside of an immersion lithographic apparatus is disclosed. In particular, a liquid supply system of the lithographic apparatus may be used to introduce a cleaning fluid into a space between the projection system and the substrate table of the lithographic apparatus. Additionally or alternatively, a cleaning device may be provided on the substrate table and an ultrasonic emitter may be provided to create an ultrasonic cleaning liquid.Type: ApplicationFiled: December 20, 2004Publication date: June 22, 2006Applicant: ASML NETHERLANDS B.V.Inventors: Hans Jansen, Johannes Baselmans, Sjoerd Donders, Christiaan Hoogendam, Jeroen Johannes Mertens, Johannes Mulkens, Marco Stavenga, Bob Streefkerk, Jan Cornelis Hoeven, Cedric Grouwstra
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Publication number: 20060077370Abstract: To compensate for birefringence of a mask in a lithographic projection apparatus, the birefringence of a mask is measured and stored as birefringence data in a data storage device. A birefringent compensation element is disposed in the optical path of the lithographic projection apparatus. Appropriate adjustments of the compensation element are determined as those optimally reducing impact of the mask birefringence on the state of polarization at substrate level.Type: ApplicationFiled: October 12, 2004Publication date: April 13, 2006Applicant: ASML Netherlands B.V.Inventors: Johannes Mulkens, Wilhelmus De Boeij, Carsten Kohler
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Publication number: 20050264778Abstract: A lithographic projection apparatus is disclosed in which a space between the projection system and a sensor is filled with a liquid.Type: ApplicationFiled: June 1, 2004Publication date: December 1, 2005Applicant: ASML NETHERLANDS B.V.Inventors: Joeri Lof, Erik Bijlaart, Roelof Aeilko Ritsema, Frank Schaik, Timotheus Sengers, Klaus Simon, Joannes De Smit, Arie Den Boef, Hans Butler, Sjoerd Donders, Christiaan Hoogendam, Marcus Van De Kerkhof, Aleksey Kolesnychenko, Mark Kroon, Erik Loopstra, Hendricus Meijer, Jeroen Maria Mertens, Johannes Mulkens, Joost Ottens, Alexander Straaijer, Bob Streefkerk, Helmar Van Santen
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Publication number: 20050259232Abstract: A lithographic projection apparatus is disclosed in which a liquid supply system provides a liquid between the projection system and the substrate. An active drying station is provided to actively remove the liquid from the substrate W or other objects after immersion of all or part of a surface of the substrate W or other objects.Type: ApplicationFiled: May 18, 2004Publication date: November 24, 2005Applicant: ASML NETHERLANDS B.V.Inventors: Bob Streefkerk, Sjoerd Donders, Erik Loopstra, Johannes Mulkens
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Publication number: 20050231694Abstract: A substrate table of an immersion lithographic apparatus is disclosed which comprises a barrier configured to collect liquid. The barrier surrounds the substrate and is spaced apart from the substrate. In this way any liquid which is spilt from the liquid supply system can be collected to reduce the risk of contamination of delicate components of the lithographic projection apparatus.Type: ApplicationFiled: April 14, 2004Publication date: October 20, 2005Applicant: ASML NETHERLANDS B.V.Inventors: Aleksey Kolesnychenko, Johannes Jacobus Baselmans, Sjoerd Donders, Christiaan Hoogendam, Hans Jansen, Jeroen Johannes Mertens, Johannes Mulkens, Felix Peeters, Bob Streefkerk, Franciscus Johannes Teunissen, Helmar Santen
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Publication number: 20050175776Abstract: An immersion lithographic projection apparatus is disclosed in which liquid is provided between a projection system of the apparatus and a substrate. The use of both liquidphobic and liquidphilic layers on various elements of the apparatus is provided to help prevent formation of bubbles in the liquid and to help reduce residue on the elements after being in contact with the liquid.Type: ApplicationFiled: November 12, 2004Publication date: August 11, 2005Applicant: ASML NETHERLANDS B.V.Inventors: Bod Streefkerk, Johannes Baselmans, Richard Bruls, Marcel Mathijs Dierichs, Sjoerd Donders, Christiaan Hoogendam, Hans Jansen, Erik Loopstra, Jeroen Johannes Mertens, Johannes Mulkens, Ronald Severijns, Sergei Shulepov, Herman Boom, Timotheus Sengers
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Publication number: 20050132914Abstract: A detector detects liquid in the path of a projection beam or alignment beam. A controller then determines which one or more of a plurality of compensating optical elements may be provided in the optical path of the projection beam or alignment beam in order to focus the projection beam or alignment beam on the surface of the substrate. The appropriate optical element may be placed in the path of the projection beam or alignment beam directly as a final element of the projection system or alignment system respectively.Type: ApplicationFiled: December 23, 2003Publication date: June 23, 2005Applicant: ASML NETHERLANDS B.V.Inventors: Johannes Mulkens, Marinus Van Den Brink, Erik Loopstra