Patents by Inventor John Andrew Hunt
John Andrew Hunt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11908655Abstract: A workstation is described for mounting specimens into a cryotransfer holder at cryogenic temperature. The workstation allows rotation about the cryotransfer holder axis to improve access to the sample placement area on the holder and to facilitate easy removal and retrieval of the sample after imaging. The cryotransfer holder includes a cylindrical dewar configured to maintain a constant center of mass about the holder axis regardless of orientation of the dewar.Type: GrantFiled: October 27, 2020Date of Patent: February 20, 2024Assignee: GATAN, INC.Inventors: Alexander Jozef Gubbens, John Andrew Hunt, Masoud Azimi, Radosav Pantelic, Ron Zolkowski, Chris Booth, Andrew Alan Abbott
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Publication number: 20230373028Abstract: A pulsed laser apparatus for milling a sample is described. The apparatus includes a pulsed laser, a scan head for scanning a beam from the pulsed laser across the sample an F-theta lens for focusing the scanned beam onto the sample and a confocal detector for detection of ablation depth. Methods of pulsed laser milling are also described.Type: ApplicationFiled: October 8, 2021Publication date: November 23, 2023Applicant: Gatan, Inc.Inventors: Steven Thomas COYLE, Thijs C. HOSMAN, John Andrew HUNT, Michael Patrick HASSEL-SHEARER
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Publication number: 20230311244Abstract: A pulsed laser apparatus for milling a sample is described. The apparatus includes a pulsed laser, a scan head for scanning a beam from the pulsed laser across the sample and an F-theta lens for focusing the scanned beam onto the sample. The apparatus may also include a liquid bath for milling the sample under the liquid, such as water. Methods of pulsed laser milling are also described.Type: ApplicationFiled: August 27, 2021Publication date: October 5, 2023Applicant: Gatan, Inc.Inventors: Steven Thomas COYLE, Thijs C. HOSMAN, John Andrew HUNT, Michael Patrick HASSEL-SHEARER
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Patent number: 11764032Abstract: Apparatuses for collection of wavelength resolved and angular resolved cathodoluminescence (WRARCL) emitted from a sample exposed to an electron beam (e-beam) or other excitation beams are described. Cathodoluminescence light (CL) may be emitted from a sample at specific angles relative to the excitation beam and analyzed with respect to light-emitting and other optical phenomena. The described embodiments allow collection of WRARCL data more efficiently and with significantly fewer aberrations than existing systems.Type: GrantFiled: March 5, 2021Date of Patent: September 19, 2023Assignee: Gatan, Inc.Inventors: Michael Bertilson, John Andrew Hunt, David J. Stowe
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Patent number: 11688581Abstract: Apparatuses for collection of upstream and downstream transmission electron microscopy (TEM) cathodoluminescence (CL) emitted from a sample exposed to an electron beam are described. A first fiber optic cable carries first CL light emitted from a first TEM sample surface, into a spectrograph. A second fiber optic cable carries second CL light emitted from a second TEM sample surface into the spectrograph. The first and second fiber optic cables are positioned such that the spectrograph produces a first light spectrum for the first fiber optic cable and a separate light spectrum for the second fiber optic cable. The described embodiments allow collection of TEM CL data in a manner that allows analyzing upstream and downstream TEM CL signals separately and simultaneously with an imaging spectrograph.Type: GrantFiled: April 6, 2021Date of Patent: June 27, 2023Assignee: GATAN, INC.Inventors: John Andrew Hunt, Michael Bertilson
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Patent number: 11205559Abstract: Systems and methods for automated alignment of cathodoluminescence (CL) optics in an electron microscope relative to a sample under inspection are described. Accurate placement of the sample and the electron beam landing position on the sample with respect to the focal point of a collection mirror that reflects CL light emitted by the sample is critical to optimizing the amount of light collected and to preserving information about the angle at which light is emitted from the sample. Systems and methods are described for alignment of the CL mirror in the XY plane, which is orthogonal to the axis of the electron beam, and for alignment of the sample with respect to the focal point of the CL mirror along the Z axis, which is coincident with the electron beam.Type: GrantFiled: October 22, 2020Date of Patent: December 21, 2021Assignee: GATAN, INC.Inventors: John Andrew Hunt, Michael Bertilson
