Patents by Inventor Johannes Schwieters

Johannes Schwieters has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9818591
    Abstract: An electrostatic dual-mode lens assembly is provided for selectively transmitting or reflecting an ion beam in a mass spectrometer. The assembly comprises at least one electrode that provides a switchable electric field that, during a first mode of operation, directs an ion beam that enters the assembly along a first path so that the beam is transmitted through the assembly along the first path, and during a second mode of operation, directs an ion beam that enters the assembly along the first path so that the ion beam is reflected by the electric field and exits the assembly along a second path. Methods for operating a mass spectrometer using an electrostatic lens are also provided.
    Type: Grant
    Filed: August 3, 2016
    Date of Patent: November 14, 2017
    Assignee: Thermo Fisher Scientific (Bremer) GmbH
    Inventors: Johannes Schwieters, Gerhard Jung
  • Publication number: 20170270282
    Abstract: A mass spectrometer including an entrance slit, an energy filter, a momentum filter and a detector array, the entrance slit, energy filter and momentum filter being configured to provide molecular analyte ions to the detector array at a mass resolution of about 20,000 or greater. A method for determining the isotopic composition of an analyte in a sample includes converting the analyte to molecular analyte ions, separating the molecular analyte ions using an entrance slit, separating the molecular analyte ions according to their energy levels, separating the molecular analyte ions according to their momenta, detecting two or more of the molecular analyte ions at a mass resolution of about 20,000 or greater to produce molecular analyte ion data; and analyzing the molecular analyte data to determine the isotopic composition of at least a portion of the analyte.
    Type: Application
    Filed: June 7, 2017
    Publication date: September 21, 2017
    Inventors: John M. Eiler, Johannes Schwieters
  • Patent number: 9766219
    Abstract: A gas inlet system for introducing gas into an isotope ratio analyser, the gas inlet system including a reference system comprising: a first supply of a reference gas having a first known isotope ratio; a supply of a carrier gas, wherein the supplies of reference gas and carrier gas are each connected by respective reference and carrier gas lines to a first mixing junction where the reference gas and carrier gas combine; a mixing zone connected downstream of the first mixing junction wherein the combined reference gas and carrier gas mix together; an exit line for transporting the mixed gas from the mixing zone to the isotope ratio analyser; and an opening on the exit line, wherein the opening is downstream of the mixing zone. Also provided is a method of determining an isotope ratio.
    Type: Grant
    Filed: April 9, 2014
    Date of Patent: September 19, 2017
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Eric Wapelhorst, Hans-Juergen Schlueter, Oliver Kracht, Johannes Schwieters, Michael Krummen
  • Patent number: 9697338
    Abstract: A mass spectrometer including an entrance slit, an energy filter, a momentum filter and a detector array, the entrance slit, energy filter and momentum filter being configured to provide molecular analyte ions to the detector array at a mass resolution of about 20,000 or greater. A method for determining the isotopic composition of an analyte in a sample includes converting the analyte to molecular analyte ions, separating the molecular analyte ions using an entrance slit, separating the molecular analyte ions according to their energy levels, separating the molecular analyte ions according to their momenta, detecting two or more of the molecular analyte ions at a mass resolution of about 20,000 or greater to produce molecular analyte ion data; and analyzing the molecular analyte data to determine the isotopic composition of at least a portion of the analyte.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: July 4, 2017
    Assignees: CALIFORNIA INSTITUTE OF TECHNOLOGY, THERMO FISHER SCIENTIFIC (BREMEN) GMBH
    Inventors: John M. Eiler, Johannes Schwieters
  • Publication number: 20170047210
    Abstract: A method for generating a mass spectrum of sample ions using a multi-collector mass spectrometer is disclosed. The mass spectrometer includes a spatially dispersive mass analyser to direct the sample ions into a detector chamber. The method includes generating sample ions of a first ion species A, a second ion species B, and a third ion species C, wherein the ions of species A have a different nominal mass to the ions of species B and C, and further wherein the ions of species B have the same nominal mass as the ions of species C. The sample ions of the species A, B and C are directed to travel through the mass analyser and towards detectors in the detector chamber, the sample ions being deflected during their travel. The ions of species B and C are scanned across a master aperture defined in a master mask of a master detector, while the ions of species A pass through a lead aperture defined in a lead mask of a lead detector.
