Patents by Inventor John A. Hoffnagle

John A. Hoffnagle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260104353
    Abstract: Improved cavity enhanced optical spectroscopy is provided by appropriate per-mode averaging of measured vs. desired frequencies. By using this information to control the optical path length of the cavity, the frequency comb defined by the cavity at which measurements are performed can be substantially stabilized vs. perturbations such as changes in gas sample pressure.
    Type: Application
    Filed: October 10, 2024
    Publication date: April 16, 2026
    Inventors: Chris W. Rella, Sze Meng Tan, John A. Hoffnagle
  • Publication number: 20250207975
    Abstract: Improved cavity enhanced absorption spectroscopy is provided using a piecewise tunable laser by using a lookup table for laser tuning that is configured specifically for this application. In preferred embodiments this is done in combination with a laser control strategy that provides precise wavelength determination using cavity modes of the instrument as a reference.
    Type: Application
    Filed: March 17, 2025
    Publication date: June 26, 2025
    Inventors: Alejandro Dario Farinas, John A. Hoffnagle, Chris W. Rella, Sze Meng Tan
  • Publication number: 20250137921
    Abstract: Improved correction of optical absorption spectroscopy results for trace gas detection is provided by correcting for species crosstalk (and other environmental effects) on a per-frequency basis. Analyte concentrations are then determined by curve fitting to the corrected absorption spectrum. This is in marked contrast to the conventional approach of first performing a curve fit to determine analyte concentrations, then correcting the analyte concentrations to account for species crosstalk and other environmental effects. In some embodiments, the number of parameters for the per-frequency corrections are automatically determined from the data (e.g., using a LASSO regression).
    Type: Application
    Filed: October 31, 2023
    Publication date: May 1, 2025
    Inventors: Chris W. Rella, Andrea Biasioli, Craig M. Haupt, Kai M. Skog, John A. Hoffnagle
  • Patent number: 12270706
    Abstract: Improved cavity enhanced absorption spectroscopy is provided using a piecewise tunable laser by using a lookup table for laser tuning that is configured specifically for this application. In preferred embodiments this is done in combination with a laser control strategy that provides precise wavelength determination using cavity modes of the instrument as a reference.
    Type: Grant
    Filed: August 15, 2021
    Date of Patent: April 8, 2025
    Assignee: Picarro, Inc.
    Inventors: Alejandro Dario Farinas, John A. Hoffnagle, Chris W. Rella, Sze Meng Tan
  • Patent number: 11592388
    Abstract: Improved optical absorption spectroscopy of species having broad spectral features is provided by choosing frequencies to cover the spectral feature(s) of interest, where the frequencies are slightly adjusted as needed to avoid narrow spectral features from interfering chemical species (i.e., clutter). The resulting clutter avoidance provides improved optical spectroscopy of species having broad spectral features.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: February 28, 2023
    Assignee: Picarro, Inc.
    Inventors: John A. Hoffnagle, Chris W. Rella
  • Publication number: 20210372855
    Abstract: Improved cavity enhanced absorption spectroscopy is provided using a piecewise tunable laser by using a lookup table for laser tuning that is configured specifically for this application. In preferred embodiments this is done in combination with a laser control strategy that provides precise wavelength determination using cavity modes of the instrument as a reference.
    Type: Application
    Filed: August 15, 2021
    Publication date: December 2, 2021
    Inventors: Alejandro Dario Farinas, John A. Hoffnagle, Chris W. Rella, Sze Meng Tan
  • Patent number: 11092493
    Abstract: Improved cavity enhanced absorption spectroscopy is provided using a piecewise tunable laser by using a lookup table for laser tuning that is configured specifically for this application. In preferred embodiments this is done in combination with a laser control strategy that provides precise wavelength determination using cavity modes of the instrument as a reference.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: August 17, 2021
    Assignee: Picarro, Inc.
    Inventors: Alejandro Dario Farinas, John A. Hoffnagle, Chris W. Rella, Sze Meng Tan
  • Publication number: 20210181092
    Abstract: Improved optical absorption spectroscopy of species having broad spectral features is provided by choosing frequencies to cover the spectral feature(s) of interest, where the frequencies are slightly adjusted as needed to avoid narrow spectral features from interfering chemical species (i.e., clutter). The resulting clutter avoidance provides improved optical spectroscopy of species having broad spectral features.
    Type: Application
    Filed: December 13, 2019
    Publication date: June 17, 2021
    Inventors: John A. Hoffnagle, Chris W. Rella
  • Publication number: 20210181023
    Abstract: Improved cavity enhanced absorption spectroscopy is provided using a piecewise tunable laser by using a lookup table for laser tuning that is configured specifically for this application. In preferred embodiments this is done in combination with a laser control strategy that provides precise wavelength determination using cavity modes of the instrument as a reference.
