Abstract: A circuit device is provided and includes a first power domain comprising a universal serial bus (USB) subsystem and/or a memory controller subsystem. The first power domain is configured to isolate the USB subsystem and/or the memory controller subsystem from a power-on-reset signal asserted during a low power mode.

Abstract: An example system, e.g., a system on a chip (SoC), includes first and second domains having first and second processors, respectively. The second processor is part of a processing subsystem in the second domain. The first processor provides an instruction to the second processor, which executes the instruction to configure the processing subsystem to operate in a mode specified by the instruction. In response to the processing subsystem being configured to operate in the specified mode, isolation circuitry of the system is configured to provide a level of isolation between the first domain and the second domain based on the specified mode.

Abstract: A system, e.g., a system on a chip (SoC) includes a first domain including a first processor configured to boot the system; a second domain including a processing subsystem having a second processor; and isolation circuitry between the first domain and the second domain During boot-up of the system, the first processor provides code to the second domain. When the code is executed by the second processor, it configures the processing subsystem as either a safety domain or as a general-purpose processing domain. The safety domain may an external safety domain or an internal safety domain.

Abstract: In described examples, an integrated circuit (IC) includes an isolation, an input/output (IO), and a low power mode (LPM) control logic. The isolation includes a level shift with pull-down configured to weakly pull down the voltage of signals that travel through the isolation. The IO includes an input and a physical connector for coupling to a power management IC. The IO provides an asserted-low LPM enable signal to the physical connector in response to the IO input. An output of the LPM control logic is coupled via the isolation to the input of the IO. The LPM control logic provides a high voltage signal to the input of the IO as a default during power on reset (POR) of the IC. The pull-down pulls the LPM enable signal voltage to the asserted low voltage in response to a voltage of the LPM enable signal falling below a threshold.

Abstract: In described examples, an integrated circuit (IC) includes an isolation, an input/output (IO), and a low power mode (LPM) control logic. The isolation includes a level shift with pull-down configured to weakly pull down the voltage of signals that travel through the isolation. The IO includes an input and a physical connector for coupling to a power management IC. The IO provides an asserted-low LPM enable signal to the physical connector in response to the IO input. An output of the LPM control logic is coupled via the isolation to the input of the IO. The LPM control logic provides a high voltage signal to the input of the IO as a default during power on reset (POR) of the IC. The pull-down pulls the LPM enable signal voltage to the asserted low voltage in response to a voltage of the LPM enable signal falling below a threshold.

Abstract: A system, e.g., a system on a chip (SoC) includes a first domain including a first processor configured to boot the system; a second domain including a processing subsystem having a second processor; and isolation circuitry between the first domain and the second domain During boot-up of the system, the first processor provides code to the second domain. When the code is executed by the second processor, it configures the processing subsystem as either a safety domain or as a general-purpose processing domain. The safety domain may an external safety domain or an internal safety domain.

Abstract: A system on a chip (SoC) includes a first domain comprising a first processor configured to boot the SoC, and a first debug subsystem, a second domain comprising a second processor, the second domain configurable as either a safety domain or a general-purpose processing domain, and isolation circuitry between the first domain and the second domain. During boot-up of the SoC, the first processor provides code to the second domain which, when executed by the second processor, configures the second domain as either a safety domain or as a general-purpose processing domain.

Abstract: In described examples, an integrated circuit (IC) includes an isolation, an input/output (IO), and a low power mode (LPM) control logic. The isolation includes a level shift with pull-down configured to weakly pull down the voltage of signals that travel through the isolation. The IO includes an input and a physical connector for coupling to a power management IC. The IO provides an asserted-low LPM enable signal to the physical connector in response to the IO input. An output of the LPM control logic is coupled via the isolation to the input of the IO. The LPM control logic provides a high voltage signal to the input of the IO as a default during power on reset (POR) of the IC. The pull-down pulls the LPM enable signal voltage to the asserted low voltage in response to a voltage of the LPM enable signal falling below a threshold.

