Abstract: A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received.

Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: A rack for receiving electronic devices has a plurality of receiving slots. At least one of the receiving slots has a scissor mechanism, the scissor mechanism having a first end connected to the rack and a second end provided with a mounting interface. The mounting interface is adapted for being mechanically connected to an electronic device.

Abstract: A housing wall includes at least one air grid having at least a first layer with a first mesh structure and a second layer with a second mesh structure. The first mesh structure is coextensively arranged with the second mesh structure. The first layer and the second layer are electrically conductively coupled. The first mesh structure includes a first plurality of through-holes. The second mesh structure includes a second plurality of through-holes. The through-holes of the first plurality of through-holes are misaligned compared to through-holes of the second plurality of through-holes such that a nonuniform total through-hole configuration of the air grid is provided.

Abstract: A housing wall comprises at least one air grid having at least a first layer with a first mesh structure and a second layer with a second mesh structure. The first mesh structure is coextensively arranged with the second mesh structure. The first layer and the second layer are electrically conductively coupled. The first mesh structure includes a first plurality of through-holes. The second mesh structure includes a second plurality of through-holes. The through-holes of the first plurality of through-holes are misaligned compared to through-holes of the second plurality of through-holes such that a nonuniform total through-hole configuration of the air grid is provided.

Abstract: A multiuser measurement system is provided. The multiuser measurement system may authenticate a specific user. When the user has been authenticated, user related data may be obtained from a memory. The user related data are stored in the memory in an encrypted manner, and the encrypted data are only decrypted after authenticating the user.

Abstract: A test system for testing a device under test having at least an input port and an output port. The test system comprising a vector signal generator, a switch, a directional element, and a vector signal analyser. The vector signal generator, depending on the respective switching position of the switch, is connected with the input port of the device under test or the output port of the device under test such that, in a first switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the input port and, in a second switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the output port. The switch is configured to enable the vector signal analyser to perform reflection measurements and transmission measurements depending on the respective switching position of the switch.

Abstract: An electrical device including a skeleton-like frame structure and at least one electrical module is provided. The skeleton-like frame structure has a low rigidity, while the at least one electrical module provides an increased rigidity when mounted.

Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: A test system for testing a device under test having at least an input port and an output port. The test system comprising a vector signal generator, a switch, a directional element, and a vector signal analyser. The vector signal generator, depending on the respective switching position of the switch, is connected with the input port of the device under test or the output port of the device under test such that, in a first switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the input port and, in a second switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the output port. The switch is configured to enable the vector signal analyser to perform reflection measurements and transmission measurements depending on the respective switching position of the switch.

Abstract: A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received.

Abstract: A measuring method for locating an imperfection in an electrically conductive material comprises applying an electric input signal with an electric signal generator to the electrically conductive material such that the electrically conductive material acts as an antenna and thereby transmits an electromagnetic output signal having a frequency spectrum comprising a contributing frequency corresponding to the imperfection within the electrically conductive material; receiving the electromagnetic output signal with an antenna detection system, wherein the antenna detection system probes the frequency spectrum of the electromagnetic output signal as a function of at least one of position and direction; and locating the imperfection within the electrically conductive material by analyzing with an analysis device a spatial origin of the contributing frequency within the frequency spectrum of the received electromagnetic output signal.

Abstract: An electrical device, comprising a device housing including a skeleton-like frame structure having a plurality of columns and/or crossbeams and at least one electrical module. The module has a module housing and is detachably mounted on the frame structure. The module housing accommodates one or more electrical components generating heat when being operated, wherein the at least one electrical module is liquid cooled and is connected to a radiator for establishing a coolant circuit. The radiator and an active ventilation means are arranged in the device housing such that the radiator is positioned in an air stream generated by the active ventilation means when the active ventilation means is operated.

Abstract: A measurement system for real-time visualization of radiation pattern is provided. The measurement system comprises an antenna array with a plurality of antennas configured to provide a voltage gain corresponding to a received radio signal. Furthermore, the measurement system comprises a plurality of radio frequency detectors configured to rectify the voltage gain from each antenna of the plurality of antennas. In addition, the measurement system comprises a plurality of amplifiers downstream of the plurality of radio frequency detectors configured to amplify the magnitude of a rectified voltage from each of the radio frequency detectors. The measurement system moreover comprises a plurality of receiving elements, each includes a light emitting diode and configured to receive an amplified voltage corresponding to each amplifier of the plurality of amplifiers.

Abstract: A measurement system for real-time visualization of radiation pattern is provided. The measurement system comprises an antenna array with a plurality of antennas configured to provide a voltage gain corresponding to a received radio signal. Furthermore, the measurement system comprises a plurality of radio frequency detectors configured to rectify the voltage gain from each antenna of the plurality of antennas. In addition, the measurement system comprises a plurality of amplifiers downstream of the plurality of radio frequency detectors configured to amplify the magnitude of a rectified voltage from each of the radio frequency detectors. The measurement system moreover comprises a plurality of receiving elements, each includes a light emitting diode and configured to receive an amplified voltage corresponding to each amplifier of the plurality of amplifiers.

Abstract: The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Abstract: A multiuser measurement system is provided. The multiuser measurement system may authenticate a specific user. When the user has been authenticated, user related data may be obtained from a memory. The user related data are stored in the memory in an encrypted manner, and the encrypted data are only decrypted after authenticating the user.

Abstract: A testing device for testing a device under test emitting a number of beams with respect to its beamforming behavior. Said testing device comprises an antenna, an analyzing unit, and a number of reflectors. Furthermore, each of the number of reflectors is configured to reflect at least one of the number of beams of the device under test to the antenna of the testing device.

Abstract: A testing device for testing a device under test emitting a number of beams with respect to its beamforming behavior. Said testing device comprises an antenna, an analyzing unit, and a number of reflectors. Furthermore, each of the number of reflectors is configured to reflect at least one of the number of beams of the device under test to the antenna of the testing device.