    Type: Application
    Filed: December 13, 2019
    Publication date: June 17, 2021
    Inventors: Alejandro Dario Farinas, John A. Hoffnagle, Chris W. Rella, Sze Meng Tan
  • Patent number: 11035728
    Abstract: Interleaved data acquisition in optical spectroscopy is used to provide interference correction for time-varying interference. Measurements at a reference frequency are used to provide an estimate of the interference. These reference measurements are interleaved with the remaining measurements in order to provide estimates of the interference vs. time at relevant times. The interference being corrected can be spectrally structured or unstructured.
    Type: Grant
    Filed: April 30, 2019
    Date of Patent: June 15, 2021
    Assignee: Picarro, Inc.
    Inventors: Chris W. Rella, Hongbing Chen, Derek Gregory Fleck, John A. Hoffnagle, James Ian Lee, Gerald Thomas Sorensen, Sze Meng Tan
  • Publication number: 20200049556
    Abstract: Interleaved data acquisition in optical spectroscopy is used to provide interference correction for time-varying interference. Measurements at a reference frequency are used to provide an estimate of the interference. These reference measurements are interleaved with the remaining measurements in order to provide estimates of the interference vs. time at relevant times. The interference being corrected can be spectrally structured or unstructured.
    Type: Application
    Filed: April 30, 2019
    Publication date: February 13, 2020
    Inventors: Chris W. Rella, Hongbing Chen, Derek Gregory Fleck, John A. Hoffnagle, James Ian Lee, Gerald Thomas Sornsen, Sze Meng Tan
  • Patent number: 9645077
    Abstract: Optical spectrometer apparatus, systems, and methods for analysis of carbon-14 including a resonant optical cavity configured to accept a sample gas including carbon-14, an optical source configured to deliver optical radiation to the resonant optical cavity, an optical detector configured to detect optical radiation emitted from the resonant cavity and to provide a detector signal; and a processor configured to compute a carbon-14 concentration from the detector signal, wherein computing the carbon-14 concentration from the detector signal includes fitting a spectroscopic model to a measured spectrogram, wherein the spectroscopic model accounts for contributions from one or more interfering species that spectroscopically interfere with carbon-14.
    Type: Grant
    Filed: May 18, 2015
    Date of Patent: May 9, 2017
    Assignees: Lawrence Livermore National Security, LLC, Picarro, Inc.
    Inventors: Ted Ognibene, Graham Bench, Alan Daniel McCartt, Kenneth Turteltaub, Chris W. Rella, Sze Tan, John A. Hoffnagle, Nabil Saad, Eric Crosson
  • Patent number: 9267880
    Abstract: For cavity enhanced optical spectroscopy, the cavity modes are used as a frequency reference. Data analysis methods are employed that assume the data points are at equally spaced frequencies. Parameters of interest such as line width, integrated absorption etc. can be determined from such data without knowledge of the frequencies of any of the data points. Methods for determining the FSR index of each ring-down event are also provided.
    Type: Grant
    Filed: February 27, 2015
    Date of Patent: February 23, 2016
    Assignee: Picarro, Inc.
    Inventors: Sze Meng Tan, John A. Hoffnagle, Chris W. Rella
  • Publication number: 20160011101
    Abstract: Optical spectrometer apparatus, systems, and methods for analysis of carbon-14 including a resonant optical cavity configured to accept a sample gas including carbon-14, an optical source configured to deliver optical radiation to the resonant optical cavity, an optical detector configured to detect optical radiation emitted from the resonant cavity and to provide a detector signal; and a processor configured to compute a carbon-14 concentration from the detector signal, wherein computing the carbon-14 concentration from the detector signal includes fitting a spectroscopic model to a measured spectrogram, wherein the spectroscopic model accounts for contributions from one or more interfering species that spectroscopically interfere with carbon-14.
    Type: Application
    Filed: May 18, 2015
    Publication date: January 14, 2016
    Inventors: Ted Ognibene, Graham Bench, Alan Daniel McCartt, Kenneth Turteltaub, Chris W. Rella, Sze Tan, John A. Hoffnagle, Nabil Saad, Eric Crosson
  • Patent number: 8982352
    Abstract: For cavity enhanced optical spectroscopy, the cavity modes are used as a frequency reference. Data analysis methods are employed that assume the data points are at equally spaced frequencies. Parameters of interest such as line width, integrated absorption etc. can be determined from such data without knowledge of the frequencies of any of the data points.
    Type: Grant
    Filed: September 26, 2013
    Date of Patent: March 17, 2015
    Assignee: Picarro, Inc.