    Type: Application
    Filed: August 12, 2016
    Publication date: February 16, 2017
    Inventors: Johannes SCHWIETERS, Michael DEERBERG, Michael KRUMMEN
  • Publication number: 20170047217
    Abstract: In a mass spectrometer, a mass-to-charge dispersive element separates received ions spatially according to their mass-to-charge ratios, to provide a dispersed ion beam thereby. An ion detection arrangement that detects the dispersed ion beam comprises: at least one primary ion detector, each detecting spatially separated ions having mass-to-charge ratios within a respective desired range and each providing a respective main beam signal based on its respective detected ions; and at least one secondary ion detector, each detecting ions having mass-to-charge ratios outside all of the desired ranges simultaneously with the at least one primary ion detector detecting the spatially separated ions and each providing a respective background signal based on its respective detected ions. At least one mass intensity measurement is provided for the received ions having a mass-to-charge ratio within the desired range, based on the at least one main beam signal and the at least one background signal.
    Type: Application
    Filed: August 3, 2016
    Publication date: February 16, 2017
    Inventors: Jens RADKE, Andreas HILKERT, Anne TRINQUIER, Johannes SCHWIETERS
  • Publication number: 20170047216
    Abstract: An electrostatic dual-mode lens assembly is provided for selectively transmitting or reflecting an ion beam in a mass spectrometer. The assembly comprises at least one electrode that provides a switchable electric field that, during a first mode of operation, directs an ion beam that enters the assembly along a first path so that the beam is transmitted through the assembly along the first path, and during a second mode of operation, directs an ion beam that enters the assembly along the first path so that the ion beam is reflected by the electric field and exits the assembly along a second path. Methods for operating a mass spectrometer using an electrostatic lens are also provided.
    Type: Application
    Filed: August 3, 2016
    Publication date: February 16, 2017
    Inventors: Johannes SCHWIETERS, Gerhard JUNG
  • Publication number: 20170031033
    Abstract: A method of imaging analyte elements in an organic sample includes providing the sample as a layer on a substrate and reacting the sample on the substrate to produce one or more volatile products that leave the sample while the one or more elements remain in the sample. A majority of the sample layer by weight is removed from the substrate by the reaction and the remaining sample layer is enriched in the one or more elements which are not spatially disturbed by the reaction. The method including subsequently detecting the one or more elements in the concentrated sample layer using an imaging elemental analyzer.
    Type: Application
    Filed: July 22, 2016
    Publication date: February 2, 2017
    Inventors: Alexander A. MAKAROV, Johannes SCHWIETERS
  • Publication number: 20160320362
    Abstract: A gas transport system includes at least one chemical reactor having at least one inlet and at least one gas outlet and at least one sample introduction unit for delivering the sample into the chemical reactor. The gas transport system at least one carrier gas line fluidly coupled to the chemical reactor inlet for introducing into the chemical reactor carrier gas from a carrier gas source, at least one gas outlet line from the chemical reactor gas outlet, and at least one gas recycling line connected to the gas outlet and/or the gas outlet line by a first gas line junction that is arranged between the chemical reactor and a downstream detection unit on the gas outlet line. The gas transport system is adapted to allow recycling of at least a portion of gas emerging from the chemical reactor outlet back to the chemical reactor via the gas recycling line.
    Type: Application
    Filed: April 29, 2016
    Publication date: November 3, 2016
    Inventors: Johannes SCHWIETERS, Michael KRUMMEN, Hans-Juergen SCHLUETER, Oliver KRACHT
  • Publication number: 20160320355
    Abstract: A system for concentrating an analyte gas in a gas stream of an analytical system is provided. The system comprises at least one separation device, at least one gas inlet line, at least one detector, at least one gas outlet line, a first split line in connected to the gas inlet line, and a first split valve for controlling gas flow in the first split line. Also provided is a method for concentrating an analyte gas.