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Publication number: 20210313141Abstract: Apparatuses for collection of upstream and downstream transmission electron microscopy (TEM) cathodoluminescence (CL) emitted from a sample exposed to an electron beam are described. A first fiber optic cable carries first CL light emitted from a first TEM sample surface, into a spectrograph. A second fiber optic cable carries second CL light emitted from a second TEM sample surface into the spectrograph. The first and second fiber optic cables are positioned such that the spectrograph produces a first light spectrum for the first fiber optic cable and a separate light spectrum for the second fiber optic cable. The described embodiments allow collection of TEM CL data in a manner that allows analyzing upstream and downstream TEM CL signals separately and simultaneously with an imaging spectrograph.Type: ApplicationFiled: April 6, 2021Publication date: October 7, 2021Inventors: John Andrew Hunt, Michael Bertilson
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Publication number: 20210210305Abstract: Apparatuses for collection of wavelength resolved and angular resolved cathodoluminescence (WRARCL) emitted from a sample exposed to an electron beam (e-beam) or other excitation beams are described. Cathodoluminescence light (CL) may be emitted from a sample at specific angles relative to the excitation beam and analyzed with respect to light-emitting and other optical phenomena. The described embodiments allow collection of WRARCL data more efficiently and with significantly fewer aberrations than existing systems.Type: ApplicationFiled: March 5, 2021Publication date: July 8, 2021Inventors: Michael Bertilson, John Andrew Hunt, David J. Stowe
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Patent number: 11004656Abstract: Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.Type: GrantFiled: October 13, 2015Date of Patent: May 11, 2021Assignee: Gatan, Inc.Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer, Thijs C Hosman
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Publication number: 20210125807Abstract: Systems and methods for automated alignment of cathodoluminescence (CL) optics in an electron microscope relative to a sample under inspection are described. Accurate placement of the sample and the electron beam landing position on the sample with respect to the focal point of a collection mirror that reflects CL light emitted by the sample is critical to optimizing the amount of light collected and to preserving information about the angle at which light is emitted from the sample. Systems and methods are described for alignment of the CL mirror in the XY plane, which is orthogonal to the axis of the electron beam, and for alignment of the sample with respect to the focal point of the CL mirror along the Z axis, which is coincident with the electron beam.Type: ApplicationFiled: October 22, 2020Publication date: April 29, 2021Inventors: John Andrew Hunt, Michael Bertilson
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Publication number: 20210110991Abstract: A workstation is described for mounting specimens into a cryotransfer holder at cryogenic temperature. The workstation allows rotation about the cryotransfer holder axis to improve access to the sample placement area on the holder and to facilitate easy removal and retrieval of the sample after imaging. The cryotransfer holder includes a cylindrical dewar configured to maintain a constant center of mass about the holder axis regardless of orientation of the dewar.Type: ApplicationFiled: October 27, 2020Publication date: April 15, 2021Inventors: Alexander Jozef Gubbens, John Andrew Hunt, Masoud Azimi, Radosav Pantelic, Ron Zolkowski, Chris Booth
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Patent number: 10943764Abstract: Apparatuses for collection of wavelength resolved and angular resolved cathodoluminescence (WRARCL) emitted from a sample exposed to an electron beam (e-beam) or other excitation beams are described. Cathodoluminescence light (CL) may be emitted from a sample at specific angles relative to the excitation beam and analyzed with respect to light-emitting and other optical phenomena. The described embodiments allow collection of WRARCL data more efficiently and with significantly fewer aberrations than existing systems.Type: GrantFiled: May 30, 2019Date of Patent: March 9, 2021Assignee: Gatan, Inc.Inventors: Michael Bertilson, John Andrew Hunt, David J. Stowe
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Patent number: 10832887Abstract: A cryotransfer holder for mounting a specimen held at cryogenic temperature in an electron microscope is described. The holder includes a cylindrical dewar configured to maintain a constant center of mass about the holder axis regardless of orientation of the dewar. The holder further includes a sample shutter control mechanism that can be decoupled from the shutter to reduce vibration during imaging. There is also described a workstation for mounting specimens into the cryotransfer holder at cryogenic temperature. The workstation allows rotation about the cryotransfer holder axis to improve access to the sample placement area on the holder and to facilitate easy removal and retrieval of the sample after imaging.Type: GrantFiled: October 29, 2018Date of Patent: November 10, 2020Assignee: Gatan, Inc.Inventors: Alexander Jozef Gubbens, John Andrew Hunt, Masoud Azimi, Radosav Pantelic, Ron Zolkowski, Chris Booth
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Patent number: 10731246Abstract: Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.Type: GrantFiled: July 24, 2015Date of Patent: August 4, 2020Assignee: Gatan, Inc.Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer, Thijs C Hosman
