Patents by Inventor Johannes N. Huiberts

Johannes N. Huiberts has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7227313
    Abstract: The invention provides a tool to select reliable organic LED devices, where the risk for failure before the end of its lifetime is low. This tool comprises the steps of: i) subjecting the device to a high electric field over the electroluminescent layer. This leads to a division of the devices into two, clearly separated, populations, namely one population with a low leakage current (current through the electroluminescent layer in reverse voltage operation) and one population with a high leakage current. In this step, the first population is selected in accordance with a current criterion. ii) detecting instabilities in the leakage current, referred to as noise. It has been established that these instabilities arise in particular at reverse driving voltages between 1 and 10 Volts. These instabilities are a measure of the occurrence of early failures during operation. In this step, the devices are selected in accordance with a noise criterion.
    Type: Grant
    Filed: March 15, 2005
    Date of Patent: June 5, 2007
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Johannes N. Huiberts, Loic C. A. Mourier, Peter Van De Weijer, Coen T. H. F. Liedenbaum, Martinus H. W. M. Van Delden
  • Patent number: 6888317
    Abstract: The invention provides a tool to select reliable organic LED devices, where the risk for failure before the end of its lifetime is low. This tool comprises the steps of: i) subjecting the device to a high electric field over the electroluminescent layer. This leads to a division of the devices into two, clearly separated, populations, namely one population with a low leakage current (current through the electroluminescent layer in reverse voltage operation) and one population with a high leakage current. In this step, the first population is selected in accordance with a current criterion. ii) detecting instabilities in the leakage current, referred to as noise. It has been established that these instabilities arise in particular at reverse driving voltages between 1 and 10 Volts. These instabilities are a measure of the occurrence of early failures during operation. In this step, the devices are selected in accordance with a noise criterion.
    Type: Grant
    Filed: October 30, 2002
    Date of Patent: May 3, 2005
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Johannes N. Huiberts, Loic C. A. Mourier, Peter Van De Weijer, Coen T. H. F. Liedenbaum, Martinus H. W. M. Van Delden
  • Publication number: 20030052619
    Abstract: The invention provides a tool to select reliable organic LED devices, where the risk for failure before the end of its lifetime is low.
    Type: Application
    Filed: October 30, 2002
    Publication date: March 20, 2003
    Applicant: U.S. PHILIPS CORPORATION
    Inventors: Johannes N. Huiberts, Loic C.A. Mourier, Peter Van De Weijer, Coen T.H.F. Liedenbaum, Martinus H.W.M. Van Delden
  • Patent number: 6525484
    Abstract: The invention provides a tool to select reliable organic LED devices, where the risk for failure before the end of its lifetime is low. This tool comprises the steps of: i) subjecting the device to a high electric field over the electroluminescent layer. This leads to a division of the devices into two, clearly separated, populations, namely one population with a low leakage current (current through the electroluminescent layer in reverse voltage operation) and one population with a high leakage current. In this step, the first population is selected in accordance with a current criterion. ii) detecting instabilities in the leakage current, referred to as noise. It has been established that these instabilities arise in particular at reverse driving voltages between 1 and 10 Volts. These instabilities are a measure of the occurrence of early failures during operation. In this step, the devices are selected in accordance with a noise criterion.
    Type: Grant
    Filed: September 22, 2000
    Date of Patent: February 25, 2003
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Johannes N. Huiberts, Loic C. A. Mourier, Peter Van De Weijer, Coen T. H. F. Liedenbaum, Martinus H. W. M. Van Delden
  • Patent number: 5635729
    Abstract: A description is given of a switching device (1) comprising a transparent substrate (3), a reflective switching film (5) of yttrium having a thickness of 500 nm and a palladium layer (7) having a thickness of 5 nm. Using hydrogen gas at atmospheric pressure and at room temperature, a transparent, semiconductive film (5) of YH.sub.3 is formed, which is converted to a metallic mirror-like film (5) of YH.sub.2 by exposure to heat. The conversion of YH.sub.2 into YH.sub.3 is reversible and can for example be used in an optical switching element and in thin displays.
    Type: Grant
    Filed: May 7, 1996
    Date of Patent: June 3, 1997
    Assignee: U.S. Philips Corporation
    Inventors: Ronald P. Griessen, Johannes N. Huiberts, Jan H. Rector