    Type: Application
    Filed: April 27, 2016
    Publication date: November 3, 2016
    Inventors: Michael KRUMMEN, Johannes SCHWIETERS, Hans-Juergen SCHLUETER, Oliver KRACHT
  • Patent number: 9472389
    Abstract: An ion source assembly for a static mass spectrometer, comprises: a mounting element for locating the assembly within the static mass spectrometer; an ion source for generating ions to be analyzed in the static mass spectrometer, the ion source being spaced from the mounting element and arranged to be held in use at a first relatively high potential V1 with respect to the mounting element; and a spacer mounted between the mounting element and the ion source, the spacer arranged to be held in use at a second potential V2 with respect to the mounting element, which is less than the first potential V1.
    Type: Grant
    Filed: November 15, 2013
    Date of Patent: October 18, 2016
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Michael Krummen, Michael Deerberg, Johannes Schwieters
  • Publication number: 20160282263
    Abstract: A gas inlet system 20 for an isotope ratio spectrometer 1 and a method for coupling analyte gas to an isotope ratio spectrometer 1 are disclosed. A variable volume reservoir 5 is located between a supply of analyte gas 9,11 and a spectrometer 1. The reservoir's internal volume is controllably adjusted at a pre-determined rate to generate a defined flow of analyte gas or mixture to or from the reservoir 5. Analyte gas and carrier gas are taken up by the reservoir 5 on increasing the reservoir's internal volume and then expelled from the reservoir to the spectrometer 1 on decreasing the reservoir's internal volume. An open split 3,8 can be used together with the reservoir 5 to facilitate splitting away and hence dilution of analyte within the reservoir 5. A method for cleaning the gas inlet system 20 is provided, which involves flushing the system with carrier gas.
    Type: Application
    Filed: November 10, 2014
    Publication date: September 29, 2016
    Inventors: Hans-Juergen SCHLUETER, Johannes SCHWIETERS, Eric WAPELHORST, Michael KRUMMEN
  • Publication number: 20160266031
    Abstract: An isotope ratio of a continuous sample is measured in an isotope ratio spectrometer. At least one sample isotope ratio is measured over a measurement time period tns, (n?1) and a sample concentration cns is measured over at least a part of the measurement time period cns. A reference gas concentration cnref for the spectrometer is selected for reference to the sample measured during the measurement time period tns, on the basis of the measured sample concentration cnref. An isotope ratio of the reference gas is measured at the selected reference gas concentration cnref in the spectrometer. The at least one isotope ratio of the sample measured during the measurement time period tnref is calibrated using the measured isotope ratio of the reference gas at the corresponding reference gas concentration cnref and a plurality of calibrated isotope ratios and a plurality of sample gas concentration measurements are determined, each being for a different time.
    Type: Application
    Filed: November 10, 2014
    Publication date: September 15, 2016
    Inventors: Hans-Juergen Schlueter, Oliver Kracht, Jens Radke, Benno Strasser, Johannes Schwieters, Eric Wapelhorst
  • Publication number: 20160061798
    Abstract: A gas inlet system for introducing gas into an isotope ratio analyser, the gas inlet system including a reference system comprising: a first supply of a reference gas having a first known isotope ratio; a supply of a carrier gas, wherein the supplies of reference gas and carrier gas are each connected by respective reference and carrier gas lines to a first mixing junction where the reference gas and carrier gas combine; a mixing zone connected downstream of the first mixing junction wherein the combined reference gas and carrier gas mix together; an exit line for transporting the mixed gas from the mixing zone to the isotope ratio analyser; and an opening on the exit line, wherein the opening is downstream of the mixing zone. Also provided is a method of determining an isotope ratio.
    Type: Application
    Filed: April 9, 2014
    Publication date: March 3, 2016
    Inventors: Eric WAPELHORST, Hans-Juergen SCHLUETER, Oliver KRACHT, Johannes SCHWIETERS, Michael KRUMMEN
  • Publication number: 20150287582
    Abstract: An ion source assembly for a static mass spectrometer, comprises: a mounting element for locating the assembly within the static mass spectrometer; an ion source for generating ions to be analyzed in the static mass spectrometer, the ion source being spaced from the mounting element and arranged to be held in use at a first relatively high potential V1 with respect to the mounting element; and a spacer mounted between the mounting element and the ion source, the spacer arranged to be held in use at a second potential V2 with respect to the mounting element, which is less than the first potential V1.
