Abstract: A Kelvin test fixture for electrically contacting miniature, two terminal, leadless, electrical components assures the creation of good contact between the test fixture and the component to be tested by providing for the insertion of the component to be tested directly into the test fixture in a manner which creates a wiping action between the conductors of the test fixture and the terminals of the component to be tested. The test fixture attaches to appropriate parameter test equipment such as an RLC test bridge. The fixture has a small stable capacitance which may be deducted from the measured parameters by appropriate mathematical manipulations to yield the actual electrical parameters of the component under test.