Abstract: A test fixture is provided for contacting selected terminals (10, 10') of an electrical assembly for testing by a test device (28). The fixture includes spaced-apart upper platen (2), middle platen (4), and lower platen (6) that are selectively movable according to a selected one of: (a) platen (6) being secured against movement relative platens (2) and (4) and platens (2) and (4) being concurrently and/or independently movable towards and away from platen (6) and; (b) platens (2) and (4) are being secured against movement relative platen (6) and platen (6) being movable towards and away therefrom and; (c) platen (4) being secured against movement relative platens (2) and (6) and platens (2) and (6) being concurrently and/or independently movable relative platen (4). The assembly to be tested is mounted on platen (2) and slected electrical contacts (24, 24') extending towards platen (4) are respectively mounted on platen ( 6).