Patents by Inventor John Artiuch

John Artiuch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230071804
    Abstract: A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.
    Type: Application
    Filed: August 12, 2022
    Publication date: March 9, 2023
    Inventors: Scott Sundvor, Ian Wallhead, Joseph Horrell, John Artiuch, Dane Weitmann, Stephen Wilson, Steven Portela, Jingqing Zhang, Francisco Dias Lourenco
  • Patent number: 11422130
    Abstract: A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.
    Type: Grant
    Filed: May 3, 2019
    Date of Patent: August 23, 2022
    Assignee: Nima Acquisition, LLC
    Inventors: Scott Sundvor, Ian Wallhead, Joseph Horrell, John Artiuch, Dane Weitmann, Stephen Wilson, Steven Portela, Jingqing Zhang, Francisco Dias Lourenco
  • Patent number: 10466236
    Abstract: A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.
    Type: Grant
    Filed: September 29, 2016
    Date of Patent: November 5, 2019
    Assignee: Nima Labs, Inc.
    Inventors: Scott Sundvor, Ian Wallhead, Joseph Horrell, John Artiuch, Dane Weitmann, Stephen Wilson, Steven Portela, Jingqing Zhang, Francisco Dias Lourenco
  • Publication number: 20190257828
    Abstract: A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.
    Type: Application
    Filed: May 3, 2019
    Publication date: August 22, 2019
    Inventors: Scott Sundvor, Ian Wallhead, Joseph Horrell, John Artiuch, Dane Weitmann, Stephen Wilson, Steven Portela, Jingqing Zhang, Francisco Dias Lourenco
  • Patent number: 10249035
    Abstract: A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.
    Type: Grant
    Filed: September 29, 2016
    Date of Patent: April 2, 2019
    Assignee: Nima Labs, Inc.
    Inventors: Scott Sundvor, Ian Wallhead, Joseph Horrell, John Artiuch, Dane Weitmann, Stephen Wilson, Steven Portela, Jingqing Zhang, Francisco Dias Lourenco
  • Publication number: 20170124690
    Abstract: A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.
    Type: Application
    Filed: September 29, 2016
    Publication date: May 4, 2017
    Inventors: Scott Sundvor, Ian Wallhead, Joseph Horrell, John Artiuch, Dane Weitmann, Stephen Wilson, Steven Portela, Jingqing Zhang, Francisco Dias Lourenco
  • Publication number: 20170097342
    Abstract: A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.
    Type: Application
    Filed: September 29, 2016
    Publication date: April 6, 2017
    Inventors: Scott Sundvor, Ian Wallhead, Joseph Horrell, John Artiuch, Dane Weitmann, Stephen Wilson, Steven Portela, Jingqing Zhang, Francisco Dias Lourenco