Abstract: A circuit device is provided and includes a first power domain comprising a universal serial bus (USB) subsystem and/or a memory controller subsystem. The first power domain is configured to isolate the USB subsystem and/or the memory controller subsystem from a power-on-reset signal asserted during a low power mode.

Abstract: A system on a chip (SoC) includes a first domain comprising a first processor configured to boot the SoC, and a first debug subsystem, a second domain comprising a second processor, the second domain configurable as either a safety domain or a general-purpose processing domain, and isolation circuitry between the first domain and the second domain. During boot-up of the SoC, the first processor provides code to the second domain which, when executed by the second processor, configures the second domain as either a safety domain or as a general-purpose processing domain.

Abstract: A novel approach to cross-talk analysis takes effective account of the nature of cross-talk interference. This approach employs conservative assumptions regarding (1) the equivalent output resistance, and (2) the definition of noise immunity for the victim gate. Also, this approach uses signal and noise current metrics in modeling the parameters of the active device elements. This approach provides an expectation of detection and elimination of noise hazards that might otherwise not be undetected.

Abstract: A novel approach to cross-talk analysis takes effective account of the nature of cross-talk interference. This approach employs conservative assumptions regarding (1) the equivalent output resistance, and (2) the definition of noise immunity for the victim gate. Also, this approach uses signal and noise current metrics in modeling the parameters of the active device elements. This approach provides an expectation of detection and elimination of noise hazards that might otherwise not be undetected.

Abstract: In deep submicron technologies, coupling capacitance significantly dominates the total parasitic capacitance. This causes crosstalk noise to be induced on quiescent signals which could lead to catastrophic failures. A methodology is provided that is a practical approach to full-chip crosstalk noise verification. A multi-dimensional noise lookup table is formed for a cell used within the IC, wherein the multi-dimensional noise table relates a set of input noise pulse characteristics and a set of output loading characteristics to an output noise pulse characteristic of the cell. A noise pulse on an input to an instantiation of a cell is determined and then characterized. An output loading characteristic of the cell is also made. A prediction of whether the instantiation of cell will propagate the noise pulse is made by selecting an output noise pulse characteristic from the multi-dimensional noise table corresponding to the noise pulse characteristic and to the output loading characteristic.

Abstract: In deep submicron technologies, coupling capacitance significantly dominates the total parasitic capacitance. This causes crosstalk noise to be induced on quiescent signals which could lead to catastrophic failures. A methodology is provided that is a practical approach to full-chip crosstalk noise verification. A multi-dimensional noise lookup table is formed for a cell used within the IC, wherein the multi-dimensional noise table relates a set of input noise pulse characteristics and a set of output loading characteristics to an output noise pulse characteristic of the cell. A noise pulse on an input to an instantiation of a cell is determined and then characterized. An output loading characteristic of the cell is also made. A prediction of whether the instantiation of cell will propagate the noise pulse is made by selecting an output noise pulse characteristic from the multi-dimensional noise table corresponding to the noise pulse characteristic and to the output loading characteristic.

Abstract: In deep submicron technologies, coupling capacitance significantly dominates the total parasitic capacitance. This causes crosstalk noise to be induced on quiescent signals which could lead to catastrophic failures. A methodology is provided that is a practical approach to full-chip crosstalk noise verification. A multi-dimensional noise lookup table is formed for a cell used within the IC, wherein the multi-dimensional noise table relates a set of input noise pulse characteristics and a set of output loading characteristics to an output noise pulse characteristic of the cell. A noise pulse on an input to an instantiation of a cell is determined and then characterized. An output loading characteristic of the cell is also made. A prediction of whether the instantiation of cell will propagate the noise pulse is made by selecting an output noise pulse characteristic from the multi-dimensional noise table corresponding to the noise pulse characteristic and to the output loading characteristic.