Patents by Inventor John Abrahamian

John Abrahamian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11781932
    Abstract: In some embodiments, a system uses a two-dimensional polar plot to analyze imbalance of components. On the two-dimensional polar plot imbalance magnitude and orientation are depicted relative to a reference. Some embodiments use the two-dimensional polar plot to assess measurement error for measurement devices and components. Some embodiments use the two-dimensional polar plot to determine patterns associated with processing operations to identify sources of imbalance from the manufacturing process. Some embodiments use the two-dimensional polar plot to determine correlations between processing operations to identify sources of imbalance.
    Type: Grant
    Filed: February 24, 2022
    Date of Patent: October 10, 2023
    Assignee: Shainin II LLC
    Inventor: John Abrahamian
  • Patent number: 11415479
    Abstract: In some embodiments, a system uses a two-dimensional polar plot to analyze imbalance of components. On the two-dimensional polar plot imbalance magnitude and orientation are depicted relative to a reference. Some embodiments use the two-dimensional polar plot to assess measurement error for measurement devices and components. Some embodiments use the two-dimensional polar plot to determine patterns associated with processing operations to identify sources of imbalance from the manufacturing process. Some embodiments use the two-dimensional polar plot to determine correlations between processing operations to identify sources of imbalance.
    Type: Grant
    Filed: June 25, 2020
    Date of Patent: August 16, 2022
    Assignee: Shainin II LLC
    Inventor: John Abrahamian
  • Publication number: 20220178781
    Abstract: In some embodiments, a system uses a two-dimensional polar plot to analyze imbalance of components. On the two-dimensional polar plot imbalance magnitude and orientation are depicted relative to a reference. Some embodiments use the two-dimensional polar plot to assess measurement error for measurement devices and components. Some embodiments use the two-dimensional polar plot to determine patterns associated with processing operations to identify sources of imbalance from the manufacturing process. Some embodiments use the two-dimensional polar plot to determine correlations between processing operations to identify sources of imbalance.
    Type: Application
    Filed: February 24, 2022
    Publication date: June 9, 2022
    Inventor: John Abrahamian
  • Publication number: 20210404902
    Abstract: In some embodiments, a system uses a two-dimensional polar plot to analyze imbalance of components. On the two-dimensional polar plot imbalance magnitude and orientation are depicted relative to a reference. Some embodiments use the two-dimensional polar plot to assess measurement error for measurement devices and components. Some embodiments use the two-dimensional polar plot to determine patterns associated with processing operations to identify sources of imbalance from the manufacturing process. Some embodiments use the two-dimensional polar plot to determine correlations between processing operations to identify sources of imbalance.
    Type: Application
    Filed: June 25, 2020
    Publication date: December 30, 2021
    Inventor: John Abrahamian