Abstract: A mid-IR spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes without degrading the microscope's performance. The mid-IR spectrometer attachment, which is mounted to and supported by the visible light microscope, introduces infrared radiation into the optical path of the microscope. Radiation from the mid-IR spectrometer source is directed by a trichroic radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected mid-infrared radiation to the radiation director and then to a mid-infrared radiation detection system.

Abstract: An opto-electronic image magnifying system. The magnifiying system includes: a light source (38, 39) which illuminates an object to be viewed; a miniaturized opto-electronic magnifier module (MOM), made of a lens (31) and a photodetector array (32), which receives the light from the illuminated object; an electronic circuit (34) which receives the signal from the MOM; a video-monitor (35) which receives the magnified signal from the electronic circuit and displays the image. The opto-electronic image magnifying system allows for small objects or features of small objects to be observed in which historically compound microscopes or specialized optical viewing systems were required to observe the small objects.

Abstract: A mid-infrared (mid-IR) spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes. The mid-IR spectrometer attachment introduces infrared radiation into the optical path of a visible light microscope. Radiation from the mid-IR spectrometer source is directed by a radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected infrared radiation to an infrared radiation detection system. The mid-IR spectrometer attachment is mechanically and optically compatible with a plurality of commercial infinity-corrected visible light microscopes.

Abstract: A mid-IR spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes without degrading the microscope's performance. The mid-IR spectrometer attachment, which is mounted to and supported by the visible light microscope, introduces infrared radiation into the optical path of the microscope. Radiation from the mid-IR spectrometer source is directed by a trichroic radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected mid-infrared radiation to the radiation director and then to a mid-infrared radiation detection system.

Abstract: A mid-infrared (mid-IR) spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes. The mid-IR spectrometer attachment introduces infrared radiation into the optical path of a visible light microscope. Radiation from the mid-IR spectrometer source is directed by a radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected infrared radiation to an infrared radiation detection system. The mid-IR spectrometer attachment is mechanically and optically compatible with a plurality of commercial infinity-corrected visible light microscopes.

Abstract: A microscope for use in transmissive and reflective infrared spectral analysis of a sample positioned on a sample plane. The microscope uses a collimated beam for infinity correction. A collimated irradiating beam of infrared energy is input to the microscope and focused through a single confocal aperture whereupon the beam is re-collimated and provided to a focusing lens. The focusing lens focuses the beam on a subject sample which generates a resulting image beam. The resulting image beam is re-collimated and provided to an optical element which focuses the resulting image beam back through the single confocal aperture and to an infrared detector. In a preferred embodiment, the size of the single confocal aperture is adjustable and a dichroic element is included for providing simultaneous viewing and infrared measurement of a measured sample. Also in a preferred embodiment, a detector mounting apparatus is included for facilitating orientation of a detector at an infrared output of the microscope.

Abstract: An apparatus and method for spectroscopic or radiometric analysis of solid, liquid, or gas samples includes first and second optically transmitting materials. The first optically transmitting material has selected bulk optical transmission and index of refraction properties which enable infrared radiation transmission therethrough across selected optical transmission ranges. The first optically transmitting material is of a type which normally has chemical or mechanical degradation when in contact with the sample during spectroscopic or radiometric analysis. The second optically transmitting material is preferably a wafer or thin sheet in optical/mechanical contact with the first optically transmitting material. The second material is designed to be located between the first optically transmitting material and the sample all held in a fixture or fixtures to prevent the sample from contacting the first material during spectroscopic or radiometric analysis of the sample.

Abstract: This invention is an apparatus and method for infrared spectroscopic or radiometric analysis of microscopic samples of solids or liquids, combining external- or internal-reflection spectroscopy with visible-radiant energy viewing of microscopic samples by integrated video microscopy. This is an accessory to Fourier-transform-infrared spectrometers for the chemical analysis of microscopic samples in specular, diffuse, reflection-absorption (transflection), or internal-reflection spectroscopy. This apparatus combines an all-reflective, infinity-corrected optical system with an integrated, dedicated, video viewing system. The magnification optic is an all-reflecting optic designed to focus a collimated beam of radiant energy onto the sample, collect the reflected radiant energy, and (through the appropriate optics) present that energy to a detector means for spectral analysis.

Abstract: A radiant energy spectroscopy system includes a diamond as a single bounce internal reflection element (IRE). A standard anvil cut diamond can be used as the IRE. Alternatively, a diamond can be specially cut to have a conical, spherical or curved section in the crown and/or in the pavilion and a curved or flat surface portion for the culet and/or table.

Abstract: An internal reflectance element (IRE), used for internal reflectance spectroscopy (IRS) of solid or liquid samples, has a body including a very small contacting surface adapted to insure contact with a small portion of the sample to improve the spectroscopic analysis of that sample. The contacting surface of the IRE for solids preferably is 100 microns or smaller in diameter and preferably is convexly curved. The contacting surface of the IRE for liquids preferably is 500 microns or smaller. The IRE of the present invention is most frequently used in single internal reflection applications for IRS analysis of solids.

Abstract: An optical system, apparatus and method for analyzing samples includes a radiant energy source, a first mask, a first mirror system, a sample plane, a second mirror system, a second mask and a detector. The first and second masks are respectively positioned along the optical path of the system in the same or different Fourier planes and/or conjugate planes thereof. The first mask has at least one inlet aperture with the relative position thereof in the first mask determining the angle of the energy incidence onto the sample. The second mask has at least one outlet aperture therein passing radiant energy therethrough which has been reflected from or transmitted through the sample at a preselected angle determined by the relative position of the second aperture in the second mask.

Abstract: An optical system, apparatus and method for analyzing samples includes a radiant energy source, a first mask, a first mirror system, a sample plane, a second mirror system, a second mask and a detector. The first and second masks are respectively positioned along the optical path of the system in the same or different Fourier planes and/or conjugate planes thereof. The first mask has at least one inlet aperture with the relative position thereof in the first mask determining the angle of the energy incidence onto the sample. The second mask has at least one outlet aperture therein passing radiant energy therethrough which has been reflected from or transmitted through the sample at a preselected angle determined by the relative position of the second aperture in the second mask.