Abstract: A rack unit for providing a server to be mounted within a storage rack is provided. The rack unit includes a set of low-profile drawer slides configured for mounting the rack unit within the storage rack, the set of low-profile drawer slides configured for mounting upon rails; wherein, the chassis includes at least one wide section for housing computer components. A server and a storage rack are described.

Abstract: A system board includes at least one microprocessor coupled to the system board. A VR module card includes a voltage regulator circuit, wherein the voltage regulator circuit is configured to provide electrical power to the at least one microprocessor. A circuit board region is configured to receive the VR module card.

Abstract: A system board includes at least one microprocessor coupled to the system board. A first circuit board region is populated with a first model voltage regulator circuit. The first model voltage regulator circuit is configured to provide electrical power to the at least one microprocessor. A second circuit board region is unpopulated and configured to receive a second model voltage regulator circuit.

Abstract: A semi-conductor module burn-in test apparatus having a plurality burn-in boards each of which is provided a plurality of module test sockets thereon and each test socket is coupled to an adjacent test socket by with a high current, open/short split power connector that can readily connected to or disconnected from said adjacent test socket by coupling together the power inputs of the adjacent sockets or uncoupling the previously coupled power inputs of adjacent sockets and thereby selectively altering the current carrying levels available to said adjacent test sockets.