    Type: Application
    Filed: November 15, 2013
    Publication date: October 8, 2015
    Inventors: Michael Krummen, Michael Deerberg, Johannes Schwieters
  • Patent number: 8895915
    Abstract: A mass spectrometer is disclosed having a mass analyzer with a mass-to-charge dispersive element for separating ions according to their mass-to-charge ratios along a dispersive plane and an ion deflector to deflect ions leaving the mass analyzer in the dispersive plane. A shielding arrangement, located between the dispersive element and the ion deflector is arranged to define the portion of the beam to be deflected by the ion deflector. The deflected beam is steered onto a beam defining aperture, located at the focal plane of the mass analyzer is detected by at least one ion detector, located downstream from the beam defining aperture.
    Type: Grant
    Filed: July 14, 2011
    Date of Patent: November 25, 2014
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Johannes Schwieters, Michael Krummen, Dougal Hamilton
  • Patent number: 8592757
    Abstract: A mass spectrometer for analyzing isotopic signatures, with at least one magnetic analyzer and optionally with an electric analyzer as well, with a first arrangement of ion detectors and/or ion passages and, arranged downstream thereof in the direction of the ion beam, a second arrangement of ion detectors, with at least one deflector in the region of the two arrangements of ion detectors or between these arrangements. Additionally, a multi-collector arrangement, special uses and a method for analyzing isotopes in a sample. The mass spectrometer according to the invention has a control for the at least one deflector such that ion beams of different isotopes can be routed to at least one ion detector in the second arrangement.
    Type: Grant
    Filed: June 10, 2010
    Date of Patent: November 26, 2013
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Johannes Schwieters, Silke Seedorf, Michael Deerberg
  • Publication number: 20130112868
    Abstract: A mass spectrometer is disclosed having a mass analyser with a mass-to-charge dispersive element for separating ions according to their mass-to-charge ratios along a dispersive plane and an ion deflector to deflect ions leaving the mass analyser in the dispersive plane. A shielding arrangement, located between the dispersive element and the ion deflector is arranged to define the portion of the beam to be deflected by the ion deflector. The deflected beam is steered onto a beam defining aperture, located at the focal plane of the mass analyser is detected by at least one ion detector, located downstream from the beam defining aperture.
    Type: Application
    Filed: July 14, 2011
    Publication date: May 9, 2013
    Inventors: Johannes Schwieters, Michael Krummen, Dougal Hamilton
  • Patent number: 8402814
    Abstract: A method for the analysis of isotope ratios, wherein at least one sample gas and/or at least one reference gas are supplied to at least one analytical device via at least one open split, the addition of a carrier gas also being possible. According to the invention, the concentration of the sample gas and/or reference gas passing into the analytical device is controlled by the supply of the respective carrier gas or by direct supply of the sample gas into the analytical device. In the device according to the invention for supplying gases to at least one analytical device, two or more capillaries are provided for sample gases, the capillaries in each case having their own drive for the movement between mixing zone and waiting zone.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: March 26, 2013
    Assignee: Thermo Fischer Scientific (Bremen) GmbH
    Inventors: Deike Hatscher, Andreas Hilkert, Hans-Jürgen Schlüter, Alexander Duhr, Michael Krummen, Johannes Schwieters
  • Publication number: 20120085904
    Abstract: A mass spectrometer for analyzing isotopic signatures, with at least one magnetic analyzer and optionally with an electric analyzer as well, with a first arrangement of ion detectors and/or ion passages and, arranged downstream thereof in the direction of the ion beam, a second arrangement of ion detectors, with at least one deflector in the region of the two arrangements of ion detectors or between these arrangements. Additionally, a multi-collector arrangement, special uses and a method for analyzing isotopes in a sample. The mass spectrometer according to the invention has a control for the at least one deflector such that ion beams of different isotopes can be routed to at least one ion detector in the second arrangement.
    Type: Application
    Filed: June 10, 2010
    Publication date: April 12, 2012
    Applicant: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Johannes Schwieters, Silke Seedorf, Michael Deerberg