Abstract: A non-contact multispectral measurement device for measuring reflectance properties of a surface of interest may include a multispectral measurement system, a position measurement system for measuring position values of the multispectral measurement system relative to the surface of interest, and means to correct multispectral values from the multispectral measurement system based on detected position values from the position measurement system. In some embodiments the multispectral measurement system is configured with a retro-reflection measurement geometry, where the illumination light path and observation light path are inclined with respect to a surface normal of the surface of interest to reduce detection of gloss or surface reflections while obtaining multispectral values. The position measurement system may be selected from the group consisting of: a pattern projector and a camera, a camera autofocus system, a stereo vision system, a laser range finder, and a time of flight distance sensor.