Abstract: A combination detector for detecting a visually identifiable property and an optical property of an optical system. A phase visualization element converts an incoming light bundle to one or more output light bundles in which the spatial phase distribution of the incoming light bundle is visually apparent. The phase visualization element is arranged relative to a detection surface of an image sensor such that the output light bundle or the output light bundles is/are incident only on a first partial region of the detection surface, while a second partial region of the detection surface is exposed in the direction of incidence in order to detect the incoming light bundle which is uninfluenced by the phase visualization element. An apparatus for testing the optical system includes a light source for generating a measuring light bundle and a combination detector as described.

Abstract: An apparatus for inspecting lenses includes an inspection system including an open cuvette, a communicatively coupled CT measurement device, and a user interface communicatively coupled to the inspection system. According to one embodiment, the lens inspection system provides a single instrument for inspecting the quality of a lens, thereby minimizing the transference of the lens from one inspection component to another.

Abstract: An apparatus for inspecting lenses includes an inspection system including an open cuvette, a communicatively coupled CT measurement device, and a user interface communicatively coupled to the inspection system. According to one embodiment, the lens inspection system provides a single instrument for inspecting the quality of a lens, thereby minimizing the transference of the lens from one inspection component to another.

Abstract: An apparatus for inspecting lenses includes an inspection system including an open cuvette, a communicatively coupled CT measurement device, and a user interface communicatively coupled to the inspection system. According to one embodiment, the lens inspection system provides a single instrument for inspecting the quality of a lens, thereby minimizing the transference of the lens from one inspection component to another.

Abstract: An apparatus for inspecting lenses includes an inspection system including an open cuvette, a communicatively coupled CT measurement device, and a user interface communicatively coupled to the inspection system. According to one embodiment, the lens inspection system provides a single instrument for inspecting the quality of a lens, thereby minimizing the transference of the lens from one inspection component to another.

Abstract: A device and a method are used for measuring the surface topography and a wave aberration of a lens system. The device is fitted with a first measuring system containing a light source radiating a first light beam of a first wavelength, and a detector which captures the first light beam which is reflected on the lens system. In addition the device has a second measuring system containing a light source for radiating a second light beam of a second wavelength and a detector for capturing the second light beam transmitted by the lens system. A diffractive optical element is disposed in a common beam path of the first measuring system and second measuring system. The optical element adapts the respective wave-front course of the first light beam and the second light beam in a wavelength-selective manner.

Abstract: A device and a method are used for measuring the surface topography and a wave aberration of a lens system. The device is fitted with a first measuring system containing a light source radiating a first light beam of a first wavelength, and a detector which captures the first light beam which is reflected on the lens system. In addition the device has a second measuring system containing a light source for radiating a second light beam of a second wavelength and a detector for capturing the second light beam transmitted by the lens system. A diffractive optical element is disposed in a common beam path of the first measuring system and second measuring system. The optical element adapts the respective wave-front course of the first light beam and the second light beam in a wavelength-selective manner.