Patents by Inventor Johannes P. M. Van Alen

Johannes P. M. Van Alen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray analysis apparatus and scanning unit suitable for use in such an apparatus
    Patent number: 5438613
    Abstract: An X-ray analysis apparatus includes a scanning unit (1) with an X-ray source (3), a crystal holder (9) and an X-ray detection system (5) provided with an X-ray detector (7). The crystal holer (9) can be rectilinearly displaced in a fixed radiation pick-up direction (35) relative to the X-ray source (3). The crystal holder (9) and the X-ray detector (7) are mechanically coupled to one another via a plate (21) which can be driven by means of a motion mechanism. The X-ray source (3), the X-ray detector (7) and the crystal holder (9) remain positioned on a Rowland circle (11) during the displacement. The motion mechanism has a first guide (23) and a second guide (25). The drive direction of the first guide (23) encloses an acute angle .alpha. relative to the fixed pick-up direction (35).
    Type: Grant
    Filed: December 18, 1992
    Date of Patent: August 1, 1995
    Assignee: U.S. Philips Corporation
    Inventors: Wilhelmus A. H. Gijzen, Walterus A. L. A. Van Egeraat, Johannes P. M. Van Alen, Albert Visscher