    Inventors: John A. Hoffnagle, Sze Meng Tan, Chris W. Rella
  • Patent number: 7875408
    Abstract: Compositions comprising photobleachable organic materials can be bleached by 193 nm light, and brought back to their original state by stimuli after exposure. (reversible photobleaching). We use these compositions in art-known contrast enhancement layers and as a part of a photoresist, especially in optical lithography processes for semiconductor fabrication. They may comprise polymers such as organo-silicon polymers, polymers comprising polymers of aromatic hydroxyl compounds such as phenol and naphthol such as phenol formaldehyde polymers and naphthol formaldehyde polymers styrene polymers and phenolic acrylate polymers or cyclic materials comprising: where the radicals “R” and “Y” represent organo, or substituted organo moieties, Structures I, II, and III represent basic organic skeletons and can be unsubstituted or substituted in any available position with any one or combinations of multiple substituents.
    Type: Grant
    Filed: January 25, 2007
    Date of Patent: January 25, 2011
    Assignee: International Business Machines Corporation
    Inventors: John A. Hoffnagle, David R. Medeiros, Robert D. Miller, Libor Vycklicky, Gregory M. Wallraff
  • Publication number: 20080182178
    Abstract: Compositions comprising photobleachable organic materials can be bleached by 193 nm light, and brought back to their original state by stimuli after exposure. (reversible photobleaching). We use these compositions in art-known contrast enhancement layers and as a part of a photoresist, especially in optical lithography processes for semiconductor fabrication. They may comprise polymers such as organosilicon polymers, polymers comprising polymers of aromatic hydroxyl compounds such as phenol and naphthol such as phenol formaldehyde polymers and naphthol formaldehyde polymers styrene polymers and phenolic acrylate polymers or cyclic materials comprising: where the radicals “R” and “Y” represent organo, or substituted organo moieties, Structures I, II, and III represent basic organic skeletons and can be unsubstituted or substituted in any available position with any one or combinations of multiple substituents.
    Type: Application
    Filed: January 25, 2007
    Publication date: July 31, 2008
    Inventors: John A. Hoffnagle, David R. Medeiros, Robert D. Miller, Libor Vycklicky, Gregory M. Wallraff
  • Patent number: 7079223
    Abstract: A method and system is provided for computing lithographic images that may take into account non-scalar effects such as lens birefringence, resist stack effects, tailored source polarizations, and blur effects of the mask and the resist. A generalized bilinear kernel is formed, which is independent of the mask transmission function, and which may then be treated using a decomposition to allow rapid computation of an image that includes such non-scalar effects. Weighted pre-images may be formed from a coherent sum of pre-computed convolutions of the dominant eigenfunctions of the generalized bilinear kernel with the appropriate mask polygon sectors. The image at a point may be formed from the incoherent sum of the weighted pre-images over all of the dominant eigenfunctions of the generalized bilinear kernel. The resulting image can then be used to perform model-based optical proximity correction (MBOPC).
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: July 18, 2006
    Assignee: International Business Machines Corporation
    Inventors: Alan E. Rosenbluth, Gregg M. Gallatin, Ronald L. Gordon, Nakgeuon Seong, Alexey Y. Lvov, William D. Hinsberg, John A. Hoffnagle, Frances A. Houle, Martha I. Sanchez
  • Patent number: 6801368
    Abstract: An optical beam transformation system includes a first and a second optical element, each of which has a non-reentrant surface. The system transforms a substantially non-uniform optical input beam (such as a Gaussian) to a substantially uniform output beam. The first and second optical elements are arranged in either a Keplerian or Galilean configuration. The aspheric surface of the second optical element is related to the aspheric surface of the first optical element by a ray-tracing function that maps substantially all of an input light beam that is incident on the first optical element to a collimated output light beam that is output from the second optical element. Preferably, the output light beam has a Fermi-Dirac intensity distribution, and the ray-tracing function maps the input light beam to the output beam out to the (1/e)6 intensity radius of the input light beam.
    Type: Grant
    Filed: October 2, 2003
    Date of Patent: October 5, 2004
    Assignee: International Business Machines Corporation
    Inventors: Hans J. Coufal, John A. Hoffnagle, Carl M. Jefferson
  • Publication number: 20040061952
    Abstract: An optical beam transformation system includes a first and a second optical element, each of which has a non-reentrant surface. The system transforms a substantially non-uniform optical input beam (such as a Gaussian) to a substantially uniform output beam. The first and second optical elements are arranged in either a Keplerian or Galilean configuration. The aspheric surface of the second optical element is related to the aspheric surface of the first optical element by a ray-tracing function that maps substantially all of an input light beam that is incident on the first optical element to a collimated output light beam that is output from the second optical element. Preferably, the output light beam has a Fermi-Dirac intensity distribution, and the ray-tracing function maps the input light beam to the output beam out to the (1/e)6 intensity radius of the input light beam.
    Type: Application
    Filed: October 2, 2003
    Publication date: April 1, 2004
    Inventors: Hans J. Coufal, John A. Hoffnagle, Carl M. Jefferson