Abstract: The device and method for performing an optical Hall test provide means for on-destructive measurement of free carrier concentration or effective mass in semiconductor materials using Faraday rotation spectra. A beam emitted by a Fourier transform infrared (FTIR) spectrometer is transmitted through the sample that is mounted between a polarizer and analyzer and the opposite poles of a magnet before finally being incident on a detector. The ratio of the samples's transmission spectrum with the magnetic field on to that with the magnetic field off is converted, through a suitable mathematical formula, to Faraday rotation. The rotation is, then, plotted versus the square of the wavelength. The slope of the graph at longer wavelengths is directly proportional to the carrier concentration and the effective mass. With one known, the other can be easily determined.

Abstract: A modulated Faraday rotation signal is produced by passing a linearly polarized laser beam through a semiconductor wafer sample in a modulated magnetic field that is induced in an electromagnet by a sine wave generator and driver coupled thereto. The rotation signal is normalized by dividing by a transmission signal produced by modulating the beam with a chopper that operates at a different frequency from the frequency of the driver. The result is a Faraday rotation measurement with high signal-to-noise ratio and compensation for laser drift in intensity.

Abstract: A sensitive infrared polarimeter that measures the amount of degree of rotation of the plane of polarization of plane polarized radiation after the radiation has passed through a wafer of cadmium sulfide. The wafer is placed in a relatively small magnetic field that is varied. Increased sensitivity is realized by using a chopping wheel to chop the laser beam, providing a reference frequency and by detecting the signals with a synchronous detector such as a lock-in amplifier to obtain high signal to noise ratios of the detected signal. The greater sensitivity of the high-sensitivity infrared polarimeter allows electronic carrier concentrations as low as 10.sup.15 cm.sup.-3 to be measured in cadmium sulfide with magnetic fields as low as 0.1 Tesla.