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Patent number: 10707051Abstract: An apparatus for collection, distribution, and analysis of cathodoluminescence (CL) and other light signals in an electron microscope is provided. The optical hub, utilizing a linear-translating fold-mirror and mounted to the electron microscope, is used to receive essentially collimated light collected from a collection-mirror and efficiently route the collected light to a plurality of light-analysis instruments. The linear-translating fold-mirror can provide fine positional alignment of the light signal, and in an aspect of the invention can be used to select or scan a portion of the collected light-pattern into an optical slit or aperture. In one aspect, the optical hub includes a light filter mechanism that can track the movement of the fold-mirror. In an aspect, the optical hub also controls the positioning of the collection-mirror in proximity to the specimen being analyzed.Type: GrantFiled: May 10, 2019Date of Patent: July 7, 2020Assignee: Gatan, Inc.Inventors: John Andrew Hunt, Michael Bertilson, Tom Worsley
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Publication number: 20190371569Abstract: Apparatuses for collection of wavelength resolved and angular resolved cathodoluminescence (WRARCL) emitted from a sample exposed to an electron beam (e-beam) or other excitation beams are described. Cathodoluminescence light (CL) may be emitted from a sample at specific angles relative to the excitation beam and analyzed with respect to light-emitting and other optical phenomena. The described embodiments allow collection of WRARCL data more efficiently and with significantly fewer aberrations than existing systems.Type: ApplicationFiled: May 30, 2019Publication date: December 5, 2019Inventors: Michael Bertilson, John Andrew Hunt, David J. Stowe
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Publication number: 20190348257Abstract: An apparatus for collection, distribution, and analysis of cathodoluminescence (CL) and other light signals in an electron microscope is provided. The optical hub, utilizing a linear-translating fold-mirror and mounted to the electron microscope, is used to receive essentially collimated light collected from a collection-mirror and efficiently route the collected light to a plurality of light-analysis instruments. The linear-translating fold-mirror can provide fine positional alignment of the light signal, and in an aspect of the invention can be used to select or scan a portion of the collected light-pattern into an optical slit or aperture. In one aspect, the optical hub includes a light filter mechanism that can track the movement of the fold-mirror. In an aspect, the optical hub also controls the positioning of the collection-mirror in proximity to the specimen being analyzed.Type: ApplicationFiled: May 10, 2019Publication date: November 14, 2019Inventors: John Andrew Hunt, Michael Bertilson, Tom Worsley
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Publication number: 20190131106Abstract: A cryotransfer holder for mounting a specimen held at cryogenic temperature in an electron microscope is described. The holder includes a cylindrical dewar configured to maintain a constant center of mass about the holder axis regardless of orientation of the dewar. The holder further includes a sample shutter control mechanism that can be decoupled from the shutter to reduce vibration during imaging. There is also described a workstation for mounting specimens into the cryotransfer holder at cryogenic temperature. The workstation allows rotation about the cryotransfer holder axis to improve access to the sample placement area on the holder and to facilitate easy removal and retrieval of the sample after imaging.Type: ApplicationFiled: October 29, 2018Publication date: May 2, 2019Inventors: Alexander Jozef Gubbens, John Andrew Hunt, Masoud Azimi, Radosav Pantelic, Ron Zolkowski, Chris Booth
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Patent number: 10110854Abstract: Disclosed are embodiments of an ion beam sample preparation apparatus and methods. The methods operate on a sample disposed in a vacuum chamber and include steps of directing an intensity-controllable, tilt-angle controllable ion beam at a sample holder coupled to a rotation stage. The methods further include illuminating and capturing one or more images of the sample, extracting useful features from one or more images and thereafter adjusting the sample preparation steps. Further methods are disclosed for capturing sequences of images, programmatically rotating images, and displaying sequences of images with similar rotation angles. Further methods include extracting useful features from sequences of images that may change with respect to time as ion beam preparation continues.Type: GrantFiled: July 24, 2013Date of Patent: October 23, 2018Assignee: Gatan, Inc.Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer
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Publication number: 20160111249Abstract: Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.Type: ApplicationFiled: October 13, 2015Publication date: April 21, 2016Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer, Thijs C. Hosman